Tech Center 2800 • Art Units: 2858 2867
This examiner grants 88% of resolved cases
Giovanni Astacio-Oquendo is an examiner in Tech Center 2800 and Art Unit 2858. With 738 resolved cases, he has a substantial track record for practitioners to evaluate. The allowance rate of 88.5 percent indicates that a high majority of applications result in a grant. This 88.5 percent rate suggests a relatively favorable environment for applicants seeking patent protection in this art unit. The median time to reach an allowance is 887 days, which provides a clear expectation for the duration of the prosecution process.
The data also shows an interview lift of 10.4 percent. This metric indicates that conducting an interview with the examiner correlates with an increased probability of allowance compared to the baseline. For the 738 resolved cases, the 887-day median reflects the typical timeline for successful outcomes. Practitioners should consider the positive impact of interviews when developing their strategy for Art Unit 2858. The combination of these factors suggests that while the process takes 887 days, the likelihood of a grant is strong.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18972488 | MEASURING THE PHASE OF A COMPLEX IMPEDANCE THROUGH THRESHOLDING | Non-Final OA | COMMISSARIAT A L’ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 18970676 | METHOD FOR MEASURING THE PHASE OF A COMPLEX IMPEDANCE | Non-Final OA | COMMISSARIAT A L’ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 18926434 | IMAGING PHANTOM ASSEMBLY AND IMAGE GENERATION METHOD | Non-Final OA | Shanghai United Imaging Healthcare Co., Ltd. |
| 18834691 | Battery Diagnosing Apparatus, Battery Diagnosing Method, Battery Pack and Electric Vehicle | Non-Final OA | LG Energy Solution, Ltd. |
| 18986111 | Battery Management System, Battery Pack, Electric Vehicle and Battery Management Method | Non-Final OA | LG Energy Solution, Ltd. |
| 19042696 | APPARATUS AND A METHOD | Non-Final OA | Nokia Technologies Oy |
| 18977933 | APPARATUS AND METHOD FOR INSPECTING BATTERY DEFECT BASED-ON CHARGING PROFILE | Non-Final OA | SK On Co., Ltd. |
| 18942774 | MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 18436423 | WIRELESS MEASUREMENT CHARACTERIZATION | Non-Final OA | Applied Materials, Inc. |
| 18962032 | DISTANCE MEASUREMENT METHOD, DISTANCE MEASUREMENT SYSTEM, AND SUBSTRATE PROCESSING APPARATUS | Non-Final OA | Tokyo Electron Limited |
| 18938948 | SYSTEMS, METHODS, AND STRUCTURES FOR IMPROVING MAGNETIC FIELD SENSOR PERFORMANCE | Non-Final OA | Allegro MicroSystems, LLC |
| 18817199 | INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR | Non-Final OA | PROTEANTECS LTD. |
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