Prosecution Insights
Last updated: April 19, 2026
Application No. 18/811,059

INTERCONNECTIONS FOR 3D MEMORY

Non-Final OA §102
Filed
Aug 21, 2024
Examiner
LAPPAS, JASON
Art Unit
2827
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology, Inc.
OA Round
1 (Non-Final)
91%
Grant Probability
Favorable
1-2
OA Rounds
2y 0m
To Grant
99%
With Interview

Examiner Intelligence

Grants 91% — above average
91%
Career Allow Rate
375 granted / 413 resolved
+22.8% vs TC avg
Moderate +8% lift
Without
With
+8.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
16 currently pending
Career history
429
Total Applications
across all art units

Statute-Specific Performance

§101
1.0%
-39.0% vs TC avg
§103
28.9%
-11.1% vs TC avg
§102
61.8%
+21.8% vs TC avg
§112
3.6%
-36.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 413 resolved cases

Office Action

§102
Notice of Pre-AIA or AIA Status The present application is being examined under the pre-AIA first to invent provisions. DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless - (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. Claims 21-40 are rejected under 35 U.S.C. 102 (a)(1) as being anticipated by Hosomura (Patent Application Publication 2008/0198667). Claim 21. A method, comprising: providing a first voltage level to a first access line associated with a memory array (voltage applied to CG1, Hosomura Fig. 8); providing a second voltage level to a second access line associated with the memory array (providing a second voltage level to CG2); and controlling the first access line and the second access line to have a substantially equal voltage (CG1 and CG2 to an equalization potential through T1 and T2, equalizing after a write Hosomura Abstract). Claim 22. The method of claim 21, wherein the substantially equal voltage is different than a ground reference potential (when programming a logic high to the WLs the substantially equal voltage is different than a ground reference potential and Vdd [0111] is different than ground). Claim 23. The method of claim 21, comprising: after controlling the first access line and the second access line to have the substantially equal voltage (CG1 and CG2 to an equalization potential through T1 and T2), discharging the first access line and the second access line to a ground reference potential (Through discharge transistors HT1 and HT2 Hosomura, Fig. 8. Ground potential coupled to the discharge transistors taught in, Hosomura [0106] and [0109]). Claim 24. The method of claim 21, comprising after controlling the first access line and the second access line to have the substantially equal voltage (CG1 and CG2 to an equalization potential through T1 and T2), controlling the first access line or the second access line, or both, to have a third voltage that is different from the substantially equal voltage (programming to a logic low is different from the substantially equal voltage when programming a logic high). Claim 25. The method of claim 21, comprising after controlling the first access line and the second access line to have the substantially equal voltage (CG1 and CG2 to an equalization potential through T1 and T2), controlling the first access line or the second access line, or both, to have a third voltage that is different from a ground reference potential (programming to a logic low is different from a ground reference potential). Claim 26. The method of claim 21, wherein the second voltage level is higher than the first voltage level (choosing the logic high as the second voltage and logic low as the first voltage, the second voltage is higher than the first voltage level). Claim 27. An apparatus, comprising: an array of memory cells (cells in array 2 Fig 1); and control circuitry coupled to the array (comprising WL Driver 3 Fig 1) and configured to (configured to is functional language): perform a read operation comprising: providing a first voltage to a selected access line of the array (providing a ground voltage through discharge transistor HT1); providing a second voltage to a non-selected access line of the array (voltage applied to CG2, Hosomura Fig. 8 when programming a logic low), a magnitude of the second voltage being greater than a magnitude of the first voltage (magnitude for a logic high is greater than ground); and subsequently to performing the read operation, provide a third voltage to the selected access line, the magnitude of the first voltage and a magnitude of the third voltage being different from each other (programming to a logic low is different from the substantially equal voltage when programming a logic high), and the third voltage being different than a ground voltage (programming to a logic low is different from a ground reference potential). Claim 28. The apparatus of claim 27, wherein the third voltage is greater than the ground voltage (Logic low voltage is greater than ground). Claim 29. The apparatus of claim 27, wherein the array is a three dimensional array (Memory cell array 2 represents a three dimensional array, Hosomura Fig 2), and wherein the selected access line and the unselected access