Prosecution Insights
Last updated: July 17, 2026
Application No. 18/892,069

CONTACTS FOR REDUCING WEAR IN A RETICLE CONTAINER

Non-Final OA §102§103
Filed
Sep 20, 2024
Priority
Sep 22, 2023 — provisional 63/539,978
Examiner
PERSAUD, DEORAM
Art Unit
2882
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Entegris Inc.
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
89%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allowance Rate
583 granted / 759 resolved
+8.8% vs TC avg
Moderate +12% lift
Without
With
+11.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
33 currently pending
Career history
798
Total Applications
across all art units

Statute-Specific Performance

§101
1.2%
-38.8% vs TC avg
§103
63.8%
+23.8% vs TC avg
§102
28.0%
-12.0% vs TC avg
§112
0.7%
-39.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 759 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification The lengthy specification has not been checked to the extent necessary to determine the presence of all possible minor errors. Applicant’s cooperation is requested in correcting any errors of which applicant may become aware in the specification. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-3, 6, 11-13 and 17-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Chiu et al. [US 2012/0037522 A1]. Regarding claim 1, Chiu et al. discloses an article comprising a reticle contact for a reticle pod (as shown in Fig. 2), the reticle contact including: a reticle contact body (Figs. 4, 5, 8A and 8B, items 34 and 46) configured to be received in a cover (30) of the reticle pod or a baseplate (40) of the reticle pod (as shown in Fig. 2); and a reticle contact region (34 and 46) at a distal end of the reticle contact body, wherein the reticle contact region includes a wear reduction feature (paragraphs [0034] and [0036] teaches high polymer material or high wear-resistant high polymer material, PEEK, to reduce friction against the reticle). Regarding claims 2 and 3, Chiu et al. discloses wherein the wear reduction feature includes one or more elongate arcing projections, wherein the one or more elongate arcing projections surround a reticle contact region (as shown in Fig. 8B and supporting piece 46, semi-circular protruding points 461 and guiding sidewall 462). Regarding claim 6, Chiu et al. discloses wherein the wear reduction feature includes at least one relief (342) provided in the reticle contact region (as shown in Fig. 5). Regarding claims 11-13, Chiu et al. discloses wherein the wear reduction feature includes a first region of the reticle contact region where a thickness of the reticle contact is relatively less than a thickness of the reticle contact at a second region of the reticle contact surface, wherein the first region of the reticle contact overlaps with a center of the reticle contact region, wherein the wear reduction feature includes a plurality of projections from the reticle contact region, wherein at least one of the plurality of projections has an elongate cross-sectional shape (as shown in Figs. 4, 5, 8A and 8B). Regarding claims 17-20, Chiu et al. discloses a reticle pod, comprising a cover, a baseplate, and a plurality of the articles, further comprising a pod dome and a pod door (as shown in Fig. 2). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 4, 5, 7-10, 14 and 15 are rejected under 35 U.S.C. 103 as being unpatentable over Chiu et al. Regarding claims 4, 5, 7-10, 14 and 15, Chiu et al. discloses the article, as applied above. Chiu et al. does not teach wherein the one or more elongate arcing projections include one or more rings, each of said one or more rings surrounding a center of the reticle contact region, wherein a maximum height of the reticle contact region is provided on at least one of the one or more arcing projections, and wherein transitions from side walls of the one or more arcing projections to a reticle contact surface of the one or more arcing projections are radiused over a distance of 0.3 millimeters (mm) or less, wherein the relief has a depth of at least 0.1 millimeters (mm), wherein the reticle contact surface has a radius R1, a transition between the side wall of the wear reducing feature to the reticle contact surface has a radius R2, and R2 is less than 80% of R1, wherein the side wall of the wear reducing feature has a height of 0.2 mm or greater, wherein the at least one relief includes a ring-shaped trench, wherein the ring-shaped trench has an inner diameter in a range from 0.1 millimeters (mm) to 3.0 mm, wherein transitions from side walls of the ring-shaped trench to a reticle contact surface of the reticle contact region are radiused over a distance of 0.3 millimeters (mm) or less. However, Chiu et al. discloses wherein the contact region has a guiding sidewall (462) to guide the reticle and restricts the reticle between the guiding sidewall (paragraph [0036], see also Fig. 8B). Further, Chiu et al. discloses two protruding ribs (342) are further disposed on the front of the upper supporting piece creating a trench radius over a distance (paragraph [0034], see also Fig. 5). As such, the dimensions and shape of the contact region are art recognized result affecting parameter. Therefore, it would have been obvious to one of ordinary skill in the art to determine the optimum or workable dimensions and shape of the contact region by routine experimentation. The normal desire of scientists or artisans to improve upon what is already generally known would result in a system that allows for optimum dimensioned and shaped contact regions comprising wear reduction features, suitable for being used to transport reticles in EUV lithography process Claim 16 is rejected under 35 U.S.C. 103 as being unpatentable over Chiu et al. in view of Raschke et al. [US 2021/0057248 A1]. Regarding claim 16, Chiu et al. discloses the article, as applied above. Chiu et al. does not teach further comprising a flexible mounting configured to allow the reticle contact to move relative the cover of the reticle pod or the baseplate of the reticle pod when the flexible mounting is deformed. However, Raschke et al. discloses wherein the reticle contact member comprises a resilient member, configured to respond to the application of a downward force in the Z-direction permitting the reticle contact member to move from a first retracted position to a second position (Fig. 14A and 14B items 616 and 618, see also paragraph [0068]). Therefore, it would have been obvious to one of ordinary skill in the art to provide a flexible mounting configured to allow the reticle contact to move relative the cover of the reticle pod, as taught by Raschke et al. in the system of Chiu et al. because such a modification provides a suitable alternative reticle contact member to allow the reticle contact to move relative the cover of the reticle pod (paragraph [0068] of Raschke et al.). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DEORAM PERSAUD whose telephone number is (571)270-5476. The examiner can normally be reached M-F 8AM-5PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Minh-Toan Ton can be reached at 571-272-2303. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DEORAM PERSAUD/Primary Examiner, Art Unit 2882
Read full office action

Prosecution Timeline

Sep 20, 2024
Application Filed
May 18, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
89%
With Interview (+11.8%)
2y 9m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 759 resolved cases by this examiner. Grant probability derived from career allowance rate.

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