Prosecution Insights
Last updated: August 17, 2026
Application No. 18/801,164

SYSTEMS AND METHODS FOR ENHANCED DEPTH DETERMINATION USING PROJECTION SPOTS

Non-Final OA §102
Filed
Aug 12, 2024
Priority
Nov 22, 2019 — provisional 62/939,454 +1 more
Examiner
YENTRAPATI, AVINASH
Art Unit
Tech Center
Assignee
Magic Leap Inc.
OA Round
1 (Non-Final)
75%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
70%
With Interview

Examiner Intelligence

Grants 75% — above average
75%
Career Allowance Rate
515 granted / 688 resolved
+14.9% vs TC avg
Minimal -5% lift
Without
With
+-4.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 11m
Avg Prosecution
31 currently pending
Career history
706
Total Applications
across all art units

Statute-Specific Performance

§101
10.6%
-29.4% vs TC avg
§103
54.4%
+14.4% vs TC avg
§102
22.0%
-18.0% vs TC avg
§112
11.6%
-28.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 688 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 19-23, 32, 34-37 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by D1.1 With regard to claim 19, D1 teach obtaining, via an image sensor, images of a calibration board, the calibration board being positioned at a plurality of distances relative to a projector outputting a plurality of projection spots, the projection spots including a first projection spot (see abstract, fig. 1, col 6 lines 10-30: calibration object, projectors for projecting spots; see col. 11 lines 20-25: imaging at a plurality of distances); identifying respective three-dimensional positions associated with each depiction of the first projection spot in the obtained images ((see abstract, col 11 lines 60-65: location information of the projection spots); determining geometric information associated with a cone of light projected by the projector which forms the first projection spot in each of the plurality of images (see col 10 lines 45-60: geometric relations of the spots); and generating a projection spot map which indicates, at least, information usable to determine a real-world location of the first projection spot as depicted in an image obtained by the image sensor (see abstract, col 11, lines 60-65, col 5 lines 40-50, col 8 lines 40-50: projection spot reference map, 3D map of the object determined from the projection spot reference map and the projection pattern on the test object). With regard to claim 20, D1 teach method of claim 19, wherein the projection spot map indicates information usable to determine real-world locations of the plurality of projection spots as depicted in images obtained by the image sensor (see abstract, col 11, lines 60-65, col 5 lines 40-50, col 8 lines 40-50: projection spot reference map, 3D map of the object determined from the projection spot reference map and the projection pattern on the test object). With regard to claim 21, D1 teach method of claim 19, wherein identifying a three-dimensional position associated with a depiction of the first projection spot comprises: identifying a two-dimensional position associated with the first projection spot; and based on camera parameters associated with the image sensor, identifying the three- dimensional position (see col 6 lines 53-col 7 lines 6, col 10 lines 35-60: projection spot determined in the image and calculates 3D or depth position of the spots projected on an object, col 10 lines 35-60: depth information implicitly based on camera parameters). With regard to claim 22, D1 teach method of claim 19, wherein geometric information for the cone of light includes a vector centered at an origin of the projector, the vector defining propagation of the cone of light (see fig. 1, 3: vectors originating from the projector onto the object). With regard to claim 23, D1 teach method of claim 19, wherein determining geometric information comprises: fitting a line through a center of the three-dimensional positions associated with each depiction of the first projection spot, the line defining an axis of the cone of light (see fig. 1, 3, col 13 lines 10-30). With regard to claim 32, see discussion of claim 19. With regard to claim 34, see discussion of claim 20. With regard to claim 35, see discussion of claim 21. With regard to claim 36, see discussion of claim 22. With regard to claim 37, see discussion of claim 23. Claims 24-31, 33 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to AVINASH YENTRAPATI whose telephone number is (571)270-7982. The examiner can normally be reached on 8AM-5PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sumati Lefkowitz can be reached on (571) 272-3638. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /AVINASH YENTRAPATI/Primary Examiner, Art Unit 2672 1 US Patent No. 8,786,682.
Read full office action

Prosecution Timeline

Aug 12, 2024
Application Filed
Jul 31, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
75%
Grant Probability
70%
With Interview (-4.7%)
2y 11m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 688 resolved cases by this examiner. Grant probability derived from career allowance rate.

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