Prosecution Insights
Last updated: July 17, 2026
Application No. 18/797,127

METHODS FOR DETERMINING REMAINING USEFUL LIFE IN ELECTRONIC DEVICES AND SYSTEMS (RULAS)

Non-Final OA §102
Filed
Aug 07, 2024
Priority
Aug 08, 2023 — provisional 63/531,361 +1 more
Examiner
LE, THANG XUAN
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nokomis, Inc.
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
800 granted / 905 resolved
+20.4% vs TC avg
Moderate +9% lift
Without
With
+8.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
28 currently pending
Career history
930
Total Applications
across all art units

Statute-Specific Performance

§101
1.1%
-38.9% vs TC avg
§103
68.0%
+28.0% vs TC avg
§102
12.2%
-27.8% vs TC avg
§112
12.9%
-27.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 905 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement 1. The information disclosure statements (IDS) submitted on 2/23/2026 and is in compliance with the provisions of 37 CFR 1.97. According, the information disclosure statement is being considered by the Examiner. Claim Objection 2. Claims 1-3 are objected to because of the following informalities: Regarding claim 1, line 7, “an electrical device” should be changed to --- the electrical device ---. Regarding claim 2, line 1, “the harmonic extraction” should be changed to --- a harmonic extraction ---. Regarding claim 3, line 1, “the non-linear product analysis” should be changed to --- a non-linear product analysis ---. Examiner Notes 3. Examiner cites particular paragraphs, columns and line numbers in the references as applied to the claims below for the convenience of the applicant. Although the specified citations are representative of the teachings in the art and are applied to the specific limitations within the individual claim, other passages and figures may apply as well. It is respectfully requested that, in preparing responses, the applicant fully consider the references in entirety as potentially teaching all or part of the claimed invention, as well as the context of the passage as taught by the prior art or disclosed by the examiner. Claim Rejections - 35 USC § 102 4. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. 5. Claims 1-4 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Keller et al. (US. Pub. 2016/0112083; hereinafter “Keller”). Regarding claim 1, Keller discloses a method, comprising: analyzing an emission of electromagnetic energy in a radio frequency (RF) spectrum from an electrical device, the electrical device being powered (“A device comprising: … a radio frequency (RF) energy collection and processing apparatus integrated into said die and coupled to said antenna, said RF energy collection and processing apparatus comprising: an emission detection apparatus receiving emission(s) of RF energy emitted, external to said integrated circuit, from said at least one electronic component when said device is supplied with a power signal and/or an oscillating signal, at least one processor coupled to said emission detection apparatus, and algorithms causing said at least one processor to process signature(s) of said emission(s) and determine states(s) of said at least one electronic component attributable to said signature(s) of said emission(s)”, see claim 1), with at least one of a harmonic extraction, a non-linear product analysis, a time correlation, a signature energy distribution, a curve fit and a non-harmonic correlation (see [00112]); and determining, based on an analysis of the emission, at least one of a degree of degradation of an electrical device and a remaining useful life of the electrical device (“the RF energy collection and processing means 18 is configured and operable in this embodiment to provide at least one of tamper detection, anti-tamper monitoring, degradation monitoring, health monitoring”, see [0154]). Regarding claim 5, Keller discloses a method, comprising steps of: capturing, with a radio frequency (RF) receiver, a frequency bandwidth of an RF unintended emission data from an electrical device under power (“an emission detection apparatus receiving emission(s) of RF energy emitted, external to said integrated circuit, from the electrical device being energized with a signal”, see claim 17); calculating at least one emission signature parameter within the RF unintended emission data (“at least one processor coupled to said emission detection apparatus, and algorithms causing said at least one processor to process signature(s) of said emissions”, see claim 17); associating a condition of the electrical device with the at least one emission signature parameter (determine states/conditions of said at least one electronic component attributable to said signatures of said emissions, see claim 17 and abstract); and filling a matrix with calculated at least one emission signature parameter and an associated condition (see [0114-116]). Regarding claim 2, Keller discloses the method of claim 1, wherein analyzing with the harmonic extraction comprises utilizing at least one of determining at least one harmonic series of the emission and at least one envelope of harmonic series (see [00112, 126-128]). Regarding claim 3, Keller discloses the method of claim 1, wherein analyzing with the non-linear product analysis comprises determining whether a non-linear product is at least one of an amplitude modulated type, a frequency modulated type and a different modulation type (see [0127, 132]). Regarding claim 4, Keller discloses the method of claim 1, wherein determining the at least one of a degree of degradation of an electrical device and the remaining useful life of the electrical device comprises populating at least a two-dimensional matrix with values of at least one signature parameter of the emission (see [0114-116]). 6. Claims 1-3 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Brant et al. (US. Pub. 20180313877; hereinafter “Brant”). Regarding claim 1, Brant discloses a method, comprising: analyzing an emission of electromagnetic energy in a radio frequency (RF) spectrum from an electrical device, the electrical device being powered (“Every electrically powered device gives off electromagnetic emissions when operating or when being simply in a powered state where the electric energy from an energy source is connected to various circuits and/or components within such electrically powered device. When the device is simply powered on, the electromagnetic energy emanates from any one of wires, inter-component connections, and junctions within the electronic device. Exemplary embodiments operate by analyzing the unintended and/or intended emissions of the electronic device”, see at least in paragraph [0213]), with at least one of a harmonic extraction, a non-linear product analysis, a time correlation, a signature energy distribution, a curve fit and a non-harmonic correlation (see [0281-282]); and determining, based on an analysis of the emission, at least one of a degree of degradation of an electrical device and a remaining useful life of the electrical device (“analysis of unintended radiated emissions results in detection, classification of aging, and prognostics of RUL that each manifest from hardware changes, hours of operation, or out-of-specification device(s) from the original manufacturer or that were accidently or intentionally emplaced either by the original manufacturer or a third party.”, see [0209]). Regarding claim 2, Brant discloses the method of claim 1, wherein analyzing with the harmonic extraction comprises utilizing at least one of determining at least one harmonic series of the emission and at least one envelope of harmonic series (see [0022] and Figs. 11a-b). Regarding claim 3, Brant discloses the method of claim 1, wherein analyzing with the non-linear product analysis comprises determining whether a non-linear product is at least one of an amplitude modulated type, a frequency modulated type and a different modulation type (see Fig. 10 and [0217, 293-294, 389]). Allowable Subject Matter 7. Claims 5-19 are allowed over the prior arts of record. 8. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 5, the cited references, alone or in combination, do not disclose nor fairly suggest: “ …calculating at least one emission signature parameter within the RF unintended emission data; associating a condition of the electrical device with the at least one emission signature parameter; and filling a matrix with calculated at least one emission signature parameter and an associated condition” in combination with all other elements as claimed in claim 5. As to claim(s) 6-19, the claims are allowed as they further limit allowed claim 1. Prior Art of Record 9. The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Lee (KR-20120017988) discloses a system and method for analyzing a risk of a power device are provided to analyze the risk of the power device by sensing and analyzing an electromagnetic wave due to a partial discharge (see specification for more details). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to THANG LE whose telephone number is (571)272-9349. The examiner can normally be reached on Monday thru Friday 7:30AM-5:00PM EST. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Huy Phan can be reached on (571) 272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THANG X LE/Primary Examiner, Art Unit 2858 6/27/2026
Read full office action

Prosecution Timeline

Aug 07, 2024
Application Filed
Oct 31, 2024
Response after Non-Final Action
Jul 01, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
97%
With Interview (+8.6%)
2y 2m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 905 resolved cases by this examiner. Grant probability derived from career allowance rate.

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