Prosecution Insights
Last updated: July 17, 2026
Application No. 18/798,303

MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION

Final Rejection §102
Filed
Aug 08, 2024
Priority
Sep 01, 2023 — provisional 63/536,366
Examiner
KO, TONY
Art Unit
2878
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Applied Materials Inc.
OA Round
2 (Final)
88%
Grant Probability
Favorable
3-4
OA Rounds
5m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
780 granted / 888 resolved
+19.8% vs TC avg
Minimal +2% lift
Without
With
+2.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
20 currently pending
Career history
903
Total Applications
across all art units

Statute-Specific Performance

§101
1.1%
-38.9% vs TC avg
§103
43.0%
+3.0% vs TC avg
§102
43.8%
+3.8% vs TC avg
§112
9.4%
-30.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 888 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 7, 11 and 12 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Zhao et al (US 20180073993). Regarding claim 7, Zhao et al teach (Figs. 1-8) A method of pre-bonding inspection, comprising: illuminating a surface ([0043] – wafer) of a sample by a first light source (108a) at a first oblique angle to the surface of the sample and by a second light source (108b) at a second oblique angle to the surface of the sample, the surface of the sample having a two dimensional (2D) periodic pattern (claim 19, patterned wafer) and defects; acquiring a first optical image, of the surface of the sample, generated by the first light source and a second optical image, of the surface of the sample, generated by the second light source; and combining ([0044]) the first optical image and the second optical image, wherein a combined optical image generated from the first optical image and the second optical image specifies locations of the point defects ([0044]) on the surface of the sample. Regarding claim 11, Zhao et al teach ([0046]) the first light source and the second light source each comprise a uni-directional or nearly uni-directional laser or light emitting diode. Regarding claim 12, Zhao et al teach ([0033]) the acquiring the first optical image and the second optical image comprises a time delay integration (TDI) scanning of the surface of the sample. Allowable Subject Matter Claims 1-6 and 13-21 are allowed. Claims 8-10 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 8, prior art of record does not teach the sample comprises metallic bond pads in a two dimensional (2D) periodic pattern formed on the surface of the sample. Regarding claim 10, prior art of record does not teach the first oblique angle and the second oblique angle have azimuthal directions that are orthogonal to each other in a plane parallel to the surface of the sample. Response to Arguments Applicant’s arguments with respect to claim(s) 7 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY KO whose telephone number is (571)272-1926. The examiner can normally be reached Monday-Friday 9-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Georgia Epps can be reached at 571-272-2328. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY KO/Primary Examiner, Art Unit 2878 TK
Read full office action

Prosecution Timeline

Aug 08, 2024
Application Filed
Feb 12, 2026
Non-Final Rejection mailed — §102
Apr 14, 2026
Interview Requested
Apr 22, 2026
Examiner Interview Summary
Apr 22, 2026
Applicant Interview (Telephonic)
Apr 28, 2026
Response Filed
May 29, 2026
Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12680868
COMPARATOR, LIGHT DETECTION ELEMENT, AND ELECTRONIC DEVICE
2y 0m to grant Granted Jul 14, 2026
Patent 12677487
IMAGING ELEMENT AND SEMICONDUCTOR ELEMENT
2y 2m to grant Granted Jul 07, 2026
Patent 12674704
SIGNAL GENERATION CIRCUIT AND LIGHT DETECTING UNIT
1y 11m to grant Granted Jul 07, 2026
Patent 12663297
OPTICAL SENSING ASSEMBLY AND ENCODER
2y 2m to grant Granted Jun 23, 2026
Patent 12659438
OPTICAL LOCALIZATION SYSTEM
2y 2m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
88%
Grant Probability
90%
With Interview (+2.4%)
2y 5m (~5m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 888 resolved cases by this examiner. Grant probability derived from career allowance rate.

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