Prosecution Insights
Last updated: April 19, 2026
Application No. 18/750,165

LEAD FRAME FOR SENSOR

Non-Final OA §102§103
Filed
Jun 21, 2024
Examiner
ASTACIO-OQUENDO, GIOVANNI
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Melexis Technologies SA
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
99%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
632 granted / 714 resolved
+20.5% vs TC avg
Moderate +10% lift
Without
With
+10.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
17 currently pending
Career history
731
Total Applications
across all art units

Statute-Specific Performance

§101
13.9%
-26.1% vs TC avg
§103
33.0%
-7.0% vs TC avg
§102
14.5%
-25.5% vs TC avg
§112
33.0%
-7.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 714 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Claims 1 – 15 are pending. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1, 4, 9, 10, 14, and 15 is/are rejected under 35 U.S.C. 102(a)(1)/102(a)(2) as being anticipated by Li et al. WO 2020/227363 A1; hereinafter Li). Li is cited by the Applicant. Regarding Claim 1, Li discloses a lead frame for a current sensor (Fig. 4A, item 400 and para [0042]; 400 comprising a leadframe), the lead frame comprising PNG media_image1.png 458 666 media_image1.png Greyscale a conductive piece with an average thickness and a sensing zone for generating a signal detectable by a current sensing element when current flows through the lead frame (Fig. 4A and para [0042]; Hall-effect sensor device 400 comprising a leadframe with a IC die 180 assembled top side up and para [0025]; in operation a DC power supply applied between lead 160 and lead 163 generates a constant current flow that flows in the semiconductor Hall element), and a routing zone outside the sensing zone for routing current towards the sensing zone (Fig. 4A and para [0042]; a Hall-effect sensor having bond pads 181 generally with pillars 182 thereon (bond pads/pillars not shown) that is attached top side up to a bottom side of the leads 160-163 of a leadframe, for example, by a solder connection where the clip 130 is riveted by rivets 431 to the leadframe), wherein the routing zone (Fig. 4A, item 130) comprises a region with a largest area having a predetermined average thickness, wherein at least the sensing zone includes additional material disposed on the conductive piece so a total thickness of the lead frame at the sensing zone is thicker than the average thickness of said largest area (Fig. 4A and para [0042]; clip 130 and double (2X) leadframe thickness on the FGC side of the device). Regarding Claim 4, Li discloses the lead frame of claim 1 wherein the thickness of the sensing area is between 5% and 120% thicker than the average thickness of the conductive piece, for example between 10% and 80% thicker than the average thickness (Fig. 4A and para [0042]; clip 130 and double (2X) leadframe thickness on the FGC side of the device). Regarding Claim 9, Li discloses a current sensor comprising the lead frame (Fig. 4A, item 400 and para [0042]; 400 comprising a leadframe) of claim 1. Regarding Claim 10, Li discloses a method of manufacturing a lead frame (Fig. 4A, item 400 and para [0042]; 400 comprising a leadframe) in accordance with claim 1, comprising providing a shaped conductive piece with an average thickness, and locally adding material on a zone being a sensing zone (Fig. 4A and para [0042]; Hall-effect sensor device 400 comprising a leadframe with a IC die 180 assembled top side up and para [0025]; in operation a DC power supply applied between lead 160 and lead 163 generates a constant current flow that flows in the semiconductor Hall element), so a total thickness of the sensing zone is thicker than the average thickness of the rest of the conductive piece, wherein the area of the conductive piece with the average thickness is larger than the sensing zone (Fig. 4A and para [0042]; clip 130 and double (2X) leadframe thickness on the FGC side of the device). Regarding Claim 14, Li discloses a method of providing a sensor comprising providing the lead frame in accordance with claim 10 further comprising attaching a die to the lead frame (para [0003]; an integrated circuit (IC) die having a semiconductor Hall-effect sensor element and para [0045]; semiconductor die or multiple semiconductors die) and providing molding (para [0031]; mold compound). Regarding Claim 15, Li discloses the method of claim 14 further comprising providing an insulation layer between the lead frame and the die (para [0045]; the semiconductor die can be formed from a variety of processes including bipolar, insulated-gate bipolar transistor). