Prosecution Insights
Last updated: August 06, 2026
Application No. 18/724,645

MULTILAYER SUBSTRATE AND JIG

Final Rejection §102§103
Filed
Jun 27, 2024
Priority
Dec 28, 2021 — JP 2021-214466 +2 more
Examiner
TSO, STANLEY
Art Unit
2847
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nidec Advance Technology Corporation
OA Round
2 (Final)
76%
Grant Probability
Favorable
3-4
OA Rounds
2m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allowance Rate
384 granted / 505 resolved
+8.0% vs TC avg
Strong +33% interview lift
Without
With
+32.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
37 currently pending
Career history
533
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
53.2%
+13.2% vs TC avg
§102
25.9%
-14.1% vs TC avg
§112
16.3%
-23.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 505 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-2 and 6 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by “Panasonic” (WO2013/186966. Examiner’s note: the citations refer to the English translation of Panasonic). Regarding claim 1, Panasonic anticipates 1. A multilayer substrate comprising: a plurality of double-sided substrates including a first metal pattern formed on one surface, a second metal pattern formed on another surface, and a metal via connecting the first and second metal patterns (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 comprises a plurality of double-sided substrates including an upper wiring layer 120U formed on one surface, a lower wiring layer 120L formed on another surface, and a paste via 130 connecting the wiring layers 120U and 120L); and a first conductive paste via formed of conductive paste that connects the first metal pattern and the second metal pattern between the double-sided substrates adjacent to each other in a double-sided substrate block in which the plurality of double-sided substrates are stacked (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 comprises another paste via 130 that connects the upper wiring layer 120U and the lower wiring layer 120L between the double-sided substrates adjacent to each other in the block of the middle wiring board portion 180 in which the plurality of substrates are stacked), a first multilayer substrate having a third metal pattern formed on one surface, a fourth metal pattern formed on another surface, a fifth metal pattern formed on an inner layer, and first non-penetrating metal vias connecting the third metal pattern and the fifth metal pattern and connecting the fifth metal pattern and the fourth metal pattern (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the top wiring board portion 180 of Fig. 16 comprises the upper wiring layer 160U which is a third metal pattern, the lower wiring layer 120L which is a fourth metal pattern, the upper wiring layer 120U which is a fifth metal pattern, the vias 170 connects the third and fifth metal patterns, and the via 130 connects the fifth and fourth metal patterns); and a second multilayer substrate having a sixth metal pattern formed on one surface, a seventh metal pattern formed on another surface, an eighth metal pattern formed on an inner layer, and second non-penetrating metal vias connecting the sixth metal pattern and the eighth metal pattern and connecting the eighth metal pattern and the seventh metal pattern (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the bottom wiring board portion 180 of Fig. 16 comprises the lower wiring layer 160L which is a sixth metal pattern, the upper wiring layer 120U which is a seventh metal pattern, the lower wiring layer 120L which is an eight metal pattern, the via 170 connects the sixth and eight metal patterns, and via 130 connects the eighth and seventh metal patterns), the plurality of double-sided substrates is disposed between the first multilayer substrate and the second multilayer substrate (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 is disposed between the top wiring board portion 180 and the bottom wiring board portion 180), wherein a conductive path is formed from the first metal pattern in the double-sided substrate on the one side of a pair of the double-sided substrates adjacent to each other to the second metal pattern via the metal via, the second metal pattern, the first conductive paste via, the first metal pattern in a double-sided substrate on another side, and the metal via (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; a conductive path is formed from the upper wiring layer 120U in the middle wiring board portion 180 of Fig. 16 on the one side of a pair of the double-sided substrates adjacent to each other to the lower wiring layer 120L via the metal via, the second metal pattern, the other paste via 130, the upper wiring layer 120U in a double-sided substrate on another side, and the paste via 130), and the number of layers of the first multilayer substrate and the number of layers of the second multilayer substrate are the same (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the top and bottom wiring board portions 180 of Fig. 16 have the same number of layers). Regarding claim 2, Panasonic anticipates 2. The multilayer substrate according to claim 1, wherein in the double-sided substrate block, three or more of the double-sided substrates are stacked (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; tin