Tech Center 2800 • Art Units: 2858 2867
This examiner grants 88% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18958291 | SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18812032 | VOLTAGE MEASUREMENT ASSEMBLY AND SUBSTRATE CHARGING MEASUREMENT METHOD USING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18907015 | HIGH IMPEDANCE FAULT LOCATION IN ELECTRIC POWER DISTRIBUTION SYSTEMS | Non-Final OA | Eaton Intelligent Power Limited |
| 18926434 | IMAGING PHANTOM ASSEMBLY AND IMAGE GENERATION METHOD | Non-Final OA | Shanghai United Imaging Healthcare Co., Ltd. |
| 18986111 | Battery Management System, Battery Pack, Electric Vehicle and Battery Management Method | Non-Final OA | LG Energy Solution, Ltd. |
| 18942774 | MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 18894342 | TEST SYSTEM WITH IMPROVED CONTACT BLADE DESIGN AND METHODS OF USING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18962032 | DISTANCE MEASUREMENT METHOD, DISTANCE MEASUREMENT SYSTEM, AND SUBSTRATE PROCESSING APPARATUS | Non-Final OA | Tokyo Electron Limited |
| 18938948 | SYSTEMS, METHODS, AND STRUCTURES FOR IMPROVING MAGNETIC FIELD SENSOR PERFORMANCE | Non-Final OA | Allegro MicroSystems, LLC |
| 18822765 | SYSTEMS, METHODS, AND STRUCTURES FOR REDUCING CONDUCTOR CROSS-TALK ERROR | Non-Final OA | Allegro MicroSystems, LLC |
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