Prosecution Insights
Last updated: August 17, 2026
Application No. 18/777,722

SEMICONDUCTOR DEVICES

Non-Final OA §102§103
Filed
Jul 19, 2024
Priority
Feb 02, 2024 — RE 10-2024-0016589
Examiner
ENAD, CHRISTINE A
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allowance Rate
1137 granted / 1348 resolved
+24.3% vs TC avg
Moderate +10% lift
Without
With
+10.3%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
30 currently pending
Career history
1396
Total Applications
across all art units

Statute-Specific Performance

§101
1.7%
-38.3% vs TC avg
§103
64.3%
+24.3% vs TC avg
§102
19.3%
-20.7% vs TC avg
§112
8.2%
-31.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1348 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1, 13-15, 20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Kim et al (US Publication No. 2014/0264727). Regarding claim 1, Kim discloses a semiconductor device comprising: an active pattern Fig 9A, 110 on a substrate Fig 9B, 100, the active pattern Fig 9A, 110 comprising a first tab Fig 9A, 10B/110D, a second tab Fig 9A, 110C/110E, and an active bar Fig 9A, 110A between the first tab Fig 9A, 110B/110D and the second tab Fig 9A, 110C/110E; a gate structure extending into the active bar of the active pattern in a first direction that is substantially parallel to an upper surface of the substrate¶0069, 0107; a bit line structure Fig 10B, 172 ¶00076-0077 on the first tab of the active pattern and extending in a second direction that is substantially parallel to the upper surface of the substrate and orthogonal to the first direction Fig 10A; a contact plug structure Fig 10B, 182 on the second tab of the active pattern Fig 16; and a capacitor Fig 10B, 190 on the contact plug structure Fig 10B, wherein the active bar of the active pattern extends in a third direction, wherein the first tab and the second tab of the active pattern are respectively on a first end of the active bar and a second end of the active bar that is opposite to the first end in the third direction and extend from the active bar in the second direction Fig 9B and Fig 10B, wherein the third direction is substantially parallel to the upper surface of the substrate, defines an obtuse angle with respect to the first direction, and defines an acute angle with respect to the second direction Fig 9A, 10A and Fig 11-17. Regarding claim 13, Kim discloses wherein the contact plug structure further comprises a first contact plug directly contacting the second tab of the active pattern, and wherein an upper surface of the first contact plug and an upper surface of the second tab of the active pattern have substantially a same shape in a plan view Fig 16. Regarding claim 14, Kim discloses a semiconductor device comprising: a plurality of active patterns Fig 9A, 110 that are on a substrate Fig 9B, 100 and spaced apart in a first direction and a second direction that is orthogonal to the first direction Fig 9A-9B, Fig 11-16, wherein each active pattern of the plurality of active patterns comprises a first tab Fig 9A, 110B/11D, a second tab Fig 9A, 110C/110E spaced apart from the first tab in a third direction Fig 9A, and an active bar Fig 9A, 110A that is between the first tab and the second tab and extends in the third direction Fig 9A, wherein the third direction is substantially parallel to an upper surface of the substrate Fig 9A-9B, Fig 11-16, defines an obtuse angle with respect to the first direction, and defines an acute angle with respect to the second direction Fig 9A-9B, Fig 11-16, and wherein the first tab and the second tab of each of the plurality of active patterns extend in the second direction from the active bar Fig 9A-9B, Fig 11-16. Regarding claim 15, Kim discloses wherein: a first set of the plurality of active patterns that are spaced apart in the first direction defines a first active pattern row among a plurality of active pattern rows that are spaced apart from each other in the second direction Fig 9A-9B, Fig 11-16, a second set of the plurality of active patterns that are spaced apart in the first direction defines a second active pattern row among the plurality of active pattern rows is adjacent to the first set of the plurality of active patterns, and the first tab of each of the first set of the plurality of active patterns and the second tab of each of the second set of the plurality of active patterns are alternately stacked in the first direction Fig 9A-9B, Fig 11-16. Regarding claim 20, Kim discloses semiconductor device comprising: a plurality of active patterns Fig 9A, 110 that are