Prosecution Insights
Last updated: October 23, 2026
Application No. 18/797,085

PRINTED CIRCUIT BOARD

Non-Final OA §102§103
Filed
Aug 07, 2024
Priority
Dec 07, 2023 — RE 10-2023-0176390
Examiner
DINH, TUAN T
Art Unit
2847
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electro-Mechanics Co., Ltd.
OA Round
2 (Non-Final)
79%
Grant Probability
Favorable
2-3
OA Rounds
8m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allowance Rate
948 granted / 1202 resolved
+10.9% vs TC avg
Strong +22% interview lift
Without
With
+22.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 11m
Avg Prosecution
26 currently pending
Career history
1243
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
44.4%
+4.4% vs TC avg
§102
39.0%
-1.0% vs TC avg
§112
6.1%
-33.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1202 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Note: glass cloth is made from real glass, but it is a flexible textile rather than a rigid, solid object like a window or a drinking glass, and a prepreg material can be made from a glass fabric or woven glass. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-6, 13-14, 20, and 25-26 is/are rejected under 35 U.S.C. 102a(1) as being anticipated by Koyanagi (U.S. Patent 9,161,453). As to claim 1, Koyanagi discloses a printed circuit board (10, column 2, line 39) as shown in figures 1-10 comprising: a glass layer (core layer 11, column 2, line 51+) having a cavity (11x); a through-via (11y) having a through-portion penetrating the glass layer (11), and a protrusion portion (the conductor 26 filled into the through hole 11x and protrude out the top surface of the core layer 11, figure 6) protruding upwards from an upper surface (first surface) of the glass layer (11); an electronic component (12) disposed in the cavity (11x); and a first insulating layer (13a) filling at least a portion of the cavity (11x), the first insulating layer (13a) covering at least a portion of the electronic component (12), see figure 1. As to claim 13, Koyanagi discloses a printed circuit board (10) as shown in figures 1-10 comprising: a glass layer (11); and a through-via (11y) having a through-portion penetrating the glass layer (11), and a protrusion portion (26, figure 6) protruding upwards from an upper surface (a first surface) of the glass layer (11), wherein, in cross-section, a width of an uppermost side of the through-portion (11y) is substantially equal to a width of a lowermost side of the protrusion portion (26). As to claim 20, Koyanagi discloses a printed circuit board (10) as shown in figures 1-10, comprising: a glass layer (11) having through-holes (11x, 11y) penetrating through the glass layer (11) from an upper surface (first surface) to a lower surface (second surface) thereof, at least one of the through-holes (11y) being filled with a metal (the conductor 26) to form a through-via (11y), the through-via having a protrusion portion (26) extending past the upper surface of the glass layer to form a protrusion (26); and an electronic component (12) disposed in at least one of the through-holes (11x) not filled with the metal. As to claims 2, 14, Koyanagi discloses the through-portion (11y) and the protrusion portion (26) are integrally formed. As to claim 3, Koyanagi discloses the first insulating layer (13a) is disposed to extend onto a lower surface of the glass layer (11). As to claim 4, Koyanagi further comprising: a first wiring layer (21) disposed on the first insulating layer (13a); and a first via layer (20y) having at least a portion in contact with the through-via (11y), the first via layer (20y) penetrating at least a portion of the first insulating layer (13a) to connect the first wiring layer and the through-via to each other. As to claim 5, Koyanagi further comprising in figure 9: a second insulating layer (35) disposed on the first insulating layer (13a or 20); a second wiring layer (36) disposed on the second insulating layer (35); and a second via layer (35x) penetrating at least a portion of the second insulating layer (35) to connect the second wiring layer (36) and the first wiring layer (21) to each other or to connect the second wiring layers to each other. As to claim 6, Koyanagi discloses the electronic component (12) includes a metal pillar (no label, column 7, lines 1-2, hereafter called MP), and the metal pillar (MP) protrudes toward an upper side of the first insulating layer (62). As to claim 25, Koyanagi further comprising a first insulating layer (13a) filling at least a portion of the through-hole (11y) in which the electronic component (12) is disposed so as to encapsulate at least a portion of the electronic component (12). As to claim 26, Koyanagi discloses in figure 3d the first insulating