Prosecution Insights
Last updated: October 21, 2026
Application No. 18/700,634

MEMORY CELL, ARRAY READ-WRITE METHOD, CONTROL CHIP, MEMORY, AND ELECTRONIC DEVICE

Final Rejection §103
Filed
Apr 11, 2024
Priority
Jul 07, 2022 — CN 202210804363.5 +1 more
Examiner
TRAN, ANTHAN
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Beijing Superstring Academy of Memory Technology
OA Round
2 (Final)
83%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
85%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
650 granted / 783 resolved
+15.0% vs TC avg
Minimal +2% lift
Without
With
+2.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
18 currently pending
Career history
811
Total Applications
across all art units

Statute-Specific Performance

§101
1.4%
-38.6% vs TC avg
§103
52.4%
+12.4% vs TC avg
§102
35.4%
-4.6% vs TC avg
§112
4.5%
-35.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 783 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment Applicant’s response filed on 08/20/2026 in which claim 1 is amended, claims 2, 3, 5-20 are withdrawn have been entered of record. Election/Restrictions Applicant's election with traverse of Species I(A)(1): Fig. 3 in the reply filed on 08/20/2020 is acknowledged. The traversal is on the ground(s) that claims 2-3 should be belong to Species I (A)(a). This is not found persuasive because: The original election was for Group (I)(A)(1), Figure 3, which illustrates separate RBL and separate WBL with a read transistor's gate is connected to write transistor's source. Applicant asserts claims 2 and 3 should be examined, because they allegedly read on elected Figure 3.This is not persuasive, because claim 2 recites the first electrode (connected to the RBL) and the sixth electrode (WBL) share one electrode, which is a mutually exclusive feature compared to Figure 3's separate RBL and a separate WBL. Claim 3 depends on claim 2, requiring this mutually exclusive shared RBL/WBL. This was fully explained in the Non-Final rejection, pages 2 to 4, which mailed on 05/28/2026. The requirement is still deemed proper and is therefore made FINAL. PNG media_image1.png 383 370 media_image1.png Greyscale Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1 and 4 are rejected under 35 U.S.C. 103 as being unpatentable over Shionoiri et al. (US Pub. 9,472,559) in view of Tomishima (US Pub. 2021/0151437) and further in view of Tanioku Masami (JPH 07176184). Regarding claim 1A, Fig. 1A of Shionoiri discloses a storage cell, comprising: a first transistor [101], configured as a read transistor [101 output data Dout, and thus it is a read transistor]; and, a second transistor [102, transistor 102 takes input data, and thus it is a write transistor], configured as a write transistor; wherein, the first transistor [101] comprises a first electrode [T1], a second electrode [T2], a third electrode [T3] and a fourth electrode [T4]; the third electrode is a first gate, and the fourth electrode is a second gate [back gate]; the second transistor [102] comprises a fifth electrode [T5], a sixth electrode [T6] and a seventh electrode [T7]; the seventh electrode is a third gate; the first electrode [T1] is configured to be connected to a read bit-line [Dout], the second electrode [T2] is configured to be connected to a reference signal [ground], the first gate is configured to be connected to a read word-line [RL], and the second gate [T4] is configured to be connected to the fifth electrode [T5]; the sixth electrode [T6] is configured to be connected to a write bit-line [Din], and the third gate [T7] is configured to be connected to a write word-line [WL]; Shionoiri discloses all claimed invention, but does not specifically disclose wherein both the first transistor and the second transistor are N-type transistors, and both the first transistor and the second transistor are indium gallium zinc oxide (IGZO) transistors. However, Fig. 4 of Tomishima shows a 2T memory cells wherein both the first transistor [430] and the second transistor [440] are N-type transistors, and both the first transistor and the second transistor are indium gallium zinc oxide (IGZO) transistors [IGZO transistor (BE), paragraph 0020]. Shionoiri in view of Tomishima discloses all claimed invention, but does not specifically disclose a storage cell having a 2T0c structure. However, Fig. 1 of Tanioku discloses a storage cell having a 2T0c structure [Q1 & Q2]. It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to apply the teachings of Tomishima’s 2T cells having IGZO transistors and Tanioku 2T0c structure hto the teachings of Shionoiri’s 2T memory cell such that Shionoiri’s 2T memory operate in a manner according to Tomishima’s teachings for the purpose of having low leakage current and higher operating rate [paragraph 0020]. Regarding claim 4, Fig. 1A of Shionoiri discloses wherein the first gate [T3] and the second gate [T4] are gates independent of each other, and the first gate is configured to control a read operation [controls by read word line WL] of the read transistor [101]; the second gate is configured to write an electrical signal to a storage node [103] through the write transistor [102] as the storage node of the storage cell. Response to Arguments Applicant’s arguments with respect to claim 1 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ANTHAN T TRAN whose telephone number is (571)272-8709. The examiner can normally be reached MON-FRI, 9AM-5:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alexander G Sofocleous can be reached at 571-272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ANTHAN TRAN/Primary Examiner, Art Unit 2825
Read full office action

Prosecution Timeline

Apr 11, 2024
Application Filed
May 28, 2026
Non-Final Rejection mailed — §103
Aug 20, 2026
Response Filed
Oct 05, 2026
Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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MEMORY DEVICE AND OPERATING METHOD THEREOF
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Patent 12763138
MEMORY DEVICE AND OPERATING METHOD THEREOF
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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
83%
Grant Probability
85%
With Interview (+2.4%)
2y 3m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 783 resolved cases by this examiner. Grant probability derived from career allowance rate.

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