Prosecution Insights
Last updated: July 17, 2026
Application No. 18/790,867

IN-MEMORY COMPUTATION DEVICE WITH AT LEAST AN IMPROVED DIGITAL DETECTOR FOR A MORE ACCURATE CURRENT MEASUREMENT

Non-Final OA §112
Filed
Jul 31, 2024
Priority
Aug 01, 2023 — IT 102023000016299
Examiner
NGUYEN, VIET Q
Art Unit
2827
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
STMicroelectronics N.V.
OA Round
1 (Non-Final)
95%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 95% — above average
95%
Career Allowance Rate
1194 granted / 1256 resolved
+27.1% vs TC avg
Minimal +4% lift
Without
With
+3.5%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 8m
Avg Prosecution
26 currently pending
Career history
1272
Total Applications
across all art units

Statute-Specific Performance

§101
2.0%
-38.0% vs TC avg
§103
31.7%
-8.3% vs TC avg
§102
37.1%
-2.9% vs TC avg
§112
16.2%
-23.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1256 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . 1. Claims 1-17 are present for examination. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. 2. Claims 4, 13 & 15 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 4, on last 3 lines, “said control signals” lack a clear antecedent basis from parent claim 1. Please amend it to read as “said one or more control signals” to be consistent with language of claim 1. Claim 13, line 1, “the digital detector” lacks a clear antecedent basis from parent claim 1. Please amend it to read “the first digital detector” to be consistent with language of claim 1. Claim 15, line 3, the term “the digital detector” similarly needs a clear antecedent basis. Allowable Subject Matter 3. Claims 1-3 , 5-12, 14. 16-17 all contain allowable subject matter over the prior arts of record for reciting a novel “in-memory computation device” (IMC) device configured to receive an input signal indicative of a plurality of input values and to provide at least an output signal indicative of a plurality of output values, the IMC device comprising the following components: - a word line activation circuit configured to receive the input signal and to provide a plurality of word line activation signals, each word line activation signal being a function of a respective input value of the input values; - a biasing circuit configured to provide a biasing voltage; - a memory array comprising a plurality of first memory cells coupled to a first bit line and each coupled to a respective word line, the first bit line being configured to receive the biasing voltage, the first memory cells being configured to each store a respective computational weight and to each receive from the respective word line a respective word line activation signal of the plurality of word line activation signals, the first memory cells being configured to be each traversed by a respective cell current which is a function of the biasing voltage, of the respective word line activation signal and of the respective computational weight, the first bit line being configured to be traversed by a first bit line current which is a sum of the cell currents; and - a first digital detector coupled to the first bit line and configured to sample the first bit line current and, in response to the first bit line current, provide the output signal; wherein the first digital detector comprises: and - a control stage electrically coupled to the first bit line and configured to receive the first bit line current, generate at least a first main control mirrored current in response to the first bit line current, compare the first main control mirrored current with at least a first reference current and generate one or more control signals indicative of said comparison; and - a selection stage electrically coupled to the control stage and the first bit line and configured to receive the first bit line current and the one or more control signals and generate a total selection current in response to the first bit line current and as a function of the one or more control signals; and - an integration stage electrically coupled to the selection stage and configured to receive and sample the total selection current; and - a charge counter stage electrically coupled to the integration stage and to the control stage and configured to receive the total selection current sampled and the one or more control signals and generate, as a function of the one or more control signals, the output signal in response to the sampled first total selection current. Additionally, the claims 4, 13 & 15 are objected as dependent upon rejected claim 1 but they also add more novel libations to the recited structure of parent claim 1, which they are also together allowed for the same reason above. 4. Any inquiry concerning this communication or earlier communications from the examiner should be directed to VIET Q NGUYEN whose telephone number is (571)272-1788. The examiner can normally be reached M-F 7:30-3PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Amir Zarabian can be reached at 571-272-1852. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /VIET Q NGUYEN/Primary Examiner, Art Unit 2827
Read full office action

Prosecution Timeline

Jul 31, 2024
Application Filed
May 06, 2026
Non-Final Rejection mailed — §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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CHIP SELECT WIRING FOR A DUAL DEVICE PACKAGE
2y 7m to grant Granted Jul 14, 2026
Patent 12685124
MEMORY ARRAY CIRCUIT
2y 1m to grant Granted Jul 14, 2026
Patent 12682945
APPARATUSES AND METHODS FOR SINGLE AND MULTI MEMORY CELL ARCHITECTURES
2y 0m to grant Granted Jul 14, 2026
Patent 12676186
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2y 8m to grant Granted Jul 07, 2026
Patent 12676181
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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
95%
Grant Probability
99%
With Interview (+3.5%)
1y 8m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1256 resolved cases by this examiner. Grant probability derived from career allowance rate.

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