Prosecution Insights
Last updated: April 19, 2026
Application No. 18/785,482

METHOD FOR DRIVING DISPLAY DEVICE

Non-Final OA §102§103
Filed
Jul 26, 2024
Examiner
LAM, TUAN THIEU
Art Unit
2843
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Semiconductor Energy Laboratory Co. Ltd.
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
2y 1m
To Grant
91%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
775 granted / 1001 resolved
+9.4% vs TC avg
Moderate +13% lift
Without
With
+13.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
34 currently pending
Career history
1035
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
36.8%
-3.2% vs TC avg
§102
36.3%
-3.7% vs TC avg
§112
20.0%
-20.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1001 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application is being examined under the pre-AIA first to invent provisions. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of pre-AIA 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (e) the invention was described in (1) an application for patent, published under section 122(b), by another filed in the United States before the invention by the applicant for patent or (2) a patent granted on an application for patent by another filed in the United States before the invention by the applicant for patent, except that an international application filed under the treaty defined in section 351(a) shall have the effects for purposes of this subsection of an application filed in the United States only if the international application designated the United States and was published under Article 21(2) of such treaty in the English language. Claim(s) 2-3 is/are rejected under pre-AIA 35 U.S.C. 102(e) as being anticipated by Tsai et al. (US 2010/0150302). Regarding claim 2, Tsai et al.’s figure 4 A display device comprising: a scan line driver circuit including a first transistor (T2), a second transistor (T13), a third transistor (T6), a fourth transistor (T12), a fifth transistor (transistor receives input signal IN7/), and a sixth transistor (transistor receives input signal IN8/); wherein each of the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, and the sixth transistor includes oxide semiconductor in a channel region, wherein one of a source and a drain of the first transistor (T2) is electrically connected to a first wiring (IN1/), wherein the other of the source and the drain of the first transistor (T2) is electrically connected to a second wiring (OUT1/), wherein one of a source and a drain of the second transistor (T13) is electrically connected to a third wiring (wire connects to Vss), wherein the other of the source and the drain of the second transistor (T13) is electrically connected to the second wiring (OUT1/), wherein one of a source and a drain of the third transistor (T6) is electrically connected to a gate of the first transistor (T2) , wherein the other of the source and the drain of the third transistor (T6) is electrically connected to the other of the source and the drain of the first transistor (T2), wherein a gate of the third transistor (T6) is electrically connected to a fourth wiring (IN2/), wherein one of a source and a drain of the fourth transistor (T12) is electrically connected to the third wiring (T13 and T12 are coupled together to the same wiring), wherein the other of the source and the drain of the fourth transistor (T12) is electrically connected to the gate of the first transistor (T2), wherein a gate of the fourth transistor (T12) is electrically connected to a gate of the second transistor (T13), wherein one of a source and a drain of the fifth transistor (transistor receives IN7/) is electrically connected to a fifth wiring (wire connected to the transistor), wherein the other of the source and the drain of the fifth transistor is electrically connected to the gate of the first transistor (T2), wherein one of a source and a drain of the sixth transistor (transistor receives input signal IN8/) is electrically connected to the fifth wiring, wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the first transistor (T2), wherein a first signal (CK1) is input to the first wiring, wherein a second signal (CK2) is input to the fourth wiring, wherein the first signal is different from the second signal, and wherein the second wiring is a scan line (On) as called for in claim 2. Regarding claim 3, Tsai et al.’s figure 4 A display device comprising: a scan line driver circuit including a first transistor (T2), a second transistor (T13), a third transistor (T6), a fourth transistor (T12), a fifth transistor (transistor receives input signal IN7/), and a sixth transistor (transistor receives input signal IN8/); wherein each of the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, and the sixth transistor includes oxide semiconductor in a channel region, wherein one of a source and a drain of the first transistor (T2) is electrically connected to a first wiring (IN1/), wherein the other of the source and the drain of the first transistor (T2) is electrically connected to a second wiring (OUT1/), wherein one of a source and a drain of the second transistor (T13) is electrically connected to a third wiring (wire connects to Vss), wherein the other of the source and the drain of the second transistor (T13) is electrically connected to the second wiring (OUT1/), wherein one of a source and a drain of the third transistor (T6) is electrically connected to a gate of the first transistor (T2) , wherein the other of the source and the drain of the third transistor (T6) is electrically connected to the other of the source and the drain of the first transistor (T2), wherein a gate of the third transistor (T6) is electrically connected to a fourth wiring (IN2/), wherein one of a source and a drain of the fourth transistor (T12) is electrically connected to the third wiring (T13 and T12 are coupled together to the same wiring), wherein the other of the source and the drain of the fourth transistor (T12) is electrically connected to the gate of the first transistor (T2), wherein a gate of the fourth