Tech Center 3600 • Art Units: 2852 3611
This examiner grants 89% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18906030 | APPARATUS AND METHOD FOR MEASURING ELECTRICAL CONDUCTIVITY OF SEMICONDUCTOR SUBSTRATE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 19013410 | RECONSTRUCTION APPARATUS, METHOD, AND MAGNETIC RESONANCE IMAGING APPARATUS | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18328490 | METHODS, SYSTEMS, ARTICLES OF MANUFACTURE AND APPARATUS TO MANAGE BATTERY OUTGASSING CONDITIONS | Non-Final OA | Intel Corporation |
| 19023524 | Magnetic Resonance Device for Transportation by Means of Standardized Access Paths | Non-Final OA | Siemens Healthineers AG |
| 18544675 | MEASUREMENT SYSTEM | Final Rejection | Cirrus Logic International Semiconductor Ltd. |
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