Prosecution Insights
Last updated: April 19, 2026
Application No. 18/748,818

Photon Counting Image Sensor

Non-Final OA §103
Filed
Jun 20, 2024
Examiner
TRAN, NHAN T
Art Unit
2638
Tech Center
2600 — Communications
Assignee
Semiconductor Components Industries LLC
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
2y 5m
To Grant
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allow Rate
699 granted / 808 resolved
+24.5% vs TC avg
Moderate +13% lift
Without
With
+13.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
17 currently pending
Career history
825
Total Applications
across all art units

Statute-Specific Performance

§101
2.7%
-37.3% vs TC avg
§103
42.3%
+2.3% vs TC avg
§102
34.4%
-5.6% vs TC avg
§112
9.9%
-30.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 808 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement The information disclosure statements (IDS) submitted on 05/21/2025 and 06/20/2024 are in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statements are being considered by the examiner. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 17 and 18 are rejected under 35 U.S.C. 103 as being unpatentable over Calder et al. (US 2020/0182983 A1) in view of Koifman et al. (US 2018/0372873 A1). Regarding claim 17, Calder discloses an image sensor pixel (Fig. 4) comprising: a light-sensing diode (215); an analog counter (455) coupled to a cathode terminal of the light-sensing diode and having an integration capacitor (Fig. 4 and par. [0056]); a comparator (460) having an input coupled to the analog counter (Fig. 4 and par. [0056]). Calder does not disclose an analog memory circuit coupled to an output of the comparator and having a plurality of memory capacitors smaller than the integration capacitor. Koifman, in the same field of endeavor, teaches an alternative method in which the output of a comparator may be either registered by a digital memory circuit or an analog memory circuit (42) comprising a plurality of conventional integrators (see Koifman, Fig. 5 and par. [0086]-[0087]. It is further noted that conventional integrators mentioned by Koifman encompass conventional capacitors, each is inherently smaller than the integration capacitor in order for the device to function effectively as an individual register cell). Therefore, it would have been obvious to one of ordinary skill in the art to modify the image sensor taught by Calder to implement the alternative configuration in view of Koifman to arrive at the instant claimed feature for improved operation efficiency. Regarding claim 18, the combination of Calder and Hoifman clearly discloses that the light-sensing diode comprises a single-photon avalanche diode (SPAD) (see Calder, par. [0043], [0056]). Allowable Subject Matter Claims 1-16 are allowed. Claims 19 and 20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is an examiner’s statement of reasons for allowance: Regarding independent claim 1, the prior art references of record, either alone or in combination, fail to teach: “an analog counter coupled to a cathode terminal of the SPAD; and a comparator having a first input coupled to a floating diffusion node in the analog counter, a second input configured to receive a reference voltage, and a clock input configured to receive a comparator clock signal from the analog counter.” Regarding independent claim 11, the prior art references of record, either alone or in combination, also fail to teach or suggest: “with an analog counter, adjusting an integration voltage at an integration capacitor by a step size and pulsing a comparator clock signal in response to detecting the photon; and with a comparator, receiving the comparator clock signal from the analog counter and comparing the integration voltage with a reference voltage in response to detecting an edge in the comparator clock signal.” Regarding claim 19, the prior art references of record also fail to teach or suggest: “the analog counter comprises: a voltage-controlled pulse generator; a logic gate coupled between the cathode terminal of the light-sensing diode and an input of the voltage-controlled pulse generator; a charge pump coupled between an output of the voltage-controlled pulse generator and the integration capacitor; and a precharge transistor configured to precharge the integration capacitor.” Regarding claim 20, the prior art references of record also fail to teach or suggest: “the analog memory circuit further comprises: a read enable switch coupled between the output of the comparator and a storage node of the analog memory circuit; a first switch coupled between the storage node and a first memory capacitor in the plurality of memory capacitors; a second switch coupled between the storage node and a second memory capacitor in the plurality of memory capacitors; a third switch coupled between the storage node and a third memory capacitor in the plurality of memory capacitors; and a logic gate having a first input coupled to a first node disposed between the first switch and the first memory capacitor, a second input coupled to a second node disposed between the second switch and the second memory capacitor, a third input coupled to a third node disposed between the third switch and the third memory capacitor, and an output coupled to a quench transistor coupled to the cathode terminal of the light-sensing diode.” Any comments considered necessary by applicant must be submitted no later than the payment of the issue fee and, to avoid processing delays, should preferably accompany the issue fee. Such submissions should be clearly labeled “Comments on Statement of Reasons for Allowance.” Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to NHAN T TRAN whose telephone number is (571)272-7371. The examiner can normally be reached Monday - Friday, 9:00am - 5:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lin Ye can be reached at 571-272-7372. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /NHAN T TRAN/Primary Examiner, Art Unit 2638
Read full office action

Prosecution Timeline

Jun 20, 2024
Application Filed
Feb 17, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+13.2%)
2y 5m
Median Time to Grant
Low
PTA Risk
Based on 808 resolved cases by this examiner. Grant probability derived from career allow rate.

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