Prosecution Insights
Last updated: May 29, 2026
Application No. 18/768,173

ESD PROTECTION CIRCUIT AND METHOD THEREFOR

Non-Final OA §102
Filed
Jul 10, 2024
Examiner
PATEL, DHARTI HARIDAS
Art Unit
2838
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nxp Usa Inc.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
4m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
1093 granted / 1253 resolved
+19.2% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
13 currently pending
Career history
1264
Total Applications
across all art units

Statute-Specific Performance

§101
0.9%
-39.1% vs TC avg
§103
62.4%
+22.4% vs TC avg
§102
26.1%
-13.9% vs TC avg
§112
0.7%
-39.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1253 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1 and 10 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Chen et al. Patent No. US 11,804,708. Regarding claims 1, 10, Chen discloses an electrostatic discharge (ESD) protection circuit comprising: a clamp circuit coupled between a first voltage supply node [Fig. 4, ground 306] and a second voltage supply node [Fig. 4, I/O pad], the clamp circuit including: a first transistor [Fig. 4, transistor 416] having a first current electrode, a second current electrode coupled at the second voltage supply node [Fig. 4, source of 416 coupled to ground], and a control electrode [Fig. 4, gate electrode] coupled to the second voltage supply node by way of a first resistor; a second transistor [Fig. 4, transistor 412] coupled in series with the first transistor, the second transistor having a first current electrode coupled at the first voltage supply node, a second current electrode, and a control electrode; a first bias generator circuit [Fig. 4, gate bias circuit 310 comprising voltage level shifter 408] coupled at the control electrode of the second transistor, the first bias generator circuit configured to cause a gate-to-source voltage of the second transistor to be substantially equal to a gate-to-source voltage of the first transistor during a normal operating mode [col. 6 lines 66 to col. 7 lines 15]; and a trigger circuit [Fig. 4, inverter 410] coupled with the clamp circuit, the trigger circuit having a first output coupled at the control electrode of the first transistor and a second output coupled at the control electrode of the second transistor [col. 7 lines 15 – 32]. Allowable Subject Matter Claims 2-9, 11-15 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is an examiner’s statement of reasons for allowance of claim 2: The prior art does not disclose that the first bias generator circuit comprises a second resistor having a first terminal coupled at the control electrode of the second transistor and a second terminal coupled at the second current electrode of the second transistor. This feature in combination with the rest of the claim limitations is not anticipated or rendered obvious by the prior art of record. The following is an examiner’s statement of reasons for allowance of claims 3, 11: The prior art does not disclose that the clamp circuit further includes a third transistor coupled in series between the first transistor and the second transistor, the third transistor having a first current electrode coupled at the second current electrode of the second transistor, a second current electrode coupled at the first current electrode of the first transistor, and a control electrode. This feature in combination with the rest of the claim limitations is not anticipated or rendered obvious by the prior art of record. The following is an examiner’s statement of reasons for allowance of claims 5, 13: The prior art does not disclose a second inverter stage including: a third trigger transistor having a first current electrode coupled at the second output of the trigger circuit, a second current electrode coupled at the third voltage supply node, a control electrode coupled at the first trigger node. This feature in combination with the rest of the claim limitations is not anticipated or rendered obvious by the prior art of record. The following is an examiner’s statement of reasons for allowance of claims 7, 15: The prior art does not further comprise a voltage divider circuit coupled with the trigger circuit, the voltage divider circuit having a first tap and configured to generate a first reference voltage at the first tap. This feature in combination with the rest of the claim limitations is not anticipated or rendered obvious by the prior art of record. Claims 16-20 are allowed. The prior art does not disclose an electrostatic discharge (ESD) protection circuit comprising: a clamp circuit coupled between a first voltage supply node and a second voltage supply node, the clamp circuit including: a third transistor having a first current electrode coupled at the first voltage supply node, a second current electrode coupled at the first current electrode of the second transistor at a second clamp node, a control electrode, and a body electrode coupled at the second current electrode; a second bias generator circuit coupled at the control electrode of the third transistor; and a trigger circuit coupled with the clamp circuit, the trigger circuit having a first output coupled at the control electrode of the first transistor, a second output coupled at the control electrode of the second transistor, and a third output coupled at the control electrode of the third transistor. This feature in combination with the rest of the claim limitations is not anticipated or rendered obvious by the prior art of record. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DHARTI PATEL whose telephone number is (571)272-8659. The examiner can normally be reached M - F 9 AM - 5 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Thienvu Tran can be reached at 571-270-1276. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. DHARTI PATEL Primary Examiner Art Unit 2836 /DHARTI H PATEL/Primary Examiner, Art Unit 2838
Read full office action

Prosecution Timeline

Jul 10, 2024
Application Filed
Feb 12, 2026
Non-Final Rejection mailed — §102
May 12, 2026
Response Filed

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12640554
PROTECTING CIRCUIT FOR BATTERY DURING ENGINE STARTING EVENTS
2y 1m to grant Granted May 26, 2026
Patent 12633738
OUTPUT DRIVER
2y 1m to grant Granted May 19, 2026
Patent 12633847
ELECTROSTATIC ADSORPTION TOOL AND OBJECT SURFACE PROCESSING METHOD
1y 10m to grant Granted May 19, 2026
Patent 12627134
AIRCRAFT SOLID STATE POWER CONTROLLER AND METHOD OF OPERATING AN AIRCRAFT SOLID STATE POWER CONTROLLER
2y 6m to grant Granted May 12, 2026
Patent 12627138
Electrical discharge circuit
2y 2m to grant Granted May 12, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
95%
With Interview (+7.8%)
2y 3m (~4m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1253 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month