Prosecution Insights
Last updated: October 27, 2026
Application No. 18/866,738

CONFIGURABLE-PERFORMANCE RESISTIVE MEMORY AND ASSOCIATED METHODS

Non-Final OA §102§112
Filed
Nov 18, 2024
Priority
May 16, 2022 — FR 2204617 +1 more
Examiner
ALROBAIE, KHAMDAN N
Art Unit
2824
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
OA Round
2 (Non-Final)
86%
Grant Probability
Favorable
2-3
OA Rounds
3m
Est. Remaining
89%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
577 granted / 667 resolved
+18.5% vs TC avg
Minimal +2% lift
Without
With
+2.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
23 currently pending
Career history
697
Total Applications
across all art units

Statute-Specific Performance

§101
4.2%
-35.8% vs TC avg
§103
38.1%
-1.9% vs TC avg
§102
28.1%
-11.9% vs TC avg
§112
18.5%
-21.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 667 resolved cases

Office Action

§102 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Arguments Applicant’s arguments, see page 7 lines 1-13, filed on 07/27/2026, with respect to the rejection(s) of claim(s) 1-10 under U.S.C. 102 have been fully considered and are persuasive. Therefore, the rejection has been withdrawn. However, upon further consideration, a new ground(s) of rejection is made. Claim Objections Claim 9 is objected to because of the following informalities: The claim has the brackets for the range in the wrong direction. Appropriate correction is required. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 2, 4, 5, 10-14 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. The claims recite “each first layer” which implies there are multiple layers in the resistive memory. Claim 1 recites the memory comprising “at least one first layer.” For this limitation, the memory can have one condition where the memory have only one first layer. In the case, the memory has one first layer, the dependent claims are indefinite because the first claim did not define multiple first layers as implied by the dependent claims. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1-5, 8 and 10 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Adusumilli et al. (US 2023/0077912 A1). Regarding claim 1, Adusumilli teaches a resistive memory comprising: at least one first layer, comprising a titanium-based material, said titanium-based material being conductive (Fig. 1, layer 120 which can be made of a plurality of layers, where one layer can comprise titanium-based material such as the one in Fig. 5); at least one second layer, extending over said at least one first layer, comprising a first phase change material, said first phase change material being able to be doped with titanium (Phase change material 130 extend over the first layer 120 when the memory is upside down. The limitation “first phase change material being able to be doped with titanium” does not require the phase change material to be doped by titanium but only requires the phase change material to be capable of being doped with titanium. In this case, the phase change material 120 is capable of being able to be doped with titanium); a first electrode and a second electrode, the first and second layers separating the first electrode from the second electrode by electrically connecting in series the first electrode to the second electrode, the first electrode being in contact with said at least one first layer or, when there are several first layers, in contact with one of the first layers (Fig. 1, Top Electrode 110 is the first electrode which is in direct contact with layer 120. The second electrode is bottom electrode 150). Regarding claim 2, Adusumilli further teaches the resistive memory according to claim 1, wherein the titanium based material of each first layer comprises a first element, forming a carrier element, which is neutral with respect to switching properties of the first phase change material (Fig. 5). Regarding claim 3, Adusumilli further teaches the resistive memory according to claim 1, wherein the titanium based material is to be selected from TiTe, TiGe and TiSb (Fig. 5, TiTe). Regarding claim 4, Adusumilli further teaches the resistive memory according to claim 1, wherein a thickness of each second layer is greater than a thickness of each first layer (Fig. 1, thickness for second layer 130 is greater than a thickness of each layer in the first layer 120). Regarding claim 5, Adusumilli further teaches the resistive memory according to claim 1, wherein the titanium-based material of each first layer comprises impurities capable of influencing electronic properties of the first phase change material (Fig. 5). Regarding claim 8, Adusumilli further teaches the resistive memory according to claim 1, wherein the first phase change material is a ternary alloy comprising germanium, antimony, tellurium, gallium or selenium (¶0033). Regarding claim 10, Adusumilli further teaches the resistive memory according to claim 1, wherein at least one part of the titanium-based material of each first layer over its entire thickness and at least one part of the first phase change material of each second layer are fused together to form, from the first phase change material and the