the middle wiring board portion 180 of Fig. 16, three or more of the double-sided insulating layers are stacked), and a conductive path is formed from the first metal pattern furthest on the one side in the double-sided substrate block to the second metal pattern furthest on the another side in the double-sided substrate block via each of the double-sided substrates and a plurality of first conductive paste vias connecting the double-sided substrates (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; a conductive path is formed from the upper wiring layer 120U to the lower wiring layer 120L and a plurality of first conductive paste vias 130 connecting the double-sided insulating layers). Regarding claim 6, Panasonic anticipates 6. A multilayer substrate comprising: three or more double-sided substrates including a first metal pattern formed on one surface, a second metal pattern formed on another surface, and a metal via connecting the first and second metal patterns (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 comprises three or more double-sided substrates including an upper wiring layer 120U formed on one surface, a lower wiring layer 120L formed on another surface, and a paste via 130 connecting the wiring layers 120U and 120L); in a double-sided substrate block in which the three or more double-sided substrates are stacked, a first conductive paste via formed of conductive paste that connects the first metal pattern and the second metal pattern between a pair of the double-sided substrates adjacent to each other (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 comprises three or more of stacked substrates, another paste via 130 that connects the upper wiring layer 120U and the lower wiring layer 120L between the double-sided substrates adjacent to each other); a fourth conductive paste via formed of conductive paste that connects the second metal pattern of a double-sided substrate on the another side of the pair of double-sided substrates and a first metal pattern of a double-sided substrate adjacent to the another side of a double-sided substrate including the second metal pattern (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; an additional paste via 130 connects the lower wiring layer 120L on another side of the middle wiring board portion 180 and the upper wiring layer 120U to another side of the middle wiring board portion 180); a first multilayer substrate having a third metal pattern formed on one surface, a fourth metal pattern formed on another surface, a fifth metal pattern formed on an inner layer, and first non-penetrating metal vias connecting the third metal pattern and the fifth metal pattern and connecting the fifth metal pattern and the fourth metal pattern (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the top wiring board portion 180 of Fig. 16 comprises the upper wiring layer 160U which is a third metal pattern, the lower wiring layer 120L which is a fourth metal pattern, the upper wiring layer 120U which is a fifth metal pattern, the via 170 connects the third and fifth metal patterns, and via 130 connects the fifth and fourth metal patterns); and a second multilayer substrate having a sixth metal pattern formed on one surface, a seventh metal pattern formed on another surface, an eighth metal pattern formed on an inner layer, and second non-penetrating metal vias connecting the sixth metal pattern and the eighth metal pattern and connecting the eighth metal pattern and the seventh metal pattern (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the bottom wiring board portion 180 of Fig. 16 comprises the lower wiring layer 160L which is a sixth metal pattern, the upper wiring layer 120U which is a seventh metal pattern, the lower wiring layer 120L which is an eight metal pattern, the via 170 connects the sixth and eight metal patterns, and via 130 connects the eighth and seventh metal patterns), the double-sided substrates are disposed between the first multilayer substrate and the second multilayer substrate (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the middle wiring board portion 180 of Fig. 16 is disposed between the top wiring board portion 180 and the bottom wiring board portion 180), and the number of layers of the first multilayer substrate and the number of layers of the second multilayer substrate are the same (Figs. 3, 6, 16, page 5, top, page 6, middle – page 7, top, page 13, top; the top and bottom wiring board portions 180 of Fig. 16 have the same number of layers). Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claims 5 and 10 are rejected under 35 U.S.C. 103 as being unpatentable Panasonic in view of “Sato” (US 2018/0019198). Regarding claim 5, Panasonic discloses the claimed invention as applied to claim 1, above. Panasonic does not disclose the limitations of claim 5. Sato discloses 5. The multilayer substrate according to claim 1, the multilayer substrate being a pitch conversion module that includes a plurality of the conductive paths insulated from each other (Fig. 1, [0032], [0037]; the interposer 100 being a pitch conversion module that includes a plurality of the conductive paths insulated from each other), wherein an interval between the second metal patterns furthest on the another side in each of the conductive paths is wider than an interval between the first metal patterns furthest on the one side in each of the conductive paths (Fig. 1, [0032], [0037]; the wiring L1 and connection terminals C2 on the top side of the interposer has a smaller interval than the interval between the metal patterns on the opposite or bottom side of the interposer). It would have been obvious to a person having ordinary skill in the art, before the effective filing date of the claimed invention, to have constructed Panasonic’s multilayer substrate with Sato’s pitch conversion module in order to be capable of corresponding to a variety of pitch conversions and being inexpensive as compared to the one in the related art, as suggested by Sato at Abstract. Regarding claim 10, Panasonic discloses the claimed invention as applied to claim 2, above. Panasonic does not disclose the limitations of claim 10. Sato discloses 10. The multilayer substrate according to claim 2, the multilayer substrate being a pitch conversion module that includes a plurality of the conductive paths insulated from each other (Fig. 1, [0032], [0037]; the interposer 100 being a pitch conversion module that includes a plurality of the conductive paths insulated from each other), wherein an interval between the second metal patterns furthest on the another side in each of the conductive paths is wider than an interval between the first metal patterns furthest on the one side in each of the conductive paths (Fig. 1, [0032], [0037]; the wiring L1 and connection terminals C2 on the top side of the interposer has a smaller interval than the interval between the metal patterns on the opposite or bottom side of the interposer). It would have been obvious to a person having ordinary skill in the art, before the effective filing date of the claimed invention, to have constructed Panasonic’s multilayer substrate with Sato’s pitch conversion module in order to be capable of corresponding to a variety of pitch conversions and being inexpensive as compared to the one in the related art, as suggested by Sato at Abstract. Claims 7 and 13 are rejected under 35 U.S.C. 103 as being unpatentable Panasonic in view of “Nagata” (US 10,712,383). Regarding claim 7, Panasonic discloses the claimed invention as applied to claim 1, above. Panasonic discloses the multilayer substrate according to claim 1 (Fig. 19, page 2, bottom, page 6, bottom; the insulating layers 11). Panasonic does not disclose A jig comprising: a contact configured to contact with an inspection object to perform electrical inspection, wherein the contact and the multilayer substrate are electrically connected. Nagata discloses 7. A jig comprising: a contact configured to contact with an inspection object to perform electrical inspection, wherein the contact and the multilayer substrate are electrically connected (Fig. 1, col. 2, line 35, col. 3, line 45; the inspection jig 1 comprises probes 42 and the contactor 40 which is a multilayer substrate that are electrically connected). It would have been obvious to a person having ordinary skill in the art, before the effective filing date of the claimed invention, to have constructed Panasonic’s multilayer substrate with Nagata’s inspection jig in order to provide an inspection jig capable of suppressing breakdown of contact portions of a flexible substrate, as suggested by Nagata at col. 1, lines 32-35. Regarding claim 13, Panasonic discloses the multilayer substrate according to claim 6. Panasonic does not disclose 13. A jig comprising: a contact configured to contact an inspection object to perform electrical inspection, wherein the contact and the multilayer substrate are electrically connected. Nagata discloses 13. A jig comprising: a contact configured to contact an inspection object to perform electrical inspection, wherein the contact and the multilayer substrate are electrically connected (Fig. 1, col. 2, line 35, col. 3, line 45; the inspection jig 1 comprises probes 42 and the contactor 40 which is a multilayer substrate that are electrically connected). It would have been obvious to a person having ordinary skill in the art, before the effective filing date of the claimed invention, to have constructed Panasonic’s multilayer substrate with Nagata’s inspection jig in order to provide an inspection jig capable of suppressing breakdown of contact portions of a flexible substrate, as suggested by Nagata at col. 1, lines 32-35. Conclusion THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to STANLEY TSO whose telephone number is (571)270-0723. The examiner can normally be reached Tu-Thurs 6am-6pm, alt M 6am-2pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Tim Thompson can be reached at 571-272-2342. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /STANLEY TSO/Primary Examiner, Art Unit 2847
Read full office action

Prosecution Timeline

Jun 27, 2024
Application Filed
Mar 24, 2026
Non-Final Rejection mailed — §102, §103
Jun 24, 2026
Response Filed
Jul 09, 2026
Final Rejection mailed — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
76%
Grant Probability
99%
With Interview (+32.9%)
2y 3m (~2m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 505 resolved cases by this examiner. Grant probability derived from career allowance rate.

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