Tech Center 2800 • Art Units: 2824
This examiner grants 93% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18327725 | ELECTRICAL WRITE/READ OF HIGH-INFORMATION-DENSITY MAGNETIC THIN FILM | Non-Final OA | Northwestern University |
| 18586134 | METHOD AND SYSTEM FOR ACCESSING MEMORY CELLS | Non-Final OA | Micron Technology, Inc. |
| 18393334 | MEMORY DEVICES INCLUDING TRI-STATE MEMORY CELLS | Final Rejection | Micron Technology, Inc. |
| 18081114 | MULTI-LEVEL CELL AND MULTI-SUB-BLOCK PROGRAMMING IN A MEMORY DEVICE | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 18732967 | MEMORY DEVICE | Non-Final OA | Kioxia Corporation |
| 18460262 | SEMICONDUCTOR MEMORY DEVICE | Final Rejection | Kioxia Corporation |
| 18417552 | MEMORY DEVICE PERFORMING PROGRAM OPERATION AND METHOD OF OPERATING THE SAME | Final Rejection | SK hynix Inc. |
| 18647612 | PERFORMANCE SAVING DURING BLOCK JUMPING | Non-Final OA | Sandisk Technologies Inc. |
| 18471455 | NON-VOLATILE MEMORY WITH SEQUENTIAL READ | Non-Final OA | Sandisk Technologies, Inc. |
| 18399571 | MEMORY STORAGE DEVICE AND READING METHOD THEREOF | Final Rejection | Winbond Electronics Corp. |
| 17737461 | DETECTED THRESHOLD VOLTAGE STATE DISTRIBUTION OF FIRST AND SECOND PASS PROGRAMED MEMORY PAGES | Final Rejection | Intel NDTM US LLC |
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