Prosecution Insights
Last updated: August 17, 2026
Application No. 18/882,268

PULSE SIGNAL GENERATOR TO REDUCE POWER CONSUMPTION OF SRAM AND SRAM HAVING THE SAME

Non-Final OA §103
Filed
Sep 11, 2024
Priority
Dec 12, 2023 — RE 10-2023-012808
Examiner
BRASWELL, DONALD H.B.
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Uif (university Industry Foundation), Yonsei University
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
9m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
361 granted / 439 resolved
+14.2% vs TC avg
Moderate +12% lift
Without
With
+11.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
24 currently pending
Career history
465
Total Applications
across all art units

Statute-Specific Performance

§101
4.9%
-35.1% vs TC avg
§103
49.3%
+9.3% vs TC avg
§102
23.0%
-17.0% vs TC avg
§112
17.0%
-23.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 439 resolved cases

Office Action

§103
DETAILED ACTION This action is responsive to the response filed 11 Sep 2024 and the Information Disclosure Statement filed 3 Jan 2025. Claims 1-20 are pending. Claims 1 and 14 are independent. Claims 15-20 have been restricted and withdrawn. Notice of AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restriction In the letter dated 8 Jun 2026, the applicant elected claims 1-14 without traverse for examination. Applicant further elected species 2 of figures 7, 8, 10, 12 and 14. Claims 15-20 have been withdrawn pending further action. Notice of Foreign Priority Claim Acknowledgment is made of applicant’s claim for foreign priority. It is noted, however, that applicant has not filed a certified copy of the application KR10-2023-012808 as required by 37 CFR 1.55. Applicant was notified 12 May 2025 by the USPTO that the priority document could not be retrieved under the exchange program. Information Disclosure Statement The information disclosure statement (IDS) submitted on 3 Jan 2025 is acknowledged. The submission is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Allowable Subject Matter Claims 2 – 13 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim Rejections – 35 USC § 103 The following is a quotation of 35 U.S.C. 103, which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Claims 1 and 14 are rejected under 35 U.S.C. 103 as being unpatentable over Rajendra, et al, U.S. Patent Application Publication 2020/0076412 (“Rajendra”) in view of Noguchi, et al, U.S. Patent Application Publication 2022/0215880 (“Noguchi”). Regarding claim 1, Rajendra teaches: A pulse signal generator comprising: a delay unit that receives a clock signal, delays the clock signal, and outputs a delay clock signal while adjusting a delay time of the delay clock signal (Rajendra, fig 3, 4, 5, “[0060] Fig 3 shows a block diagram… In general, the duty cycle correction circuit 300 is configured to correct for duty cycle distortion in a pair of input sample clock signals, including a first input sample clock signal SCLKINl and a second input sample clock signal SCLKIN2. [0062] Also, the output sample clock signals SCLKOUT1, SCLKOUT2 are referred to as output signals in that they are the signals that the duty cycle correction circuit 300 outputs in response to performing duty cycle correction.”; a pulse generating circuit 300 to alter an input clock cycle and output two altered clock signals based on a delay controller). a pulse generation circuit that receives the clock signal and the delay clock signal whose delay time is adjusted…, and logically combines them to generate a pulse signal … (Rajendra, fig 3, 4, 5, “[0066] In the example configuration shown in FIG. 3, the AND/OR logic circuit 302 is configured to generate the first output sample clock signal SCLKOUTl according to OR logic on a first pair of sample clock signals, and the second output clock signal SCLKOUT2 according to AND logic on a second pair of sample clock signals. … The second pair of sample clock signals includes the second input sample clock signal SCLKIN2 and a delayed second input sample clock signal SCLKIN2d.”; a pulse generating circuit 300 that uses a logic AND gate with the input clock SCLKIN2 and the delayed clock SCKLIN2d to produce a shortened pulse). Rajendra does not explicitly teach depending on Temperature; and … depending on Temperature… having a pulse width that varies depending on Temperature.. Noguchi teaches depending on Temperature; and … depending on Temperature… having a pulse width that varies depending on Temperature. (Noguchi, fig 2, 3A-3C, “[0028] As shown in FIG. 2, the method begins at step 202, where a temperature of the memory cell array 102 is detected by the temperature sensor 134. At step 204, a target write pulse width is determined based on the detected temperature of the memory device, as explained below with reference to FIGS. 3A-3C. [0029] The temperature dependent table 302a provides the target write pulse width 306 according to the temperature 304 of the memory cell array 102.”; a pulse generating device for a memory circuit that alters the pulse width explicitly based on temperature; that the pulses get shorter as the temperature increases). In view of the teachings of Noguchi it would have been obvious for a person of ordinary skill in the art to apply the teachings of Noguchi to Rajendra before the effective filing date of the claimed invention in order to teach pulse generation. The teachings of Noguchi, in the same or in a similar field of endeavor with Rajendra, can combine Noguchi’s pulse width dependent on temperature and Rajendra’s less explicitly controlled pulse width. The two methods of controlling a pulse width for a clock in a memory cell merely perform the same functions as they perform separately and being no more “the combining of prior art elements according to known methods to yield predictable results” (KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 417 (2007)). Regarding claim 14, Rajendra, as modified by Noguchi, teaches the pulse signal generator according to claim 1. Noguchi further teaches wherein the pulse generation circuit includes: an inverter that inverts the delay clock signal and outputs an inverted delay clock signal; and a logical AND circuit that logically ANDs the clock signal and the inverted delay clock signal to output the logical AND. (Noguchi, fig 3, 4, 5, “[0066] In the example configuration shown in FIG. 3, the AND/OR logic circuit 302 is configured to generate the first output sample clock signal SCLKOUTl according to OR logic on a first pair of sample clock signals, and the second output clock signal SCLKOUT2 according to AND logic on a second pair of sample clock signals. … The second pair of sample clock signals includes the second input sample clock signal SCLKIN2 and a delayed second input sample clock signal SCLKIN2d. [0082] As shown in FIG. 6, the NOR logic circuit 602 and the NAND logic circuit 604 are each configured as a push-pull circuit. In general, a push-pull circuit is a circuit that generates an output signal at an output node by pulling up a magnitude ( such as a voltage) of the output signal to an associated high level and by pushing down the magnitude of the output signal to an associated low level.”; a pulse generating circuit 300 that uses a logic AND gate with the input clock SCLKIN2 and the delayed clock SCKLIN2d to produce a shortened pulse; that the SCLKIN2 can be a CLKINb or inverted input; that AND/ OR/ NAND/ NOR gates (of figure 6 can be “obviously combined” under section 103 such that a finite number of inputs (clock signal, inverted clock signal, etc.) with either of the input clock signals with either of the delayed signals to produce a logic out signal). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DONALD H.B. BRASWELL whose telephone number is (469)295-9119. The examiner can normally be reached on 7-5 Central Time (Dallas). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alexander Sofocleous can be reached (571) 272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Donald HB Braswell/ Primary Examiner, Art Unit 2825
Read full office action

Prosecution Timeline

Sep 11, 2024
Application Filed
Jul 14, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
94%
With Interview (+11.8%)
2y 9m (~9m remaining)
Median Time to Grant
Low
PTA Risk
Based on 439 resolved cases by this examiner. Grant probability derived from career allowance rate.

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