line are coupled to a same string of the array (access of array in Fig 2 taught in Fig 8 ). Claim 30. The apparatus of claim 29, wherein the array comprises a plurality of access lines formed as respective stair steps of a stair step structure (stair steps structure taught in Hosomura Fig 5). Claim 31. The apparatus of claim 29, wherein the third voltage is an equalization voltage to which the selected access line and the unselected access line are commonly driven as part of an equalization operation (logic low is equalized on CG1 and CG2 to an equalization potential through T1 and T2). Claim 32. The apparatus of claim 31, wherein the control circuitry is configured to (configured to is functional language), subsequent to the equalization operation, drive the unselected access line and the selected access line to a fourth voltage via a number of string drivers (driving the access lines comprising CG1 and CG2 to a fourth voltage vide string drivers Tn or HTn). Claim 33. The apparatus of claim 32, wherein a magnitude of the fourth voltage is less than the magnitude of the equalization voltage (when discharging to ground the magnitude of the fourth voltage is less than the magnitude of the logic low equalization voltage). Claim 34. The apparatus of claim 33, wherein the fourth voltage is the ground voltage (when discharging through discharge transistor HTn Fig 8, the magnitude of the fourth voltage is ground). Claim 35. An apparatus, comprising: a host interface configured to (configured to is functional language) couple to a host (coupled through CG driver 4, Hosomura Fig 1); a controller coupled to the host interface (WL Driver 3 Fig 1); and a memory device coupled to the controller and comprising a three dimensional array of memory cells (Memory cell array 2 represents a three dimensional array, Hosomura Fig 2); and wherein the controller is configured to (configured to is functional language), subsequent to performing a read operation in which a selected access line is biased at a first voltage and an unselected access line is biased at a second voltage (Biasing to a logic low through CGn), perform an equalization operation in which the selected access line and the unselected access line are brought to a same voltage that is between the first voltage and the second voltage (CG1 and CG2 to an equalization potential through T1 and T2, equalizing after a write Hosomura Abstract). Claim 36. The apparatus of claim 35, wherein the controller is configured to (configured to is functional language), subsequent to the equalization operation, apply a third voltage to the selected access line and the unselected access line (applying a logic high voltage through CG1 and CG2). Claim 37. The apparatus of claim 36, wherein the third voltage is different than the same voltage (logic high voltage is different than a logic low or ground voltage). Claim 38. The apparatus of claim 35, wherein the apparatus is a solid state drive (NAND flash for Fig 8 taught in [0011]. NAND flash is used in solid state drives.). Claim 39. The apparatus of claim 35, wherein the three dimensional array comprises a stair step structure with the steps corresponding to different respective access lines (stair steps structure taught in Hosomura Fig 5). Claim 40 The apparatus of claim 35, wherein the controller is configured to (configured to is functional language), subsequent to the equalization operation, discharge to ground a number of global control lines to which the selected access line and the unselected access line are coupled (transistors HTn Fig 8 discharge to ground a number of global control lines comprising gates CGn to which the selected access line and the unselected access line are coupled). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Jason Lappas whose telephone number is (571) 270-1272. The examiner can normally be reached on M-F 7:30AM-5:00PM EST. If attempts to reach the examiner by telephone are unsuccessful, the examiner's supervisor, Amir Zarabian can be reached on (571) 272-1852. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JASON LAPPAS/ Primary Examiner, Art Unit 2827
Read full office action

Prosecution Timeline

Aug 21, 2024
Application Filed
Mar 17, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12602159
APPARATUS HAVING SEGMENTED DATA LINES AND METHODS OF THEIR OPERATION
2y 5m to grant Granted Apr 14, 2026
Patent 12597475
MEMORY SYSTEM, CONTROL METHOD THEREOF, AND PROGRAM
2y 5m to grant Granted Apr 07, 2026
Patent 12597471
NON-VOLATILE MEMORY AND CORRESPONDING MANUFACTURING METHOD
2y 5m to grant Granted Apr 07, 2026
Patent 12597472
SELECTIVELY ERASING ONE OF MULTIPLE ERASE BLOCKS COUPLED TO A SAME STRING USING GATE INDUCED DRAIN LEAKAGE
2y 5m to grant Granted Apr 07, 2026
Patent 12597479
SEMICONDUCTOR DEVICE
2y 5m to grant Granted Apr 07, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
91%
Grant Probability
99%
With Interview (+8.3%)
2y 0m
Median Time to Grant
Low
PTA Risk
Based on 413 resolved cases by this examiner. Grant probability derived from career allow rate.

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