Prosecution Insights
Last updated: July 31, 2026
Application No. 18/771,964

Memory Circuitry Comprising a Vertical String of Memory Cells and a Conductive Via and Method Used in Forming a Vertical String of Memory Cells and a Conductive Via

Non-Final OA §103§112
Filed
Jul 12, 2024
Priority
Jun 01, 2016 — divisional of 10/446,571 +1 more
Examiner
MIYOSHI, JESSE Y
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
57%
Grant Probability
Moderate
1-2
OA Rounds
1y 6m
Est. Remaining
76%
With Interview

Examiner Intelligence

Grants 57% of resolved cases
57%
Career Allowance Rate
276 granted / 484 resolved
-11.0% vs TC avg
Strong +19% interview lift
Without
With
+18.7%
Interview Lift
resolved cases with interview
Typical timeline
3y 7m
Avg Prosecution
34 currently pending
Career history
544
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
75.6%
+35.6% vs TC avg
§102
15.9%
-24.1% vs TC avg
§112
5.3%
-34.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 484 resolved cases

Office Action

§103 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of species 3 as shown in fig. 22 (claims 1-13 readable thereon) in the reply filed on 4/27/2026 is acknowledged. Claim Rejections - 35 USC § 112 The following is a quotation of the first paragraph of 35 U.S.C. 112(a): (a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention. The following is a quotation of the first paragraph of pre-AIA 35 U.S.C. 112: The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor of carrying out his invention. Claims 1-13 are rejected under 35 U.S.C. 112(a) or 35 U.S.C. 112 (pre-AIA ), first paragraph, as failing to comply with the written description requirement. The claim(s) contains subject matter which was not described in the specification in such a way as to reasonably convey to one skilled in the relevant art that the inventor or a joint inventor, or for applications subject to pre-AIA 35 U.S.C. 112, the inventor(s), at the time the application was filed, had possession of the claimed invention. Claim 1 recites the limitation “laterally opposing projections that project radially inward toward one another elevationally over tops of the second container sidewalls” at the last two lines. The specification as filed recites that elements 74 and 76 are projections that project over tops of second container 46 at paragraph 55. However, the claimed “second conductive container (69) inside a first conductive container (46)” means that element 46 corresponds to the claimed “first conductive container”, therefore the claimed projections (74,76) over tops of the second container (69) is not supported by the specification, but rather the claimed projections (74, 76) are over tops of the first container (46). These features are not disclosed in the elected embodiment of fig. 22. Claim 10 recites the limitation “uppermost portions of the opposing sidewalls having a first lateral thickness that is less than a second lateral thickness of a lower portion of the opposing sidewalls immediately above the base in the vertical cross-section” at the last 4 lines. There is no disclosure of the conductive container sidewall which has a lateral thickness immediately above the base being thicker than a lateral thickness at the uppermost portions of the conductive sidewall. The elected embodiment of fig. 22 only shows a thicker sidewall at projections 74, 76 but that area is not immediately above the base. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-3, and 6-9 is/are rejected under 35 U.S.C. 103 as being unpatentable over Lee (US PGPub 2017/0338241) in view of Sawabe et al. (US PGPub 2017/0077120; hereinafter “Sawabe”). Re claim 1: Lee teaches (e.g. fig. 4) a memory circuitry comprising a vertical string of memory cells (MC) and a conductive via (193B), comprising: a first region (left segment of fig. 4; hereinafter “1R”) of vertically-alternating tiers of first insulative material (151) and control gate material (171G), a second region (right segment of fig. 4; hereinafter “2R”) of vertically-alternating tiers of the first insulative material (151) and a second insulative material (153), the second region (2R) being laterally offset from the first region (1R); a channel pillar (167; e.g. paragraph 55) extending elevationally through multiple of the vertically-alternating tiers (151, 171G) within the first region (1R); tunnel insulator (165; e.g. paragraph 57), charge storage material (163; e.g. paragraph 57), and control gate blocking insulator (161; e.g. paragraph 57) between the channel pillar (167) and the control gate material (171G) of individual of the tiers of the control gate material (167G) within the first region (1R); a conductive via (193B) extending elevationally through the vertically- alternating tiers (151, 153) in the second region (2R), the conductive via (193B) within the alternating tiers (151, 153) of the different composition insulating materials (silicon oxide 151 and silicon nitride 153; e.g. paragraph 85) in the second region (2R). Lee is silent as to explicitly teaching the conductive via comprising a second conductive container inside a first conductive container within the alternating tiers of the different composition insulating materials in the second region, the first and second conductive containers individually having opposing sidewalls and a base extending there-between in vertical cross-section; and laterally opposing projections that project radially inward toward one another elevationally over tops of the second container sidewalls. Sawabe teaches (e.g. fig. 5) the conductive via (via formed of metal layers 161,163,162,164,165; hereinafter “CV”) comprising a second conductive container (163) inside a first conductive container (165, 164) within the alternating tiers of the different composition insulating materials (151, 153 of Lee) in the second region (2R of Lee), the first (165, 164) and second (163) conductive containers individually having opposing sidewalls and a base (base of 163, 165) extending there-between in vertical cross-section; and laterally opposing projections (base of 164) that project radially inward toward one another elevationally over tops of the second container (163) sidewalls. It would have been obvious to one of ordinary skill in the art at the time of effective filing, absent unexpected results, to use the via structure of Sawabe in the device of Lee in order to have the predictable result of using a known structure which has superior diffusion prevention properties so that via integrity is improved. Re claim 2: Lee teaches claim the memory circuitry of claim 1 wherein the first region (1R) is over a conductive structure (SR) and the second region (2R) is over an insulator structure (147, 129). Re claim 3: Lee teaches claim the memory circuitry of claim 2 wherein the conductive structure (SR) comprises a conductively doped source material (source stack SR). Re claim 6: Lee teaches claim the memory circuitry of claim 2 wherein the channel pillar (167) contacts the conductive structure (SR). Re claim 7: Lee teaches claim the memory circuitry of claim 2 wherein the conductive via (193B) extends entirely through the insulator structure (147). Re claim 8: Lee teaches claim the memory circuitry of claim 7 further comprising a conductive region (119) under the insulator structure (147) and wherein the conductive via (193B) extends to an upper surface of the conductive region (119). Re claim 9: Lee teaches claim the memory circuitry of claim 8 wherein the conductive region (119) comprises one or more materials selected from the group consisting of conductively doped semiconductive material, an elemental metal, a mixture of two or more elemental metals, an alloy of two or more elemental metals, and conductive metal compounds (resistor conductive layer for 119; e.g. paragraph 77). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JESSE Y MIYOSHI whose telephone number is (571)270-1629. The examiner can normally be reached M-F, 8:30AM-5:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jessica Manno can be reached at 571-272-2339. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JESSE Y MIYOSHI/ Primary Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

Jul 12, 2024
Application Filed
Jul 30, 2024
Response after Non-Final Action
Jul 14, 2026
Non-Final Rejection mailed — §103, §112
Jul 22, 2026
Response Filed

Precedent Cases

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4y 9m to grant Granted Jun 02, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
57%
Grant Probability
76%
With Interview (+18.7%)
3y 7m (~1y 6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 484 resolved cases by this examiner. Grant probability derived from career allowance rate.

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