transistor (T12) is electrically connected to a gate of the second transistor (T13), wherein one of a source and a drain of the fifth transistor (transistor receives IN7/) is electrically connected to a fifth wiring (wire connected to the transistor), wherein the other of the source and the drain of the fifth transistor is electrically connected to the gate of the first transistor (T2), wherein one of a source and a drain of the sixth transistor (transistor receives input signal IN8/) is electrically connected to the fifth wiring, wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the first transistor (T2), wherein a first signal (CK1) is input to the first wiring, wherein a second signal (CK2) is input to the fourth wiring, wherein the first signal is different from the second signal, and wherein the second wiring is a scan line (On) and wherein a W/L (channel width/channel length) ratio of the fifth transistor is approximately equal to a W/L ratio of the sixth transistor (W/L of the fifth and sixth transistors are assumed to equal unless stated otherwise by the reference) as called for in claim 3. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of pre-AIA 35 U.S.C. 103(a) which forms the basis for all obviousness rejections set forth in this Office action: (a) A patent may not be obtained though the invention is not identically disclosed or described as set forth in section 102, if the differences between the subject matter sought to be patented and the prior art are such that the subject matter as a whole would have been obvious at the time the invention was made to a person having ordinary skill in the art to which said subject matter pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 4 is/are rejected under pre-AIA 35 U.S.C. 103(a) as being unpatentable over Tsai et al. (US 2010/0150302). Regarding claim 4, Tsai et al.’s figure 4 shows a display device comprising Tsai et al.’s figure 4 A display device comprising: a scan line driver circuit including a first transistor (T2), a second transistor (T13), a third transistor (T6), a fourth transistor (T12), a fifth transistor (transistor receives input signal IN7/), and a sixth transistor (transistor receives input signal IN8/); wherein each of the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, and the sixth transistor includes oxide semiconductor in a channel region, wherein one of a source and a drain of the first transistor (T2) is electrically connected to a first wiring (IN1/), wherein the other of the source and the drain of the first transistor (T2) is electrically connected to a second wiring (OUT1/), wherein one of a source and a drain of the second transistor (T13) is electrically connected to a third wiring (wire connects to Vss), wherein the other of the source and the drain of the second transistor (T13) is electrically connected to the second wiring (OUT1/), wherein one of a source and a drain of the third transistor (T6) is electrically connected to a gate of the first transistor (T2) , wherein the other of the source and the drain of the third transistor (T6) is electrically connected to the other of the source and the drain of the first transistor (T2), wherein a gate of the third transistor (T6) is electrically connected to a fourth wiring (IN2/), wherein one of a source and a drain of the fourth transistor (T12) is electrically connected to the third wiring (T13 and T12 are coupled together to the same wiring), wherein the other of the source and the drain of the fourth transistor (T12) is electrically connected to the gate of the first transistor (T2), wherein a gate of the fourth transistor (T12) is electrically connected to a gate of the second transistor (T13), wherein one of a source and a drain of the fifth transistor (transistor receives IN7/) is electrically connected to a fifth wiring (wire connected to the transistor), wherein the other of the source and the drain of the fifth transistor is electrically connected to the gate of the first transistor (T2), wherein one of a source and a drain of the sixth transistor (transistor receives input signal IN8/) is electrically connected to the fifth wiring, wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the first transistor (T2), wherein a first signal (CK1) is input to the first wiring, wherein a second signal (CK2) is input to the fourth wiring, wherein the first signal is different from the second signal. Tsai et al. reference does not show a W/L (channel width/channel length) ratio of the second transistor is larger than a W/L ratio of the fourth transistor as called for in claim 4. It is known in the art that a larger W/L ratio increases current flow and device speed, while a smaller W/L ratio reduces current and can minimize short-channel effects like DIBL and HCI. The optimal ratio depends on the desired application, technology node, and the need to balance performance with factors like power consumption and reliability. In this instant, the second transistor (T13) is connected between the scan line and the ground. Thus, enhancing its W/L ratio would be desired in bringing/pulling the output signal down at a higher speed. Therefore, outside of any non-obvious results, the obviousness of having the second transistor W/L ratio larger will not be patentable under 35USC 103. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUAN THIEU LAM whose telephone number is (571)272-1744. The examiner can normally be reached Monday-Friday, 8:30 am to 5:00 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lincoln Donovan can be reached at 571-272-1988. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUAN T LAM/Primary Examiner, Art Unit 2842 1/5/2026
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Prosecution Timeline

Jul 26, 2024
Application Filed
Jan 11, 2026
Non-Final Rejection — §102, §103
Apr 08, 2026
Response Filed

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
91%
With Interview (+13.3%)
2y 1m
Median Time to Grant
Low
PTA Risk
Based on 1001 resolved cases by this examiner. Grant probability derived from career allow rate.

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