Prosecution Insights
Prosecution Insights
Tech Center 4100 • Art Units: 2187 2818 2827 4100
This examiner grants 95% of resolved cases
Viet Q Nguyen is assigned to Art Unit 2187 within Tech Center 4100. The examiner has 1269 resolved cases. The data shows an allowance rate of 95.1 percent, which is the frequency of successful outcomes for applications in this set. The median days to allowance is 618. This duration suggests a fast path to a patent grant for applications handled by this examiner.
The interview lift is 3.5 percent. This figure indicates that while interviews are associated with a higher likelihood of allowance, the 95.1 percent allowance rate is already the baseline. Applicants may find that the 618 median days to allowance is achievable without the 3.5 percent lift provided by an interview. The 1269 resolved cases provide a strong statistical foundation for these metrics.
In Art Unit 2187, the allowance rate reflects a receptive environment. The median days to allowance is a key benchmark for planning prosecution timelines in Tech Center 4100. Given the interview lift, practitioners might focus on high-quality initial filings to maintain the existing probability of success.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19003386 | PHASE SPLIT CIRCUIT GENERATING COMPLEMENTARY CLOCK SIGNALS AND MEMORY DEVICE INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 19059871 | STATIC RANDOM-ACCESS MEMORY | Non-Final OA | Intel Corporation |
| 19023577 | MEMORY DEVICE AND ELECTRONIC DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 19047624 | MEMORY APPARATUS AND OPERATION METHOD OF MEMORY APPARATUS | Non-Final OA | SK hynix Inc. |
| 19034575 | VERTICAL MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18971871 | SIGNAL ROUTING BETWEEN MEMORY DIE AND LOGIC DIE | Non-Final OA | Micron Technology, Inc. |
| 18745943 | METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED MICROELECTRONIC DEVICES AND MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 19033172 | MEMORY CIRCUIT AND METHOD OF OPERATING SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 19032453 | SENSE AMPLIFIER CIRCUIT, MEMORY CIRCUIT, AND SENSING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18984182 | Multi-Fuse Memory Cell Circuit and Method | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18980698 | LOAD REDUCED MEMORY MODULE | Non-Final OA | Rambus Inc. |
| 19046048 | SUB-BLOCK MODE ERASE TECHNIQUES IN A MEMORY DEVICE | Non-Final OA | Sandisk Technologies, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy