Prosecution Insights
Last updated: July 17, 2026
Application No. 18/755,008

STACKED INTEGRATED CIRCUIT DEVICE

Non-Final OA §102
Filed
Jun 26, 2024
Priority
Sep 25, 2023 — RE 10-2023-0128486
Examiner
MUSE, ISMAIL A
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
553 granted / 638 resolved
+26.7% vs TC avg
Moderate +8% lift
Without
With
+8.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
26 currently pending
Career history
663
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
82.9%
+42.9% vs TC avg
§102
13.3%
-26.7% vs TC avg
§112
3.3%
-36.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 638 resolved cases

Office Action

§102
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-4, 9, 11 and 16 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Chen et al. [US PPGUB 20220328477] (hereinafter Chen). Regarding claim 1, Chen teaches an integrated circuit device comprising: a base substrate layer (101, Para 75); a sheet separation wall (119, Fig. 25) extending on the base substrate layer in a first horizontal direction (Fig. 25); a pair of nanosheet stacked structures (106a/b, Para 35, Fig. 25) including the sheet separation wall therebetween and apart from each other in a second horizontal direction (Fig. 25), the second horizontal direction different from the first horizontal direction (Fig. 25, 3D structure, i.e., x direction and y direction), the pair of nanosheet stacked structures each including a plurality of nanosheets (Fig. 25); a plurality of cladding patterns (126, Fig. 25) between a first end of each of the plurality of nanosheets included in each of the pair of nanosheet stacked structures and the sheet separation wall (Fig. 25); and a pair of gate electrodes (182, Para 50) extending on the pair of nanosheet stacked structures in the second horizontal direction (Fig. 25, 3D structure). Regarding claim 2, Chen teaches an integrated circuit device wherein the plurality of cladding patterns are apart from each other in a vertical direction, on each of both sidewalls of the sheet separation wall (Fig. 25). Regarding claim 3, Chen teaches an integrated circuit device further comprising a pair of gate insulating layers (180, Para 73) between the plurality of nanosheets included in the pair of nanosheet stacked structures and the pair of gate electrodes (Fig. 25), wherein, among the plurality of cladding patterns, portions of the pair of gate electrodes and portions of the pair of gate insulating layers are between two cladding patterns apart from each other in the vertical direction (Fig. 25). Regarding claim 4, Chen teaches an integrated circuit device further comprising a base insulating layer (178, Para 75, Fig. 25) between the pair of nanosheet stacked structures and the base substrate layer, wherein the sheet separation wall extends into the base insulating layer (Fig. 25). Regarding claim 9, Chen teaches an integrated circuit device wherein a first end of the pair of gate electrodes facing the sheet separation wall is closer to the sheet separation wall than the first end of each of the plurality of nanosheets comprised in the pair of nanosheet stacked structures (Fig. 25). Regarding claim 11, Chen teaches an integrated circuit device comprising: a base insulating layer (178, Para 75) on a base substrate layer (101, Para 75, Fig. 25); a sheet separation wall (130 exclude portion 126 at ends of layer 106, Fig. 25) extending on the base insulating layer in a first horizontal direction (Fig. 25, where layer 126 in fin region 112 extends on bottom surface of the base insulating layer); a pair of nanosheet stacked structures (106a/b, Para 35, Fig. 25) including the sheet separation wall therebetween and apart from each other in a second horizontal direction (Fig. 25), the second horizontal direction different from the first horizontal direction (Fig. 25, 3D structure, i.e., x direction and y direction), the pair of nanosheet stacked structures each including a plurality of nanosheets (Fig. 25); a plurality of cladding patterns (126, Fig. 25) between a first end of each of the plurality of nanosheets included in each of the pair of nanosheet stacked structures and the sheet separation wall (Fig. 25); a pair of gate electrodes (182, Para 50) extending on the pair of nanosheet stacked structures in the second horizontal direction (Fig. 25, 3D structure); a pair of gate insulating layers (180, Para 77, Fig. 25) between the plurality of nanosheets included in each of the pair of nanosheet stacked structures and the pair of gate electrodes (Fig. 25), the pair of gate insulating layers each having a thickness less than a thickness of each of the plurality of cladding patterns (Fig. 25); and a pair of source/drain regions (160, Para 84) connected to a second end opposite to the first end of each of the plurality of nanosheets included in each of the pair of nanosheet stacked structures (Fig. 25). Regarding claim 16, Chen teaches an integrated circuit device wherein, among the pair of nanosheet stacked structures, the plurality of nanosheets comprised in one nanosheet stacked structure and the plurality of nanosheets comprised in another nanosheet stacked structure have an identical horizontal width in the second horizontal direction (Fig. 25). Allowable Subject Matter Claims 18-20 are allowed. Claims 5-8, 10, 12-15, and 17 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Claims 18-20 are allowed because all prior arts of record and related prior arts not of record either singularly or in combination fail to anticipate or render obvious an integrated circuit device comprising: the sheet separation wall having a horizontal cross-section having a pair of concave portions between the pair of nanosheet stacked structures, the plurality of cladding patterns being in the pair of concave portions, and the plurality of gate electrodes extending into the pair of concave portions (as claimed in claim 18), in combination with the rest of claim limitations as claimed and defined by the Applicant. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ISMAIL A MUSE whose telephone number is (571)272-1470. The examiner can normally be reached Monday - Friday 8:00 AM-5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at (571)270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ISMAIL A MUSE/ Primary Examiner, Art Unit 2812
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Prosecution Timeline

Jun 26, 2024
Application Filed
Jun 29, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
95%
With Interview (+8.0%)
2y 4m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 638 resolved cases by this examiner. Grant probability derived from career allowance rate.

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