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 2, 3, 5 – 8, and 11 is/are rejected under 35 U.S.C. 103 as being unpatentable over Li in view of Sharma et al. (US 2005/0248336 A1; hereinafter Sharma). Sharma is cited by the Applicant. Regarding Claim 2, Li discloses the lead frame of claim 1. But Li does not specifically disclose wherein the lead frame comprises a necking on the sensing zone. However, Sharma suggests wherein the lead frame comprises a necking on the sensing zone (para [0086]; lead frame comprises an extended current conductor portion). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify LI in view of Sharma in order to provide alignment to the magnetic field sensor (Sharma, para [0086)]. Regarding Claim 3, Li discloses the lead frame of claim 1. But Li does not specifically disclose wherein the average thickness of the largest area of the routing zone is 250 micrometers. However, Sharma suggests wherein the average thickness of the largest area of the routing zone is 250 micrometers (para [0040]; the Hall effect element 18 lies in a region between 200 microns and 400 microns). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify LI in view of Sharma because the position of the Hall effect element in the x-axis and the y-axis can vary with manufacturing position tolerances without substantial effect upon the sensitivity of the current sensor (Sharma, para [0040]). Regarding Claim 5, Li discloses the lead frame of claim 1. But Li does not specifically disclose wherein the additional material is disposed on and beyond the sensing zone into the routing zone for an area smaller than the largest area of the routing zone. However, Sharma suggests wherein the additional material is disposed on and beyond the sensing zone into the routing zone for an area smaller than the largest area of the routing zone (para [0084]; current sensor also includes a substrate having a first surface and a second, opposing, surface). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify Li in view of Sharma in order to provide greater sensitivity (Sharma, para [[0087]). Regarding Claim 6, Li discloses the lead frame of claim 1. But Li does not specifically disclose wherein the piece is a sheet that comprises two opposite planar faces, wherein the additional material is provided on one or both faces of the sheet. However, Sharma suggests wherein the piece is a sheet that comprises two opposite planar faces, wherein the additional material is provided on one or both faces of the sheet (para [0084]; current sensor also includes a substrate having a first surface and a second, opposing, surface). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify Li in view of Sharma in order to provide greater sensitivity (Sharma, para [[0087]). Regarding Claim 7, Li and Sharma disclose the lead frame of claim 6, Sharma also suggests wherein the additional material disposed on a face of the sheet covers a first area and the additional material disposed on the opposite face covers a second area, wherein the first area is larger than the second area (para [0086]; the Hall effect element is disposed to a side (i.e., slightly offset along a y-axis) of the current conductor portion, where the magnetic field is pointed along the z-axis; however, a Hall effect element, or another type of magnetic field sensor, for example, a magnetoresistance element, having a maximum response axis aligned in another direction, can be disposed at another position relative to the current conductor portion, for example, on top (in a direction of the z-axis) of the current conductor portion). Regarding Claim 8, Li discloses the lead frame of claim 1. But Li does not specifically disclose wherein the conductive piece is a conductive planar piece with constant and uniform thickness outside the sensing zone. However, Sharma suggests wherein the conductive piece is a conductive planar piece with constant and uniform thickness outside the sensing zone (para[0029]; an exemplary current sensor in accordance with the present invention includes a lead frame having a plurality of leads; the leads are coupled to the other leads to form a current path, or current conductor with a narrow portion having a width w1). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify Li in view of Sharma in order to provide improved sensitivity (Sharma, para [0010]). Regarding Claim 11, Li discloses the method of claim 10. But Li does not specifically disclose wherein locally adding material is provided by additive manufacturing techniques. However, Sharma suggests wherein locally adding material is provided by additive manufacturing techniques (para [0014]; providing a substrate having first and second opposing surfaces, forming one or more magnetic field transducers about the first surface of the substrate, depositing a second current conductor portion on the first surface of the substrate proximate to the one or more magnetic field transducers, and mounting the substrate to the lead frame portion so that the first current conductor portion is coupled to the second current conductor portion). