Office Action Predictor
Last updated: April 16, 2026
Application No. 18/947,945

APPARATUS AND METHOD FOR CHARACTERIZATION OF A DUCTILE MEMBRANE, SURFACE AND SUB-SURFACE PROPERTIES

Non-Final OA §DP
Filed
Nov 14, 2024
Examiner
CATTUNGAL, SANJAY
Art Unit
3798
Tech Center
3700 — Mechanical Engineering & Manufacturing
Assignee
Otonexus Medical Technologies, INC.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
3y 1m
To Grant
92%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allow Rate
850 granted / 1024 resolved
+13.0% vs TC avg
Moderate +9% lift
Without
With
+8.6%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
28 currently pending
Career history
1052
Total Applications
across all art units

Statute-Specific Performance

§101
2.4%
-37.6% vs TC avg
§103
36.0%
-4.0% vs TC avg
§102
38.8%
-1.2% vs TC avg
§112
7.2%
-32.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1024 resolved cases

Office Action

§DP
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/process/file/efs/guidance/eTD-info-I.jsp. Claims 3-23 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-24 of U.S. Patent No. 12,167,936. Although the claims at issue are not identical, they are not patentably distinct from each other because both application and patent claim a system and method of characterization of a material using a non-contact displacement force and using ultrasound to characterize the material. U. S. Application No. 18/947945 U. S. Patent No. 12,167,936 (New) A method for non-contact measurement of an elastic surface, the method comprising:(a) providing a non-contact force to a surface or a volume of material adjacent to the surface to be characterized using an excitation generator, wherein the non-contact force comprises a step or impulse pressure; and(b) in response to the non-contact force, forming a displacement measurement, the displacement measurement comprising:(i) directing a transmit burst of ultrasound energy from a transducer to the surface or the volume of material adjacent the surface;(ii) receiving reflected ultrasound energy from the surface or the volume of material adjacent the surface with the transducer;(iii) setting a range gate for a first region of the reflected ultrasound energy;and (iv) distinguishing movement or displacement of the first region from movement or displacement of a second region based at least in part on the range gate . 9. (New) The method of claim 3, wherein the transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. 1. A non-contact material characterization system comprising: an excitation generator, wherein the excitation generator is configured to generate a non-contact displacement force directed to an elastic surface or to a volume of material adjacent to the elastic surface, wherein the non-contact displacement force is directed along a direction to move the elastic surface or the volume in the direction; an ultrasound transducer, wherein the ultrasound transducer is configured to direct a transmit ultrasound signal to the elastic surface or to the volume, wherein the ultrasound transducer is configured to receive a reflected ultrasound signal from the elastic surface or the volume; and a processor coupled to the ultrasound transducer, wherein the processor is configured to determine a movement characteristic of the elastic surface or the volume based at least in part on the reflected ultrasound signal, wherein the processor is configured to distinguish movement in the direction from movement opposite the direction. 8. The non-contact material characterization system of claim 1, wherein the ultrasound transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. Claims 3-23 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-62 of U.S. Patent No. 10,675,001. Although the claims at issue are not identical, they are not patentably distinct from each other because both application and patent claim a system and method of characterization of a material using a non-contact displacement force and using ultrasound to characterize the material. U. S. Application No. 18/947945 U. S. Patent No. 10,675,001 3. (New) A method for non-contact measurement of an elastic surface, the method comprising:(a) providing a non-contact force to a surface or a volume of material adjacent to the surface to be characterized using an excitation generator, wherein the non-contact force comprises a step or impulse pressure; and(b) in response to the non-contact force, forming a displacement measurement, the displacement measurement comprising:(i) directing a transmit burst of ultrasound energy from a transducer to the surface or the volume of material adjacent the surface;(ii) receiving reflected ultrasound energy from the surface or the volume of material adjacent the surface with the transducer;(iii) setting a range gate for a first region of the reflected ultrasound energy;and (iv) distinguishing movement or displacement of the first region from movement or displacement of a second region based at least in part on the range gate . 9. (New) The method of claim 3, wherein the transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. 1. A non-contact medical diagnostic system comprising: an excitation generator, wherein the excitation generator is configured to generate a non-contact displacement force directed to an elastic surface or to a volume of material adjacent to the elastic surface, wherein the non-contact displacement force is a step or impulse pressure; an ultrasound transducer, wherein the ultrasound transducer is configured to direct a transmit ultrasound signal to the elastic surface or to the volume through a gas phase medium, wherein the ultrasound transducer is configured to receive a reflected ultrasound signal from the elastic surface or the volume; a processor coupled to the ultrasound transducer, wherein the processor is configured to determine a displacement of the elastic surface or the volume in response to the non-contact displacement force and the reflected ultrasound signal by analysis of a ringdown characteristic of a tissue motion in response to the step or impulse pressure. 10. The non-contact material characterization system of claim 1, wherein the ultrasound transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. Claims 3-23 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-24 of U.S. Patent No. 11,660,074. Although the claims at issue are not identical, they are not patentably distinct from each other because both application and patent claim a system and method of characterization of a material using a non-contact displacement force and using ultrasound to characterize the material. U. S. Application No. 18/947945 U. S. Patent No. 11,660,074 3. (New) A method for non-contact measurement of an elastic surface, the method comprising:(a) providing a non-contact force to a surface or a volume of material adjacent to the surface to be characterized using an excitation generator, wherein the non-contact force comprises a step or impulse pressure; and(b) in response to the non-contact force, forming a displacement measurement, the displacement measurement comprising:(i) directing a transmit burst of ultrasound energy from a transducer to the surface or the volume of material adjacent the surface;(ii) receiving reflected ultrasound energy from the surface or the volume of material adjacent the surface with the transducer;(iii) setting a range gate for a first region of the reflected ultrasound energy;and (iv) distinguishing movement or displacement of the first region from movement or displacement of a second region based at least in part on the range gate . 9. (New) The method of claim 3, wherein the transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. 1. A non-contact material characterization system comprising: an excitation generator, wherein the excitation generator is configured to generate a non-contact displacement force directed to an elastic surface or to a volume of material adjacent to the elastic surface; an ultrasound transducer, wherein the ultrasound transducer is configured to direct a transmit ultrasound signal to the elastic surface or to the volume, wherein the ultrasound transducer is configured to receive a reflected ultrasound signal from the elastic surface or the volume, wherein the ultrasound transducer is configured to transmit the ultrasound signal to the elastic surface or to the volume through a gas phase medium; and a processor coupled to the ultrasound transducer, wherein the processor is configured to determine a displacement of the elastic surface or the volume in response to the non-contact displacement force and the reflected ultrasound signal. 8. The non-contact material characterization system of claim 1, wherein the ultrasound transducer comprises a capacitive micromachined ultrasonic transducer (cMUT) or a piezoelectric transducer. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to SANJAY CATTUNGAL whose telephone number is (571)272-1306. The examiner can normally be reached M-F 9-5 EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Keith Raymond can be reached on 571-270-1790. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SANJAY CATTUNGAL/Primary Examiner, Art Unit 3793
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Prosecution Timeline

Nov 14, 2024
Application Filed
Sep 30, 2025
Non-Final Rejection — §DP
Mar 31, 2026
Response Filed

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
92%
With Interview (+8.6%)
3y 1m
Median Time to Grant
Low
PTA Risk
Based on 1024 resolved cases by this examiner. Grant probability derived from career allow rate.

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