Prosecution Insights
Last updated: July 17, 2026
Application No. 18/712,710

THIN FILM TRANSISTOR HAVING SPINEL SINGLE-PHASE CRYSTALLINE IZTO OXIDE SEMICONDUCTOR

Non-Final OA §102§103
Filed
May 23, 2024
Priority
Dec 06, 2021 — RE 10-2021-0173205 +1 more
Examiner
FERNANDES, ERROL V
Art Unit
Tech Center
Assignee
Iucf-hyu (industry-university Cooperation Foundation Hanyang University)
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
96%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
691 granted / 811 resolved
+25.2% vs TC avg
Moderate +11% lift
Without
With
+11.0%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 2m
Avg Prosecution
15 currently pending
Career history
825
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
84.9%
+44.9% vs TC avg
§102
12.7%
-27.3% vs TC avg
§112
2.3%
-37.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 811 resolved cases

Office Action

§102 §103
DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-5 and 7-10 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Ahn et al. US 2014/0346498 A1. Regarding claim 1, Ahn discloses: A thin film transistor (Figs. 2 and 3) comprising: a gate electrode (GE); an In-Zn-Sn oxide (IZTO) channel layer (200) that overlaps the top or bottom of the gate electrode and has a spinel single-phase crystalline (Fig. 3; paras 0050-0054 and 0062; page 3 “Chemical Formula 1”); a gate insulating layer (101) disposed between the gate electrode and the IZTO channel layer; and source and drain electrodes (SE and DE) respectively connected to both ends of the IZTO channel layer. (claims 2-5) Fig. 3; paras 0050-0054 and 0062; page 3 “Chemical Formula 1”. Regarding claim 7, Ahn discloses: A thin film transistor (Figs. 2 and 3) comprising: a gate electrode (GE); an IZTO (In-Zn-Sn oxide) channel layer (200) that overlaps the gate electrode and has a plurality of crystal grains, where all the crystal grains have a composition of Zn₂-xSn₁-xIn₂ₓO₄ (0<x<0.45) (Fig. 3; paras 0050-0054 and 0062; page 3 “Chemical Formula 1”); a gate insulating layer (101) disposed between the gate electrode and the IZTO channel layer; and source and drain electrodes (SE and DE) respectively connected to both ends of the IZTO channel layer. (claims 8-10) Fig. 3; paras 0050-0054 and 0062; page 3 “Chemical Formula 1”. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 6 and 11 is/are rejected under 35 U.S.C. 103 as being unpatentable over Ahn et al. US 2014/0346498 A1. Regarding claims 6 and 11, although Ahn does not specifically disclose “wherein the IZTO channel layer has crystal planes of (220), (222), (331), and (422)”, it would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention, to determine the claimed crystal phase of the IZTO channel layer taught by Ahn, based on the disclosure, Fig. 3 paras 050-0054 and 0062, to achieve the characteristics of the channel layers discussed namely higher heat stability, higher photo stability and high electron mobility. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ERROL V FERNANDES whose telephone number is (571)270-7433. The examiner can normally be reached on 9-5:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached on 571-270-3042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ERROL V FERNANDES/Primary Examiner, AU 2893
Read full office action

Prosecution Timeline

May 23, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
96%
With Interview (+11.0%)
2y 2m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 811 resolved cases by this examiner. Grant probability derived from career allowance rate.

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