layer (13a) has exposed surfaces substantially coplanar with one or both of the upper and lower surfaces of the glass layer (111b). Claim(s) 1-7,10-14, 20, and 22-26 is/are rejected under 35 U.S.C. 102a(1) as being anticipated by Jeong et al. (U.S. 2022/0007511). As to claim 1, Jeong discloses a printed circuit board (100B) as shown in figure 3 comprising: a glass layer (core layer 111b, para-0044) having a cavity (111ah, para-0033); a through-via (116) having a through-portion penetrating the glass layer (111b), and a protrusion portion (the conductor filled into the through hole 116 and protrude out the top surface of the core layer 111b, figure 3, hereafter called PP) protruding upwards from an upper surface (first surface) of the glass layer (111b); an electronic component (112b) disposed in the cavity (111ah); and a first insulating layer (113b) filling at least a portion of the cavity (111ah), the first insulating layer (113b) covering at least a portion of the electronic component (112b), see figure 3. As to claim 13, Jeong discloses a printed circuit board (100B) as shown in figure 3 comprising: a glass layer (111b); and a through-via (116) having a through-portion penetrating the glass layer (111b), and a protrusion portion (the conductor PP) protruding upwards from an upper surface (a first surface) of the glass layer (111b), wherein, in cross-section, a width of an uppermost side of the through-portion (116) is substantially equal to a width of a lowermost side of the protrusion portion (PP). As to claim 20, Jeong discloses a printed circuit board (100B) as shown in figure 3, comprising: a glass layer (111b) having through-holes (111ah, 116) penetrating through the glass layer (111b) from an upper surface (first surface) to a lower surface (second surface) thereof, at least one of the through-holes (116) being filled with a metal (the conductor PP) to form a through-via (116), the through-via having a protrusion portion (PP) extending past the upper surface of the glass layer to form a protrusion (PP); and an electronic component (112b) disposed in at least one of the through-holes (111ah) not filled with the metal. As to claims 2, 14, Jeong discloses the through-portion (116) and the protrusion portion (PP) are integrally formed. As to claim 3, Jeong discloses the first insulating layer (113b) is disposed to extend onto a lower surface of the glass layer (111b). As to claim 4, Jeong further comprising: a first wiring layer (114b) disposed on the first insulating layer (113b); and a first via layer (133) having at least a portion in contact with the through-via (116), the first via layer (133) penetrating at least a portion of the first insulating layer (113b) to connect the first wiring layer and the through-via to each other. As to claim 5, Jeong further comprising: a second insulating layer (131) disposed on the first insulating layer (113b); a second wiring layer (132) disposed on the second insulating layer (131); and a second via layer (133) penetrating at least a portion of the second insulating layer (131) to connect the second wiring layer (132) and the first wiring layer (114b) to each other or to connect the second wiring layers to each other. As to claim 6, Jeong discloses the electronic component (112b) includes a metal pillar (115b), and the metal pillar (115b) protrudes toward an upper side of the first insulating layer (113b). As claim 7, Jeong discloses an upper surface of the metal pillar (115b) is substantially coplanar with an upper surface of the through-portion of the through-via (116). As to claims 10-11, Jeong discloses an upper and lower surfaces of the first insulating layer (17 or 20) is substantially coplanar with the upper and lower surfaces of the glass layer (11). As to claim 12, Jeong further comprising: a first wiring layer (114b) having at least a portion disposed on the lower surface of the glass layer (111b), wherein at least a portion of the first wiring layer (114b) is in contact with the through-via (116). As claim 22, Jeong discloses the electronic component (112b) comprises a metal pillar (115b) extending from of a surface of the electronic component (112b) at least up to a plane coplanar with one or both of the upper surface and the lower surface of the glass layer (116). As to claim 23, Jeong discloses a semiconductor chip (300) (electrically) connected to the electronic component via the metal pillar. As to claim 24, Jeong discloses at the protrusion portion (the conductor) of the through-via (116) is electrically connected to the semiconductor chip (IC chip). As to claim 25, Jeong further comprising a first insulating layer (113b) filling at least a portion of the through-hole (111ah) in which the electronic component (112b) is disposed so as to encapsulate at least a portion of the electronic component (112b). As to claim 26, Jeong discloses the first insulating layer (113b) has exposed surfaces substantially coplanar with one or both of the upper and lower surfaces of the glass layer (111b). