Prosecution Insights
Last updated: May 29, 2026
Application No. 18/740,501

Voltage Transient Detector and Current Transient Detector

Non-Final OA §103
Filed
Jun 11, 2024
Priority
Oct 02, 2020 — provisional 63/087,121 +2 more
Examiner
BAUER, SCOTT ALLEN
Art Unit
2838
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Lam Research Corporation
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
96%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
815 granted / 988 resolved
+14.5% vs TC avg
Moderate +13% lift
Without
With
+13.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
15 currently pending
Career history
1005
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
86.5%
+46.5% vs TC avg
§102
10.3%
-29.7% vs TC avg
§112
1.0%
-39.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 988 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 1 is rejected under 35 U.S.C. 103 as being unpatentable over Ker (US 2010/0315754) in view of Dunnihoo (US 2016/0209456). With regard to claim 1, Ker, in Figs. 5 & 6, teaches a voltage dot, comprising: a plurality of voltage transient detectors (30a-30c) formed on a circuit (3), each of the plurality of voltage transient detectors configured to detect transient voltages above a corresponding transient threshold voltage (V300a-V300c), wherein the corresponding transient threshold voltage is different for different ones of the plurality of voltage transient detectors (as seen in Fig. 6 each transient detector has a threshold voltage set by the size of the MOSFET and the capacitor as taught in paragraphs 0041-0043), each of the plurality of voltage transient detectors configured to provide a persistent indication of having detected a voltage transient that exceeds the corresponding transient threshold voltage (as seen in Fig. 6, the voltage level output by the detector remains persistent after the transient occurs). Ker does not teach that the device comprises a printed circuit board, however, the circuit depicted in Fig. 5 of Ker would necessarily be mounted to some sort of substrate. Dunnihoo, in Figures 4 & 13, teaches a circuit to detect transient events (paragraph 0047). It is further taught that the circuit is formed on a PCB (paragraph 0087). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to combine the teachings of Ker with Dunihoo by forming circuit of Ker on a PCB as taught by Dunnihoo, for the purpose of mounting the circuit on well-known substrate that allows the circuit to be easily manufactured. Allowable Subject Matter Claims 2-13 would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim 2 would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims because the prior art of record does not teach or fairly suggest a voltage dot comprising all the features as recited in the claims and in combination with a transient detection circuit having a first input connected to a node within the transient threshold voltage control circuit, the transient detection circuit having a second input connected to an output of the transient threshold voltage control circuit, the transient detection circuit having an output connected to the input of the transient detection storage circuit. Claims 3-13 would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims because they depend on claim 2 which would also be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claims 14-19 are allowable. Claim 14 is allowable because the prior art of record does not teach or fairly suggest a method for detecting voltage transients comprising all the features as recited in the claims and in combination with transmitting a controlled amount of electrical current through the fuse in conjunction with an occurrence of a voltage transient that exceeds a transient threshold voltage, the voltage transient occurring at a voltage measurement location, the controlled amount of electrical current causing the fuse to blow and the light emitting diode to turn off. Claims 15-19 are allowable as they depend from claim 14, which is also allowable. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Corey (US 5,153,506), Kapp (US 5,412,526), Burleigh (US 5,914,662), Smith (US 6,490,142), Redding (US 6,535,369) Hess (US 9,383,405), Quigley (US 9,671,453) and Chung (US 9,728,956) all teach circuits to detect transient events and share similarities with Applicant’s invention. Any inquiry concerning this communication or earlier communications from the examiner should be directed to SCOTT BAUER whose telephone number is (571)272-5986. The examiner can normally be reached M-F 12pm - 8pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, THIENVU TRAN can be reached at (571)270-1276. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Scott Bauer/Primary Examiner, Art Unit 2838
Read full office action

Prosecution Timeline

Jun 11, 2024
Application Filed
Feb 19, 2026
Non-Final Rejection mailed — §103
May 15, 2026
Response Filed

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
96%
With Interview (+13.0%)
2y 6m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 988 resolved cases by this examiner. Grant probability derived from career allowance rate.

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