Last updated: July 17, 2026

Application No. 18/838,274

BATTERY STATE ESTIMATION APPARATUS, BATTERY STATE ESTIMATION METHOD, AND STORAGE MEDIUM

Non-Final OA

Filed

Aug 14, 2024

Priority

Feb 21, 2022 — nonprovisional of PCTJP2022006867

Examiner

ASTACIO-OQUENDO, GIOVANNI

Art Unit

2858

Tech Center

2800 — Semiconductors & Electrical Systems

Assignee

NEC Corporation

OA Round

1 (Non-Final)

Interview Optional

— +10.4% interview lift. Interview lift (+10.4%) is below the 15.0% threshold. A written response is recommended.

Based on 727 resolved cases, 2023–2026

Examiner Intelligence

ASTACIO-OQUENDO, GIOVANNI View full profile →

Grants 88% — above average

Career Allowance Rate

643 granted / 727 resolved

+20.4% vs TC avg

Moderate +10% lift

Without

With

+10.4%

Interview Lift

resolved cases with interview

Typical timeline

2y 5m

Avg Prosecution

21 currently pending

Career history

742

Total Applications

across all art units

Statute-Specific Performance

§101

14.1%

-25.9% vs TC avg

§103

46.7%

+6.7% vs TC avg

§102

4.6%

-35.4% vs TC avg

§112

30.1%

-9.9% vs TC avg

Black line = Tech Center average estimate • Based on career data from 727 resolved cases

Prosecution Timeline

Aug 14, 2024

Application Filed

May 06, 2026

Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

18/203,024

Patent 12681081

JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES

3y 1m to grant Granted Jul 14, 2026

18/736,022

Patent 12681109

INSPECTION APPARATUS AND INSPECTION METHOD

2y 1m to grant Granted Jul 14, 2026

18/415,195

Patent 12674838

METHOD OF DETECTING OPENING OF SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE AND SEMICONDUCTOR DEVICE

2y 5m to grant Granted Jul 07, 2026

18/510,644

Patent 12663463

SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

2y 7m to grant Granted Jun 23, 2026

18/743,626

Patent 12663459

TEST SIGNAL CIRCUIT FOR TESTING A RADIO FREQUENCY RECEIVER CIRCUIT, A SEMICONDUCTOR CHIP AND A SYSTEM COMPRISING THE TEST SIGNAL CIRCUIT

2y 0m to grant Granted Jun 23, 2026

Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.

Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2

Expected OA Rounds

88%

Grant Probability

99%

With Interview (+10.4%)

2y 5m (~6m remaining)

Median Time to Grant

Low

PTA Risk

Based on 727 resolved cases by this examiner. Grant probability derived from career allowance rate.