Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2121 2857 2858 2868 2877
This examiner grants 87% of resolved cases
Neel D. Shah, in Tech Center 2800 and Art Unit 2121, has resolved 632 cases. The allowance rate is 86.9%, and the median days to allowance is 850. The interview lift is 7.6%, providing a modest boost to the already high probability of success.
For the 632 cases handled, the high allowance rate and the fast 850-day median suggest a very efficient and successful prosecution experience for most applicants. The 86.9% allowance rate is a strong indicator of a favorable environment in Art Unit 2121. While the 7.6% lift from interviews is small, it remains a useful tool for resolving minor disagreements. The 850-day median is a key metric for this examiner, making this a productive choice for those seeking rapid patent issuance.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18846860 | BATTERY STATE ANALYSIS SYSTEM, BATTERY STATE ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18973509 | ELECTRONIC DEVICE AND IMPEDANCE MEASUREMENT METHOD | Non-Final OA | InnoLux Corporation |
| 18951660 | INSPECTION METHOD AND ENERGY STORAGE SYSTEM | Non-Final OA | Contemporary Amperex Technology (Hong Kong) Limited |
| 18773297 | PROBE CARD FOR DEVICE UNDER TEST | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18790492 | SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA SURROUNDINGS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18859404 | METHOD FOR DETECTING WHETHER THERE IS ISLANDING AND POWER CONDITIONING SYSTEM USING SAME | Non-Final OA | HANWHA SOLUTIONS CORPORATION |
| 19225973 | ENCLOSURE FOR TESTING ELECTRONIC DEVICES | Non-Final OA | Promptlink Communications, Inc. |
| 19003412 | PROBE ADAPTER AND MEASUREMENT SYSTEM | Non-Final OA | RIGOL TECHNOLOGIES CO., LTD. |
| 18686153 | FABRICATION OF A SCALABLE QUANTUM SENSING DEVICE THROUGH PRECISELY PROGRAMMABLE PATTERNING SPIN DEFECTS ON UNIVERSAL SUBSTRATES | Non-Final OA | Versitech Limited |
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