Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2836 2838 2844 2893
This examiner grants 87% of resolved cases
Dharti Haridas Patel has 1266 resolved cases in Tech Center 2800 and Art Unit 2836. The examiner has an 87.4% allowance rate and a median days to allowance of 833. This 833-day figure provides a specific timeline for the 1266 resolved cases. Practitioners can use this data to estimate the duration of the grant process.
The interview lift is 7.7%. Across 1266 resolved cases, this lift shows a measurable benefit from interviews. Practitioners can expect an 87.4% allowance rate and a 833-day median timeline for their applications. The 7.7% interview lift and 87.4% allowance rate together suggest that direct communication is a useful tactic for resolving issues in this art unit.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19018089 | SEMICONDUCTOR WAFER PROCESSING APPARATUS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18971395 | SEMICONDUCTOR DEVICE AND POWER SEMICONDUCTOR SYSTEM INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18829431 | Aliasing-Based Broadband Noise Power Estimation for Arc-Fault Detection | Non-Final OA | ABB Schweiz AG |
| 19101095 | SHUTOFF SYSTEM | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18209361 | DEVICE, METHOD AND SYSTEM FOR IMPROVED ELECTROSTATIC DISCHARGE PROTECTION | Non-Final OA | Intel Corporation |
| 18869066 | CHARGING DEVICE | Non-Final OA | Nippon Telegraph and Telephone Corporation |
| 18607098 | POWER CLAMP CIRCUIT AND ELECTRONIC DEVICE INCLUDING POWER CLAMP CIRCUIT | Non-Final OA | SK hynix Inc. |
| 18834982 | METHOD AND APPARATUS FOR RADIO FREQUENCY GRID DESIGN IN AN ESC TO REDUCE FILM ASYMMETRY | Non-Final OA | Lam Research Corporation |
| 18990138 | CIRCUIT AND METHOD FOR HIGH VOLTAGE TOLERANT ESD PROTECTION | Non-Final OA | Taiwan Semiconductor Manufacturing Company Ltd. |
| 18768453 | Semiconductor Device | Non-Final OA | ROHM CO., LTD. |
| 19065128 | PORTABLE GROUND FAULT CIRCUIT INTERRUPTER AND/OR ARC FAULT CIRCUITRY INTERRUPTER AND METHOD OF OPERATING THE SAME | Non-Final OA | Hubbell Incorporated |
| 19094087 | PROTECTION CIRCUIT AND EMBEDDED MULTI-CHIP SYSTEM | Non-Final OA | INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE |
| 19064806 | SERIES Z-SOURCE CIRCUIT BREAKER WITH PULSE-TESTING CAPABILITY | Non-Final OA | S&C Electric Company |
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