Prosecution Insights
Last updated: April 19, 2026
Application No. 18/746,974

BIT LINE SENSE AMPLIFIER AND SEMICONDUCTOR MEMORY DEVICE HAVING THE SAME

Non-Final OA §102
Filed
Jun 18, 2024
Examiner
NGUYEN, VAN THU T
Art Unit
2824
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
89%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allow Rate
785 granted / 950 resolved
+14.6% vs TC avg
Moderate +7% lift
Without
With
+6.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
31 currently pending
Career history
981
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
44.8%
+4.8% vs TC avg
§102
33.2%
-6.8% vs TC avg
§112
14.5%
-25.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 950 resolved cases

Office Action

§102
DETAILED ACTION The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant's election with traverse of Group II including claims 15-20 in the reply filed on 12/26/2025 is acknowledged. The traversal is on the ground(s) that independent claim 1 as amended and independent claim 15 are not distinct species. This is found persuasive. Claims 1-14 and 15-20 are rejoined for examination. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1 and 15 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by PGPub. 2018/0182449 to Kim et al. (hereafter Kim). Regarding independent claim 1, Kim teaches a semiconductor memory device, comprising: a plurality of memory blocks each including at least one memory cell (FIG. 9: cell arrays 910, 110_1, 110_2 … 110_n, 920); a plurality of first sense amplifier blocks connected between the plurality of memory blocks, and including a first bit line, a first complementary bit line, and a plurality of transistors (FIG. 9: sense amplifiers 150_2 and 150_3); and a plurality of second sense amplifier blocks electrically connected to outermost memory blocks among the plurality of memory blocks, and including a second bit line, a second complementary bit line, and a plurality of transistors (FIG. 9: sense amplifier 150_1 and 150_n), wherein: each of the plurality of first sense amplifier blocks and the plurality of second sense amplifier blocks is configured to sense a voltage change of a respectively corresponding bit line, and to adjust a voltage of a sensing bit line and a complementary sensing bit line, based on the sensed voltage change (i.e. offset cancellation, see Background and Summary). Regarding independent claim 15, Shin teaches a semiconductor memory device, comprising: a plurality of memory blocks, each memory block among the plurality of memory blocks including at least one memory cell (FIG. 9: cell arrays 910, 110_1, 110_2 … 110_n, 920); and a plurality of sense amplifier blocks including a first sense amplifier block (FIG. 9: sense amplifiers 150_2 and 150_3) and a second sense amplifier block (FIG. 9: sense amplifier 150_1 and 150_n), wherein the first sense amplifier block includes a first bit line and a first complementary bit line, and is connected between at least two memory blocks among the plurality of memory blocks (see FIG. 3 as sense amplifiers 150_2 and 150_3), wherein the second sense amplifier block (sense amplifier 150_1 and 150_n) includes a second bit line (FIG. 3: BL), a second complementary bit line (FIG. 3: BLB), a sensing bit line (FIG. 3: SABL) and a complementary sensing bit line (FIG. 3: SABLB), and is connected to an outermost memory block among the plurality of memory blocks, and wherein the second sense amplifier block is configured to sense a voltage change in the second bit line, and adjust an output voltage at the sensing bit line and the complementary sensing bit line based on the voltage change of the second bit line (i.e. offset cancellation, see Background and Summary). Allowable Subject Matter Claims 2-14, 16-20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. With respect to dependent claim 2: wherein the plurality of transistors included in each of the plurality of second sense amplifier blocks include: a first selection transistor and a second selection transistor connected to the complementary sensing bit line in parallel, a first transistor connected to the first selection transistor, and controlled by a voltage change of the complementary sensing bit lines, and a second transistor connected to the second selection transistor, and controlled by a voltage change of the sensing bit line. With respect to dependent claim 16: wherein the second sense amplifier block further includes: a first selection transistor and a second selection transistor connected to the complementary sensing bit line in parallel, a first transistor connected to the first selection transistor, and controlled by a voltage change of the complementary sensing bit line, and a second transistor connected to the second selection transistor, and controlled by a voltage change of the sensing bit line. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to VANTHU NGUYEN whose telephone number is (571)272-1881. The examiner can normally be reached M-F: 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Richard Elms can be reached at (571) 272-1869. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. January 20, 2026 /VANTHU T NGUYEN/Primary Examiner, Art Unit 2824
Read full office action

Prosecution Timeline

Jun 18, 2024
Application Filed
Jan 20, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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2y 5m to grant Granted Mar 03, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
89%
With Interview (+6.6%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 950 resolved cases by this examiner. Grant probability derived from career allow rate.

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