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 9, 15, and 21 is/are rejected under 35 U.S.C. 103 as being unpatentable over Jeong in view of Haba et al. (U.S. Patent 8,878,353). As claims 9, 15, and 21, Jeong discloses all of the limitations of claimed invention except for a lower surface of the through-via or through-portion is substantially coplanar with the lower surface of the glass layer. Haba teaches a structure for microelectronic package (10) as shown in figure 3 comprising a lower surface of the through-via or through-portion (24) is substantially coplanar with the lower surface of the encapsulation element/ layer (40A, 40B). It would have been obvious to one having ordinary skill in the art before the effective filling date to have a teaching of Haba employed in the PCB of Jeong or Koyanagi in order to provide excellent support for the protrusion formed within the core or encapsulation layer. Claim(s) 8 is/are rejected under 35 U.S.C. 103 as being unpatentable over Jeong in view of Koyanagi (‘453). As claim 8, Jeong discloses all of the limitations of claimed invention except for the metal pillar is disposed on each of an upper side and a lower side of the electronic component. Koyanagi teaches a wiring board (10) as shown in figure 1 comprising the metal pillar (no label, column 7, lines 1-2, hereafter called MP) is disposed on each of an upper side and a lower side of the electronic component (12). It would have been obvious to one having ordinary skill in the art before the effective filling date to have a teaching of Koyanagi employed in the PCB of Jeong in order to provide excellent internal electrical connections from the electronic component to external source or other component or device. Claim(s) 16-19 is/are rejected under 35 U.S.C. 103 as being unpatentable over Jeong in view of Mano et al. (‘033) cited in the record. As claim 16, Jeong discloses all of the limitations of claimed invention except for the through-via has a substantially upwardly tapered shape. Mano teaches a printed circuit board (10) as shown in figure 1 comprising the through-via (31) has a substantially upwardly tapered shape. It would have been obvious to one having ordinary skill in the art before the effective filling date to have a teaching of Mano employed in the PCB of Jeong in order to provide large contact zone, less resistance, and improve thermal and electrical dissipation under high loads. As to claim 17, Jeong discloses a cavity (11x, figure 2d) penetrating at least a portion of the glass layer (11), wherein the cavity (11x) has a tapered shape except for the through-via (11y) have a tapered shape in the substantially same direction. Mano teaches a printed circuit board (10) as shown in figure 1 comprising the through-via (31) has a substantially upwardly tapered shape in the same direction with the cavity. It would have been obvious to one having ordinary skill in the art before the effective filling date to have a teaching of Mano employed in the PCB of Jeong in order to provide large contact zone, less resistance, and improve thermal and electrical dissipation under high loads. As to claim 18, Jeong as modified by Mano discloses an electronic component (12) disposed in the cavity (11x). Regarding claim 19, Jeong as modified by Mano discloses the electronic component (112b) comprises a metal pillar (115b) extending from of a surface of the electronic component at least up to a plane coplanar with one or both of the upper surface and the lower surface of the glass layer. Response to Arguments Applicant’s arguments with respect to claim(s) 1-26 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUAN T DINH whose telephone number is (571)272-1929. The examiner can normally be reached 8am-5pm, M-F. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Timothy Dole can be reached at 571-272-2229. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUAN T DINH/Primary Examiner, Art Unit 2847
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Prosecution Timeline

Aug 07, 2024
Application Filed
Jun 24, 2026
Non-Final Rejection mailed — §102, §103
Sep 10, 2026
Response Filed
Oct 13, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

2-3
Expected OA Rounds
79%
Grant Probability
99%
With Interview (+22.0%)
2y 11m (~8m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 1202 resolved cases by this examiner. Grant probability derived from career allowance rate.

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