Tech Center 2800 • Art Units: 2858 2867
This examiner grants 88% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18676787 | DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18220879 | DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18793258 | SELF-CALIBRATING CURRENT SENSOR PACKAGE | Non-Final OA | Infineon Technologies AG |
| 18435798 | APPARATUS, SYSTEM, AND METHOD FOR EFFICIENTLY TESTING DEVICE RADIATION FOR SPURIOUS EMISSIONS | Final Rejection | Meta Platforms Technologies, LLC |
| 17711878 | LASER-INDUCED THERMAL STRESSING OF INTEGRATED CIRCUITS | Final Rejection | Intel Corporation |
| 18611838 | USING IMPEDANCE ANALYSIS FOR FAULT DETECTION IN POWER DELIVERY SYSTEMS | Final Rejection | Cisco Technology, Inc. |
| 18499055 | SYSTEMS AND METHODS FOR CONTRAST IMAGING | Non-Final OA | GE Precision Healthcare LLC |
| 18750560 | SYSTEM AND METHOD FOR IDENTIFYING ANOMALOUS BEHAVIOR IN ELECTRICAL DEVICES PLUGGED INTO A SMART SOCKET | Non-Final OA | Honeywell International Inc. |
| 18787682 | CONFIGURABLE RADIO FREQUENCY SYSTEM | Non-Final OA | Rohde & Schwarz GmbH & Co. KG |
| 18589333 | MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A BEAMFORMING CHARACTERISTIC OF A DEVICE UNDER TEST | Final Rejection | Advantest Corporation |
| 18763657 | System for online monitoring of one or more electric cables in an electrical distribution grid | Non-Final OA | NEXANS |
| 18723372 | CURRENT SENSOR | Non-Final OA | MultiDimension Technology Co., Ltd. |
| 18721159 | Sensor | Non-Final OA | Croptide Ltd |
| 18707845 | SYSTEMS AND METHODS FOR MEASURING MAGNETIC FIELDS AND IDENTIFYING PATTERNS IN THE MEASUREMENTS | Non-Final OA | NearField Atomics Inc. |
| 18642782 | CORROSION MONITOR | Non-Final OA | MOPEKA PRODUCTS LLC |
| 18621861 | WAFER TEST CASSETTE, WAFER TEST SYSTEM AND WAFER TEST METHOD | Final Rejection | XINGR TECHNOLOGIES (ZHEJIANG) LIMITED |
| 18389379 | FORCED EARLY FAILURE FOR MEMORY DEVICE | Non-Final OA | SMART Modular Technologies, Inc. |
| 18574242 | MULTI-FUNCTIONAL, HIGH-DENSITY ELECTRICAL-GRID MONITORING | Non-Final OA | Connected Intelligence Systems Ltd. |
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