Prosecution Insights
Last updated: July 17, 2026
Application No. 18/741,193

CONFIGURABLE RESISTIVITY FOR LINES IN A MEMORY DEVICE

Non-Final OA
Filed
Jun 12, 2024
Priority
Feb 04, 2020 — divisional of 11/495,293 +1 more
Examiner
SMET, UYEN TRAN
Art Unit
2824
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allowance Rate
549 granted / 590 resolved
+25.1% vs TC avg
Minimal +4% lift
Without
With
+3.8%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
22 currently pending
Career history
616
Total Applications
across all art units

Statute-Specific Performance

§101
0.7%
-39.3% vs TC avg
§103
78.8%
+38.8% vs TC avg
§102
12.7%
-27.3% vs TC avg
§112
2.2%
-37.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 590 resolved cases

Prosecution Timeline

Jun 12, 2024
Application Filed
May 19, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12682956
BITLINE VOLTAGE ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE
2y 7m to grant Granted Jul 14, 2026
Patent 12684836
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
2y 0m to grant Granted Jul 14, 2026
Patent 12670963
SINGLE-LEVEL MEMORY CELL ERROR ON-CHIP DETECTION
2y 4m to grant Granted Jun 30, 2026
Patent 12665489
APPARATUS AND METHOD CONTROLLING PEAK TO PEAK RIPPLE OF CHARGE PUMP OUTPUT VOLTAGE
3y 8m to grant Granted Jun 23, 2026
Patent 12651633
DEVICES AND METHODS FOR READING A MEMRISTIVE ELEMENT
2y 8m to grant Granted Jun 09, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
97%
With Interview (+3.8%)
1y 11m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 590 resolved cases by this examiner. Grant probability derived from career allowance rate.

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