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify Li in view of Sharma in order to provide greater sensitivity (Sharma, para [[0087]). Claim(s) 12 and 14 is/are rejected under 35 U.S.C. 103 as being unpatentable over Li in view of Sharma, and further in view of Taylor et al. (US 2008/0297138 A1; hereinafter Taylor). Regarding Claim 12, Li discloses the method of claim 10. But Li does not specifically disclose wherein locally adding material is provided by depositing conductive material on the lead frame, for example by vacuum deposition and/or electroplating. However, Taylor suggests wherein locally adding material is provided by depositing conductive material on the lead frame, for example by vacuum deposition and/or electroplating (para [0119]; screen printing process can result in a lead frame deposited insulting layer comprised of a variety of materials, including but not limited to, polymers or ceramics. In still other embodiments, the lead frame deposited insulating layer is formed with a vacuum deposition process). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify Li in view of Taylor because the invention provides a miniaturized current sensor (Taylor, para [0003]). Regarding Claim 13, Li and Taylor discloses the method of claim 12. But Li and Taylor do not specifically teach further comprising providing a mask. However, Urankar suggests further comprising providing a mask (para [0067]; older mask, deposited on the sides of the first and second printed circuit assemblies). It would have been obvious to one of ordinary skill in the art before the effective filing date of the invention to modify the combination of Li and Taylor in view of Urankar in order to prevent any contact (Urankar, para [0067]). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: Bhatia et al. (US 2025/0185184 A1) teaches a sensor assembly for an elongate conductor, comprising: a circuit board with a sensor chip; a field component partially surrounding the elongate conductor transverse to a longitudinal axis of the elongate conductor; and a housing having a first housing portion connected to a second housing portion by one or more fasteners, the housing retaining the elongate conductor, the circuit board, and the field component between the first housing portion and the second housing portion (see claim 1). Ebenhart et al. (US 2024/0332936 A1) discloses bus bar assembly comprising: a first housing; a first bus bar extending through the first housing; a second bus bar extending through the first housing, the second bus bar including a second housing that defines at least one first receiver configured to engage a fastener; and a sensor assembly mounted to the receiver, the sensor assembly including a current sensor positioned between the first bus bar and the second bus bar (see claim 1). Tang et al. (US 2023/0040987 A1) suggests a current sensor for measuring a current intensity in an electrical conductor, the current sensor comprising: a magnetic field sensor; and a T-shaped ferromagnetic structure including a first component and a second component spaced from the first component, the first and second components defining an air a there between (see claim 1). Any inquiry concerning this communication or earlier communications from the examiner should be directed to GIOVANNI ASTACIO-OQUENDO whose telephone number is (571)270-5724. The examiner can normally be reached Monday - Friday, 8:00am - 5:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Huy Phan can be reached at 571-272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /GIOVANNI ASTACIO-OQUENDO/ Primary Examiner, Art Unit 2858 2/21/2026
Read full office action

Prosecution Timeline

Jun 21, 2024
Application Filed
Feb 21, 2026
Non-Final Rejection — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12601781
BUILT-IN SELT-TEST CIRCUIT AND METHOD FOR DEADTIME TRIMMING
2y 5m to grant Granted Apr 14, 2026
Patent 12596158
DIAGNOSTIC DEVICE FOR POWER SUPPLY DEVICE FOR ELECTRIC DISCHARGE MACHINE
2y 5m to grant Granted Apr 07, 2026
Patent 12591005
TESTING ELEMENTS FOR BONDED STRUCTURES
2y 5m to grant Granted Mar 31, 2026
Patent 12584725
Continuous Rotation Angle Detection Sensor 360 DEG SMD
2y 5m to grant Granted Mar 24, 2026
Patent 12578371
Remote Calculation of Earth Connection Impedance
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
99%
With Interview (+10.2%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 714 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month