on a substrate and spaced apart in a first direction and a second direction that is orthogonal to the first direction Fig 9A-9B, Fig 11-16, wherein: each active pattern of the plurality of active patterns comprises a first tab Fig 9A, 110B/11D, a second tab Fig 9A, 110C/110E spaced apart from the first tab in a third direction Fig 9A and an active bar Fig 9A, 110A that is between the first tab and the second tab and extends in the third direction Fig 9A, wherein the third direction is substantially parallel to an upper surface of the substrate Fig 9A-9B, Fig 11-16, defines an obtuse angle with respect to the first direction, and defines an acute angle with respect to the second direction Fig 9A-9B, Fig 11-16,the first tab and the second tab of each of the plurality of active patterns extend in the second direction from the active bar, a first set of the plurality of active patterns are spaced apart in the first direction Fig 9A-9B, Fig 11-16, and a second set of the plurality of active patterns are spaced apart in the second direction Fig 9A-9B, Fig 11-16, a gate structure extending into the active bars of the first set of the plurality of active patterns ¶0069, 0107; a bit line structure Fig 10B, 172 ¶00076-0077 extending into the first tabs of the second set of the plurality of active patterns; contact plug structures Fig 10B, 182 that are respectively on the second tabs of the plurality of active patterns; and capacitors Fig 10B, 190 that are respectively on the contact plug structures. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 2-12, 16-19 are rejected under 35 U.S.C. 103 as being unpatentable over Kim et al (US Publication No. 2014/0264727). Regarding claims 2-6, 16-19, Kim discloses all the limitations but silent on the shape of the active pattern. It would have been an obvious matter of design choice to modify the shape, since such a modification would have involved a mere change in the shape of a component. A change in shape is generally recognized as being within the level of ordinary skill in the art. In reDailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). Regarding claims 7-12, Kim discloses all the limitations but silent on the arrangement /shape/size of the active pattern. It would have been an obvious matter of design choice to modify the shape, since such a modification would have involved a mere change in the shape of a component. A change in shape is generally recognized as being within the level of ordinary skill in the art. In reDailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). Also, A change in size is generally recognized as being within the level of ordinary skill in the art. In re Rose, 220 F.2d 459, 105 USPQ 237 (CCPA 1995). It has been held that mere dimensional limitations are prima facie obvious absent a disclosure that the limitations are for a particular unobvious purpose, produce an unexpected result, or are otherwise critical. See, for example, In re Rose, 220 F. 2d 459, 105 USPQ 237 (CCPA 1955); In re Rinehart, 531 F .2d 1048, 189 USPQ 143 (CCPA 1976); Gardner v. TEC Systems, Inc., 725 F .2d 1338, 220 USPQ 777 (Fed. Cir. 1984), cert. denied, 469 U.S. 830, 225 USPQ 232 (1984); In re Dailey, 357 F .2d 669, 149 USPQ 47 (CCPA 1966). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHRISTINE A ENAD whose telephone number is (571)270-7891. The examiner can normally be reached Monday-Friday, 7:30 am -4:30 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lynne Gurley can be reached at 571 272 1670. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTINE A ENAD/Primary Examiner, Art Unit 2811
Read full office action

Prosecution Timeline

Jul 19, 2024
Application Filed
Jul 13, 2026
Non-Final Rejection mailed — §102, §103
Aug 06, 2026
Interview Requested

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12701738
LATERAL FIN FIELD-EFFECT TRANSISTORS
5y 7m to grant Granted Aug 04, 2026
Patent 12702027
ELECTRONIC DEVICE
2y 11m to grant Granted Aug 04, 2026
Patent 12696534
FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING COMMON METAL GATES AND HAVING GATE DIELECTRICS WITH A DIPOLE LAYER
5y 10m to grant Granted Jul 28, 2026
Patent 12696512
SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
4y 0m to grant Granted Jul 28, 2026
Patent 12696475
FIELD EFFECT TRANSISTOR HAVING SEGMENTED CHANNEL REGION
2y 11m to grant Granted Jul 28, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
95%
With Interview (+10.3%)
1y 11m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1348 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month