Prosecution Insights
Last updated: April 19, 2026
Application No. 18/787,950

Three-Dimensional Phase-Change Memory Array Operable to Perform Multiplication Accumulation Operations

Non-Final OA §103
Filed
Jul 29, 2024
Examiner
BUI, THA-O H
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology, Inc.
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
92%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
849 granted / 965 resolved
+20.0% vs TC avg
Minimal +4% lift
Without
With
+4.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
28 currently pending
Career history
993
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
41.9%
+1.9% vs TC avg
§102
34.0%
-6.0% vs TC avg
§112
10.7%
-29.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 965 resolved cases

Office Action

§103
DETAILED ACTION Notice of AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claims 1-20 are pending in the application. Information Disclosure Statement The information Disclosure Statement (IDS) Form PTO-1449, filed 08/15/2024, 01/10/2025 are in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosed therein was considered by the examiner. Drawings The drawings submitted on 07/29/2024. These drawings are review and accepted by the examiner. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries set forth in Graham v. John Deere Co., 383 U.S. 1, 148 USPQ 459 (1966), that are applied for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claim 1, 12 are rejected under 35 U.S.C. 103 as being unpatentable over Grobis et al (US 10,355,049 B1 hereinafter “Grobis”) in view of Saenz et al (US 9,576,657 B1 hereinafter “Saenz”). Per MPEP 2111 and 2111.01, the claims are given their broadest reasonable interpretation and the words of the claims are given their plain meaning consistent with the specification without importing claim limitations from the specification. Regarding Independent Claim 1, Grobis, for example in Figs. 1-8, discloses a memory device (e.g., Memory Bay; in Figs. 1C-1F related in Figs. 2-8), comprising: a three-dimensional array of unit cells (e.g., 202; in Fig. 2B related in Figs. 1, 3-8), each respective unit cell in the array (e.g., M414 in array 204; in Figs. 2C1-2C3 related in Figs. 1, 3-8) having a selector (e.g., selector M111-436; in Figs. 2C1-2C3 related in Figs. 1, 3-8) and a memory cell having a phase-change material (e.g., reversible resistance-switching memory elements include a phase change material; in Figs. 2C1-2C3 related in Figs. 1, 3-8). Grobis discloses a selector as found in Figs. 2C1-2C3 related in Figs. 1, 3-8. However, Grobis is silent with regard to a selector transistor. In the same field of endeavor, Saenz, for example in Figs. 1-5, discloses the memory cell included the memory element and a selector transistor (e.g., transistor VR1; in Figs. 3A, 3B, 3C related in Figs. 1-2, 4-5). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Grobis such as methods and apparatus for three-dimensional non-volatile memory (see for example in Figs. 1-8 of Grobis) by incorporating the teaching of Saenz such as memory cells including vertically oriented adjustable resistance structures (see for example in Figs. 1-5 of Saenz), for the purpose of controlling the memory cell that includes a vertically-oriented adjustable resistance structure including a control terminal coupled to a word line, and a reversible resistance-switching element coupled in series with and disposed above or below the vertically-oriented adjustable resistance structure (Saenz disclosed). Regarding Independent Claim 12, Grobis, for example in Figs. 1-8, discloses an apparatus (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8), comprising: a first local digit line (e.g., LBL11; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured to extend in a first direction (e.g., Z direction; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); a second local digit line (e.g., LBL12; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured in parallel with the first local digit line (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); a plurality of unit cells (e.g., non-volatile memory cells M112-222; in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) stacked in the first direction (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) and sandwiched between the first local digit line and the second local digit line (see for example in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8), each respective unit cell among the plurality of unit cells configured to connect the first local digit line to the second local digit line in a second direction (e.g., X direction; in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) that is perpendicular to the first direction, the respective unit cell having a transistor and a memory cell (e.g., S as selector and R as reversible resistance-switching memory element; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); and a plurality of wordlines (e.g., WL10-40; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured to extend in a third direction (e.g., Y direction; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) that is perpendicular to the first direction and the second direction, wherein selectors in the plurality of unit cells are connected to the wordlines (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8). However, Grobis is silent with regard to a selector transistor. In the same field of endeavor, Saenz, for example in Figs. 1-5, discloses the memory cell included the memory element and a selector transistor (e.g., transistor VR1; in Figs. 3A, 3B, 3C related in Figs. 1-2, 4-5). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Grobis such as methods and apparatus for three-dimensional non-volatile memory (see for example in Figs. 1-8 of Grobis) by incorporating the teaching of Saenz such as memory cells including vertically oriented adjustable resistance structures (see for example in Figs. 1-5 of Saenz), for the purpose of controlling the memory cell that includes a vertically-oriented adjustable resistance structure including a control terminal coupled to a word line, and a reversible resistance-switching element coupled in series with and disposed above or below the vertically-oriented adjustable resistance structure (Saenz disclosed). Allowable Subject Matter Claims 2-11, 13-16 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 2, the prior arts of record fail to teach or suggest a memory device as recited in claim 2, and particularly, wherein the respective unit cell further includes two ionic liquid layers; and the phase-change material is sandwiched between the two ionic liquid layers. Regarding claim 13, the prior arts of record fail to teach or suggest an apparatus as recited in claim 13, and particularly, wherein the memory cell includes: a first metal layer; a first iconic liquid layer on the first metal layer; a layer of phase-change material on the first iconic liquid layer; a second iconic liquid layer on the layer of phase-change material; and a second metal layer on the second iconic liquid layer. Claims 17-20 are allowed. The following is an examiner’s statement of reasons for allowance: The prior art made of record and considered pertinent to the applicant’s disclosure does not teach or suggest the claimed limitations. Grobis et al (US 10,355,049 B1 hereinafter “Grobis”) and Saenz et al (US 9,576,657 B1 hereinafter “Saenz”), taken individually or in combination, do not teach the claimed invention having the following limitations, in combination with the remaining claimed limitations: Regarding Independent claim 17, there is no teaching, suggestion, or motivation for combination in the prior art to the step of applying, to a plurality of wordlines connected to transistors in the plurality of unit cells, voltages representative of input data to cause a current in the first local digit line to be representative of a sum of the input data multiplied by the weight data; connecting, via a select device stacked on top of the plurality of unit cells, the current in the first local digit line to a global digit line; and determining, via an analog to digit convert connected to the global digit line, the sum from measuring the current as a multiple of a predetermined amount of current, in combination with the other limitations in the claim. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to THA-O H BUI whose telephone number is (571)270-7357. The examiner can normally be reached M-F 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, ALEXANDER SOFOCLEOUS can be reached at 571-272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THA-O H BUI/ Primary Examiner, Art Unit 2825 01/02/2026
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Prosecution Timeline

Jul 29, 2024
Application Filed
Jan 02, 2026
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
92%
With Interview (+4.3%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 965 resolved cases by this examiner. Grant probability derived from career allow rate.

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