Prosecution Insights
Last updated: October 04, 2026
Application No. 18/822,268

SEMICONDUCTOR DEVICE

Non-Final OA §103
Filed
Sep 01, 2024
Priority
Apr 30, 2024 — CN 202410543708.5
Examiner
QUINTO, KEVIN V
Art Unit
Tech Center
Assignee
Fujian Jinhua Integrated Circuit Co., Ltd.
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
5m
Est. Remaining
87%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
732 granted / 861 resolved
+25.0% vs TC avg
Minimal +2% lift
Without
With
+1.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
21 currently pending
Career history
886
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
49.3%
+9.3% vs TC avg
§102
31.6%
-8.4% vs TC avg
§112
15.4%
-24.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 861 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 1 is rejected under 35 U.S.C. 103 as being unpatentable over Coursey (United States Patent Application Publication No. US 2003/0215998 A1, hereinafter “Coursey”) in view of Govindarajan (United States Patent Application Publication No. US 2006/0151822 A1, hereinafter “Govindarajan”). In reference to claim 1, Coursey discloses a similar device. Fig. 9-28 of Coursey disclose a semiconductor device which comprises a gate structure (20, 22, 24) disposed on a substrate (12). A plurality of insulating spacers (26) is disposed on the substrate (12) and located at opposite sides of the gate structure (20, 22, 24). A plurality of first pads (28) is disposed on the plurality of insulating spacers (26). An insulating layer (116, 118) overlies the plurality of insulating spacers (26) and the gate structure (20, 22, 24). A portion of the insulating layer (116, 118) overlying the gate structure (20, 22, 24) has a recess. A capacitor dielectric layer (222) is disposed in the recess wherein a bottommost surface of the capacitor dielectric layer (222) is lower than a topmost surface of the first pads (28). Coursey does not disclose that the capacitor dielectric layer (222) is made from a high dielectric constant dielectric material. However Govindarajan discloses that the use of high dielectric constant dielectric material as a capacitor dielectric material leads to a capacitor with a high capacitance (p. 3, paragraph 35) which is desirable in the art (p. 1, paragraphs 5-6). In view of Govindarajan, it would therefore be obvious to implement a high dielectric constant dielectric material for the capacitor dielectric layer (222) in the Coursey device. Allowable Subject Matter Claims 9-20 are allowed. Claims 2-8 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: in the examiner’s opinion, it would not be obvious to implement a semiconductor device with a substrate having first and second regions such that there is gate structure disposed in the first region having a plurality of insulating spacers on opposite sides of the gate structure in combination with the specific first pads, pad spacers, and first spacer structure described by the applicant in claim 9. In the examiner’s opinion, it would also not be obvious to implement a semiconductor device with a gate structure disposed on a substrate having a plurality of insulating spacers on opposite sides of it with a plurality of first pads on the insulating spacers such that there is an insulating layer over the plurality of insulating spacers and the gate structure with a portion of the insulating layer overlying the gate structure having a recess with a high dielectric constant dielectric layer disposed in it with a bottommost surface of the high dielectric constant dielectric layer being lower than a topmost surface of the first pads in combination with the specific pad spacers, first spacer structure, relative heights of the first pad and high dielectric constant dielectric layer, and second pads described by the applicant in claims 2 and 6-8. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to KEVIN QUINTO whose telephone number is (571)272-1920. The examiner can normally be reached Monday-Friday, 9-5:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached at 571-270-3042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /KEVIN QUINTO/Examiner, Art Unit 2893 /Britt Hanley/Supervisory Patent Examiner, Art Unit 2893
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Prosecution Timeline

Sep 01, 2024
Application Filed
Sep 15, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12750995
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
3y 5m to grant Granted Sep 29, 2026
Patent 12751035
EPITAXIAL STRUCTURE OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR DEVICE
3y 0m to grant Granted Sep 29, 2026
Patent 12745384
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
3y 3m to grant Granted Sep 22, 2026
Patent 12727152
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
3y 10m to grant Granted Sep 01, 2026
Patent 12727457
Shared Contact Structure and Methods for Forming the Same
3y 10m to grant Granted Sep 01, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
87%
With Interview (+1.7%)
2y 6m (~5m remaining)
Median Time to Grant
Low
PTA Risk
Based on 861 resolved cases by this examiner. Grant probability derived from career allowance rate.

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