titanium-based material, a second phase change material comprising titanium (Fig. 5, the layer 530 is fabricated on the first phase change layer 130. During the fabrication and the programming of the memory cell, few Titanium atoms from the layer 530a can mix with the phase change material 130). Claim(s) 1 and 6-9 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Perniola (US 2014/0355338 A1). Regarding claim 1, Perniola teaches a resistive memory comprising: at least one first layer, comprising a titanium-based material, said titanium-based material being conductive (Fig. 1, layer 25, which can comprise titanium-based material ¶0121); at least one second layer, extending over said at least one first layer, comprising a first phase change material, said first phase change material being able to be doped with titanium (Phase change layer 22. The limitation “first phase change material being able to be doped with titanium” does not require the phase change material to be doped by titanium but only requires the phase change material to be capable of being doped with titanium. In this case, the phase change material 22 is capable of being able to be doped with titanium); a first electrode and a second electrode, the first and second layers separating the first electrode from the second electrode by electrically connecting in series the first electrode to the second electrode, the first electrode being in contact with said at least one first layer or, when there are several first layers, in contact with one of the first layers (Fig. 1, Top Electrode 40 is the first electrode which is in direct contact first layer 22 and the second electrode is bottom electrode 30). Regarding claim 6, Perniola further teaches the resistive memory according to claim 1, wherein the titanium based material has a resistivity of less than 1000 μQ• cm (Fig. 3). Regarding claim 7, Perniola further teaches the resistive memory according to claim 1, wherein the titanium-based material comprises a titanium concentration such that heat treatment of said titanium based material at a temperature less than or equal to 400°C modifies its resistivity by less than 70% (¶0054). Regarding claim 8, Perniola further teaches the resistive memory according to claim 1, wherein the first phase change material is a ternary alloy comprising germanium, antimony, tellurium, gallium or selenium (¶0013). Regarding claim 9, Perniola further teaches the resistive memory according to claim 1, wherein each of the first and second layers has a melting temperature in the range [400°C; 1000°C] (¶0025). Allowable Subject Matter Claims 11-14 would be allowable if rewritten to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action and to include all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: After further search and consideration it is determined that the prior art of record neither anticipated nor renders obvious the claimed subject matter of the instant application as a whole either taken alone or in combination, in particular, prior art of record does not teach, the following limitation(s) in combination with the remaining claimed limitation: the method comprising circulating an electric current, forming an initialisation current, in each of the at least one first and second layers, the initialisation current being adapted to generate a temperature gradient within said first and second layers involving melting of at least one part of the titanium-based material of each first layer over its entire thickness and at least part of the first phase change material of each second layer, said melting resulting in forming, from the first phase change material and the titanium-based material, a second phase change material comprising titanium. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to KHAMDAN N ALROBAIE whose telephone number is (571)270-7099. The examiner can normally be reached Monday to Thursday (8AM till 6PM). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Richard Elms can be reached at (571) 272-1869. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Khamdan N. Alrobaie/Primary Examiner, Art Unit 2824
Read full office action

Prosecution Timeline

Nov 18, 2024
Application Filed
Apr 29, 2026
Non-Final Rejection mailed — §102, §112
Jul 27, 2026
Response Filed
Oct 01, 2026
Non-Final Rejection mailed — §102, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12765275
MEMORY DEVICE, MEMORY ARRAY, AND N-BIT MEMORY UNIT
2y 3m to grant Granted Oct 13, 2026
Patent 12763124
MEMORY ARRAY WITH COMPENSATED WORD LINE ACCESS DELAY
2y 2m to grant Granted Oct 13, 2026
Patent 12755763
SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM HAVING THE SAME
2y 5m to grant Granted Oct 06, 2026
Patent 12755772
Methods and Circuits for Power Management of a Memory Module
2y 4m to grant Granted Oct 06, 2026
Patent 12749529
STRUCTURE FOR MULTIPLE SENSE AMPLIFIERS OF MEMORY DEVICE
2y 9m to grant Granted Sep 29, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

2-3
Expected OA Rounds
86%
Grant Probability
89%
With Interview (+2.4%)
2y 2m (~3m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 667 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month