Prosecution Insights
Last updated: August 06, 2026
Application No. 18/950,031

DEVICE FOR CONTROLLING SOLDERED JOINTS ON A BOARD

Non-Final OA §103
Filed
Nov 16, 2024
Priority
Oct 18, 2024 — RU 2024131430
Examiner
SHAH, NEEL D
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Tatiana Viktorovna Skvortsova
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
7m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
544 granted / 626 resolved
+18.9% vs TC avg
Moderate +8% lift
Without
With
+7.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
20 currently pending
Career history
643
Total Applications
across all art units

Statute-Specific Performance

§101
9.6%
-30.4% vs TC avg
§103
52.3%
+12.3% vs TC avg
§102
21.4%
-18.6% vs TC avg
§112
15.2%
-24.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 626 resolved cases

Office Action

§103
DETAILED ACTION 1. The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority 2. Acknowledgment is made of applicant’s claim for foreign priority under 35 U.S.C. 119 (a)-(d). The certified copy has been filed in parent Application No. RU2024131430, filed on 10/18/24. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. 3. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. 4. Claims 1-6 are rejected under 35 U.S.C. 103 as being unpatentable over Bohler et al. (US 2019/0257877). (“Bohler”). 5. Regarding claim 1, Bohler teaches A device for controlling soldered connections on a printed circuit board [Figures 1-6, a device for controlling soldered connections on a PCB is shown], the device comprising at least a housing with a seat for a printed circuit board to be controlled, wherein the seat is equipped with a plurality of (spring-loaded) contacts adapted to couple to counter contacts on the back of said printed circuit board [Figures 1-6, a device 1 comprising housing 4/5 is shown with a seat for a PCB 6 to be controlled, the seat is equipped with contacts 20, 22 to couple to counter contacts on the back of PCB 6]; the device is also equipped with at least one processor that is coupled to said contacts, so that it is possible to check soldered connections on a controlled printed circuit board for at least one of the following defects: solder skip, short circuit, wrong electronic component rating, wrong electronic component, wrong placement of an electronic component [Figures 1-6, P(0070, 0084-0085) teaches a processor unit coupled to the contacts, to check solder connections for any defects related to solder; see P(0009)] ; and with a memory storing a program code, which, when executed by the processor, prompts it to at least check at least one soldered connection with at least one electronic component on a printed circuit board placed on the seat for at least one of the defects [Figures 1-6, a memory is taught to check soldered connection, see P(0095)]. Bohler does not explicitly teach spring-loaded contacts. However, it would have been obvious to one skilled in the art before the effective filing date of the invention to modify Bohler’s test tip 20 with spring contact 22 because P(0049) teaches and Figure 1 shows spring-mounted contact tips 22. Using similar spring-mounted contact tips in place of test tip 20 would be obvious to one skilled in the art in order to obtain flexibility. 6. Regarding claim 2, Bohler teaches characterized in that said memory is further adapted to store the results of a check [Figures 1-2, P(0095) teaches a memory]. 7. Regarding claim 3, Bohler teaches characterized in that it is additionally equipped with a transceiver adapted to transmit stored results to a server of a system for controlling soldered connections on a printed circuit board, wherein said memory additionally contains at least a program code, which, when executed by the processor, prompts it to send stored results to the server [Figures 1-2, data is transmitted using a communication module 9 and memory is taught, see P(0095)]. 8. Regarding claim 4, Bohler teaches characterized in that it is additionally equipped with an output device adapted to at least present the results of a check [Figures 1-2, test device 1 provides output value based on the results]. 9. Regarding claim 5, Bohler teaches characterized in that said memory additionally contains at least a program code, which, when at least one of the defects mentioned above is detected, is executed by the processor, prompting it to generate instructions for a user on how to eliminate the detected defect [Figures 1-2, P(0070, 0084, 0095) teaches the processor and the memory to carry out instructions and generate and communication instructions for a user]. 10. Regarding claim 6, Bohler teaches characterized in that said output device is adapted to present generated instructions to a user [Figures 1-2, P(0070, 0084, 0095) teaches the processor and the memory are configured to present instructions to a user; see communication module 9]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to NEEL D SHAH whose telephone number is (571)270-3766. The examiner can normally be reached M-F: 9AM-5:30PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Judy Nguyen can be reached at 571-272-2258. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /NEEL D SHAH/Primary Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Nov 16, 2024
Application Filed
Jul 10, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12693311
Device for Handling a Test Contact
2y 4m to grant Granted Jul 28, 2026
Patent 12681045
PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF
3y 1m to grant Granted Jul 14, 2026
Patent 12681078
PROCEDURE FOR MAKING ON-DIE-PARAMETRIC MEASUREMENTS OF CIRCUIT DEVICES
2y 6m to grant Granted Jul 14, 2026
Patent 12681077
MASS-INTERCONNECT ENGAGING DEVICE
2y 3m to grant Granted Jul 14, 2026
Patent 12681069
SENSING SYMMETRICAL AND ASYMMETRICAL INSULATION FAULTS BY THE ASYMMETRICALLY SWITCHABLE SENSING OF FAULT CURRENT
1y 11m to grant Granted Jul 14, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
94%
With Interview (+7.5%)
2y 4m (~7m remaining)
Median Time to Grant
Low
PTA Risk
Based on 626 resolved cases by this examiner. Grant probability derived from career allowance rate.

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