Tech Center 2800 • Art Units: 2132 2143 2824 2827
This examiner grants 83% of resolved cases
Van Thu T Nguyen is an examiner in Tech Center 2800 and Art Unit 2132. The examiner has 964 resolved cases. The data shows an allowance rate of 82.9 percent, which indicates a high frequency of patent grants for applications in this unit. The median days to allowance for these cases is 803. This timeframe provides a clear expectation for the duration of the prosecution process.
The interview lift is 6.4 percent. This figure suggests that conducting an interview has a positive impact on the probability of success compared to the 82.9 percent allowance rate. Applicants may find that verbal communication is a helpful strategy. The 964 resolved cases provide a stable basis for these observations.
In Art Unit 2132, the 803 median days to allowance reflects the typical speed of the examination cycle. The 6.4 percent interview lift represents a modest improvement in outcomes. Practitioners should consider the benefits of an interview when developing their strategy for Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18914082 | UNIT CELL CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18814421 | SWITCHING OF PERPENDICULARLY MAGNETIZED NANOMAGNETS WITH SPIN-ORBIT TORQUES IN THE ABSENCE OF EXTERNAL MAGNETIC FIELDS | Final Rejection | University of Rochester |
| 18231619 | RESERVOIR COMPUTING BASED ON FERROMAGNETIC FILMS WITH POINT DEFORMATIONS | Non-Final OA | International Business Machines Corporation |
| 18393375 | CONFIGURING A HOST INTERFACE OF A MEMORY DEVICE BASED ON MODE OF OPERATION | Final Rejection | Lodestar Licensing Group LLC |
| 18519680 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 19022659 | ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS | Non-Final OA | Micron Technology, Inc. |
| 19008495 | BIAS VOLTAGE SCHEMES DURING PRE-PROGRAMMING AND PROGRAMMING PHASES | Non-Final OA | Micron Technology, Inc. |
| 18988241 | ENHANCED PROACTIVE READ DISTURB DETECTION IN A MEMORY SUB-SYSTEM | Non-Final OA | Micron Technology, Inc. |
| 18781618 | READ VOLTAGE OVERDRIVE IN READ RECOVERY | Non-Final OA | Micron Technology, Inc. |
| 18777441 | ON-DIE HEATER DEVICES FOR MEMORY DEVICES AND MEMORY MODULES | Non-Final OA | Micron Technology, Inc. |
| 18768747 | PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 18745894 | APPARATUSES AND METHODS FOR HALF-PAGE MODES OF MEMORY DEVICES | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 18407129 | USING A SUBTHRESHOLD VOLTAGE FOR MAPPING IN MEMORY | Non-Final OA | Micron Technology, Inc. |
| 18523151 | REFLOW PROTECTION FOR A MODULE SEMICONDUCTOR DEVICE | Final Rejection | Micron Technology, Inc. |
| 18815356 | PROGRAMMABLE BIT-CELL BASED DISCHARGE CELL FOR READ SELF-TIME TRACKING IN SINGLE AND MULTIPORT SRAM | Non-Final OA | STMicroelectronics International N.V. |
| 18506142 | NON-VOLATILE MEMERY CELL AND METHOD OF FORMING THE SAME | Final Rejection | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18796752 | NEUROMORPHIC DEVICE AND OPERATION METHOD THEREOF | Non-Final OA | SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION |
| 19011869 | HIERARCHICAL BANK GROUP TIMING | Non-Final OA | Rambus Inc. |
| 18988611 | NOISE REDUCTION FOR MIXED IN-MEMORY COMPUTING | Non-Final OA | OmniVision Technologies, Inc. |
| 18998513 | ERROR DETECTION, ERROR CORRECTION OR ERROR DETECTION AND CORRECTION (EDAC) FOR ELECTRONIC DEVICES, ELECTRONIC CIRCUITS OR ELECTRONIC SYSTEMS | Non-Final OA | ZERO-ERROR SYSTEMS PTE. LTD |
| 18476499 | SYSTEM AND METHOD FOR ADDITION AND SUBTRACTION IN MEMRISTOR-BASED IN-MEMORY COMPUTING | Non-Final OA | The University of Hong Kong |
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