Prosecution Insights
Last updated: July 17, 2026
Application No. 18/787,950

Three-Dimensional Phase-Change Memory Array Operable to Perform Multiplication Accumulation Operations

Final Rejection §103
Filed
Jul 29, 2024
Priority
Feb 23, 2024 — provisional 63/557,006
Examiner
BUI, THA-O H
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology Inc.
OA Round
2 (Final)
88%
Grant Probability
Favorable
3-4
OA Rounds
2m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
866 granted / 982 resolved
+20.2% vs TC avg
Minimal +4% lift
Without
With
+4.2%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 2m
Avg Prosecution
18 currently pending
Career history
1003
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
70.8%
+30.8% vs TC avg
§102
11.2%
-28.8% vs TC avg
§112
3.4%
-36.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 982 resolved cases

Office Action

§103
DETAILED ACTION Notice of AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment Acknowledgment is made of applicant’s Amendment, filed 04 May 2026. The changes and remarks disclosed therein have been considered. No claims have been cancelled/added by Amendment. Therefore, claims 1-20 are pending in the application. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries set forth in Graham v. John Deere Co., 383 U.S. 1, 148 USPQ 459 (1966), that are applied for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claim 1, 12 are rejected under 35 U.S.C. 103 as being unpatentable over Grobis et al (US 10,355,049 B1 hereinafter “Grobis”) in view of Saenz et al (US 9,576,657 B1 hereinafter “Saenz”). Per MPEP 2111 and 2111.01, the claims are given their broadest reasonable interpretation and the words of the claims are given their plain meaning consistent with the specification without importing claim limitations from the specification. Regarding Independent Claim 1, Grobis, for example in Figs. 1-8, discloses a memory device (e.g., Memory Bay; in Figs. 1C-1F related in Figs. 2-8), comprising: a three-dimensional array of unit cells (e.g., 202; in Fig. 2B related in Figs. 1, 3-8), each respective unit cell in the array (e.g., M414 in array 204; in Figs. 2C1-2C3 related in Figs. 1, 3-8) having a selector (e.g., selector M111-436; in Figs. 2C1-2C3 related in Figs. 1, 3-8) and a memory cell having a phase-change material (e.g., reversible resistance-switching memory elements include a phase change material; in Figs. 2C1-2C3 related in Figs. 1, 3-8). Grobis discloses a selector as found in Figs. 2C1-2C3 related in Figs. 1, 3-8. However, Grobis is silent with regard to a selector transistor. In the same field of endeavor, Saenz, for example in Figs. 1-5, discloses the memory cell included the memory element and a selector transistor (e.g., transistor VR1; in Figs. 3A, 3B, 3C related in Figs. 1-2, 4-5). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Grobis such as methods and apparatus for three-dimensional non-volatile memory (see for example in Figs. 1-8 of Grobis) by incorporating the teaching of Saenz such as memory cells including vertically oriented adjustable resistance structures (see for example in Figs. 1-5 of Saenz), for the purpose of controlling the memory cell that includes a vertically-oriented adjustable resistance structure including a control terminal coupled to a word line, and a reversible resistance-switching element coupled in series with and disposed above or below the vertically-oriented adjustable resistance structure (Saenz disclosed). Regarding Independent Claim 12, Grobis, for example in Figs. 1-8, discloses an apparatus (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8), comprising: a first local digit line (e.g., LBL11; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured to extend in a first direction (e.g., Z direction; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); a second local digit line (e.g., LBL12; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured in parallel with the first local digit line (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); a plurality of unit cells (e.g., non-volatile memory cells M112-222; in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) stacked in the first direction (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) and sandwiched between the first local digit line and the second local digit line (see for example in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8), each respective unit cell among the plurality of unit cells configured to connect the first local digit line to the second local digit line in a second direction (e.g., X direction; in Figs. 2A, 2B, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) that is perpendicular to the first direction, the respective unit cell having a transistor and a memory cell (e.g., S as selector and R as reversible resistance-switching memory element; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8); and a plurality of wordlines (e.g., WL10-40; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) configured to extend in a third direction (e.g., Y direction; in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8) that is perpendicular to the first direction and the second direction, wherein selectors in the plurality of unit cells are connected to the wordlines (see for example in Figs. 2A, 2C1, 2C2, 2C3 related in Figs. 1, 3-8). However, Grobis is silent with regard to a selector transistor. In the same field of endeavor, Saenz, for example in Figs. 1-5, discloses the memory cell included the memory element and a selector transistor (e.g., transistor VR1; in Figs. 3A, 3B, 3C related in Figs. 1-2, 4-5). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Grobis such as methods and apparatus for three-dimensional non-volatile memory (see for example in Figs. 1-8 of Grobis) by incorporating the teaching of Saenz such as memory cells including vertically oriented adjustable resistance structures (see for example in Figs. 1-5 of Saenz), for the purpose of controlling the memory cell that includes a vertically-oriented adjustable resistance structure including a control terminal coupled to a word line, and a reversible resistance-switching element coupled in series with and disposed above or below the vertically-oriented adjustable resistance structure (Saenz disclosed). Allowable Subject Matter Claims 2-11, 13-16 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 2, the prior arts of record fail to teach or suggest a memory device as recited in claim 2, and particularly, wherein the respective unit cell further includes two ionic liquid layers; and the phase-change material is sandwiched between the two ionic liquid layers. Regarding claim 13, the prior arts of record fail to teach or suggest an apparatus as recited in claim 13, and particularly, wherein the memory cell includes: a first metal layer; a first iconic liquid layer on the first metal layer; a layer of phase-change material on the first iconic liquid layer; a second iconic liquid layer on the layer of phase-change material; and a second metal layer on the second iconic liquid layer. Claims 17-20 are allowed. The following is an examiner’s statement of reasons for allowance: The prior art made of record and considered pertinent to the applicant’s disclosure does not teach or suggest the claimed limitations. Grobis et al (US 10,355,049 B1 hereinafter “Grobis”) and Saenz et al (US 9,576,657 B1 hereinafter “Saenz”), taken individually or in combination, do not teach the claimed invention having the following limitations, in combination with the remaining claimed limitations: Regarding Independent claim 17, there is no teaching, suggestion, or motivation for combination in the prior art to the step of applying, to a plurality of wordlines connected to transistors in the plurality of unit cells, voltages representative of input data to cause a current in the first local digit line to be representative of a sum of the input data multiplied by the weight data; connecting, via a select device stacked on top of the plurality of unit cells, the current in the first local digit line to a global digit line; and determining, via an analog to digit convert connected to the global digit line, the sum from measuring the current as a multiple of a predetermined amount of current, in combination with the other limitations in the claim. Response to Arguments Applicant's arguments filed 04 May 2026 have been fully considered but they are not persuasive. In response to applicant’s argument against the references individually, one cannot show nonobviousness by attacking references individually where the rejections are based on combinations of references. See In re Keller, 642 F.2d 413, 208 USPQ 871 (CCPA 1981); In re Merck & Co., 800 F.2d 1091, 231 USPQ 375 (Fed. Cir. 1986). Conclusion THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to THA-O H BUI whose telephone number is (571)270-7357. The examiner can normally be reached M-F 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, ALEXANDER SOFOCLEOUS can be reached at 571-272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THA-O H BUI/ Primary Examiner, Art Unit 2825 06/12/2026
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Prosecution Timeline

Jul 29, 2024
Application Filed
Jan 02, 2026
Non-Final Rejection (signed) — §103
Feb 02, 2026
Non-Final Rejection mailed — §103
May 04, 2026
Response Filed
Jun 17, 2026
Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
88%
Grant Probability
92%
With Interview (+4.2%)
2y 2m (~2m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 982 resolved cases by this examiner. Grant probability derived from career allowance rate.

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