Prosecution Insights
Last updated: April 19, 2026
Application No. 18/747,175

SPACE TRANSFORMER SUPPORT STRUCTURE AND AN ELECTRICAL CONNECTION DEVICE

Non-Final OA §102§103
Filed
Jun 18, 2024
Examiner
HARRISON, MICHAEL A
Art Unit
2852
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Kabushiki Kaisha Nihon Micronics
OA Round
1 (Non-Final)
89%
Grant Probability
Favorable
1-2
OA Rounds
1y 11m
To Grant
91%
With Interview

Examiner Intelligence

Grants 89% — above average
89%
Career Allow Rate
505 granted / 568 resolved
+20.9% vs TC avg
Minimal +2% lift
Without
With
+1.8%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
22 currently pending
Career history
590
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
42.8%
+2.8% vs TC avg
§102
36.1%
-3.9% vs TC avg
§112
12.6%
-27.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 568 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-2 and 4-6 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Ito USPG Pub. No.: US 2020/0182907. Regarding Claim 1, Ito teaches a space transformer support structure that supports a space transformer interposed between a printed circuit board and a probe head (see [0025] and figure 1 in which the space transformer 30 and support 70 is interposed between PCB 50 and probe head 20), comprising: a guide plate provided on a side of the probe head of the space transformer and supporting a first surface of the space transformer (figure 1, the guide plate can be interpreted as support structure 70); and connecting members that fix the guide plate to the printed circuit board (see figure 1, in which connecting members 100A, 110, and 120 each serve a purpose in fixing the guide plate to the PCB), wherein a plurality of protrusions in point contact with the first surface of the space transformer is provided on the surface of the guide plate (figure 1, the portions of guide 70 that protrude laterally to make point contact with space transformer 30, i.e. the smaller portions of the L-shapes created by 70 are interpreted as protrusions). Regarding Claim 2, Ito teaches the space transformer support structure according to claim 1, further comprising positioning pins that connect the space transformer and the probe head (see figure 1, in which 100A, 110, and 120 can also be considered positioning pins connecting the space transformer and probe head). Regarding Claim 4, Ito teaches the space transformer support structure according to claim 1, wherein the connecting members are bolts connected to the guide plate through the printed circuit board and arranged on an outer peripheral side of the protrusions (seen in figure 1). Regarding Claim 5, Ito teaches the space transformer support structure according to claim 4, wherein the bolts are provided in the same number as the protrusions (seen in figure 1). Regarding Claim 6, Ito teaches an electrical connection device, comprising: a printed circuit board (see figure 1, PCB 50); a probe head that holds a plurality of probes (see figure 1, probe head 20 with a plurality of probes 10), each of the probes having a base end electrically connected to the printed circuit board and a tip end contacted with an object to be inspected (see [0026]-[0029] and figure 1, teaching that the electrical connections are connected to PCB 50, as well as DUT 2 during testing); a space transformer interposed between the printed circuit board and the probe head and converting a wiring pitch of each of the probes (see [0025] and figure 1 in which the space transformer 30 and support 70 is interposed between PCB 50 and probe head 20); a guide plate provided on a side of the probe head of the space transformer and supporting a first surface of the space transformer (figure 1, the guide plate can be interpreted as support structure 70); and connecting members that fix the guide plate to the printed circuit board, wherein a plurality of protrusions in point contact with the first surface of the space transformer is provided on the surface of the guide plate (figure 1, the portions of guide 70 that protrude laterally to make point contact with space transformer 30, i.e. the smaller portions of the L-shapes created by 70 are interpreted as protrusions). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 3 is/are rejected under 35 U.S.C. 103 as being unpatentable over Ito USPG Pub. No.: US 2020/0182907 in view of Shinde et al. USPG Pub. No.: US 2005/0156611. Regarding Claim 3, Ito teaches the space transformer support structure according to claim 1, but is silent in teaching that wherein each protrusion is hemispherical in shape at a tip end. However, Shinde teaches wherein each protrusion is hemispherical in shape at a tip end (see Shinde fig.2, brass supports 66, described in [0018]. Note that spherical shapes encompass hemispherical shapes and therefore qualify as meeting the limitation). It would have been obvious to one of ordinary skill in the art at the time of filing to have modified the supports of Ito to be hemispherical at the tips, such as seen in Shinde, in order to better maintain isolation from electrical components and to enhance leveling of components (as described in Shinde [0018]). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MICHAEL A HARRISON whose telephone number is (571)272-3573. The examiner can normally be reached Monday-Friday 9:00 AM - 5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, STEPHANIE BLOSS can be reached at (571) 272-3555. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MICHAEL A HARRISON/Examiner, Art Unit 2852
Read full office action

Prosecution Timeline

Jun 18, 2024
Application Filed
Jan 10, 2026
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
89%
Grant Probability
91%
With Interview (+1.8%)
1y 11m
Median Time to Grant
Low
PTA Risk
Based on 568 resolved cases by this examiner. Grant probability derived from career allow rate.

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