Prosecution Insights
Last updated: July 17, 2026
Application No. 18/952,578

MEMORY FAULT NOTIFICATION

Non-Final OA §DP
Filed
Nov 19, 2024
Priority
Jun 28, 2022 — continuation of 12/154,639
Examiner
BEGUM, SULTANA
Art Unit
Tech Center
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allowance Rate
507 granted / 543 resolved
+33.4% vs TC avg
Minimal +0% lift
Without
With
+0.4%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 9m
Avg Prosecution
14 currently pending
Career history
566
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
82.0%
+42.0% vs TC avg
§102
4.0%
-36.0% vs TC avg
§112
5.5%
-34.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 543 resolved cases

Office Action

§DP
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Status of claim(s) to be treated in this office action: a. Independent: 2, 12 and 16 b. Pending: 2-21 Claim 1 has been canceled and claims 2-21 have been newly added through preliminary amendments. Per MPEP 2111 and 2111.01, the claims are given their broadest reasonable interpretation and the words of the claims are given their plain meaning consistent with the specification without importing claim limitations from the specification. Information Disclosure Statement The information disclosure statement (IDS) is submitted on 1/17/2025. The submission is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 2-21 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-25 of U.S. Patent No. US 12154639. Although the claims at issue are not identical, they are not patentably distinct from each other because when we compare independent method claim 2 of Instant Application with independent method claim 1 of USP’639, we find that they both recite the same claim limitations. Same observation is true for all dependent claims and independent device claim 12 (16) of Instant Application vs. independent device claim 13 (18) of USP’639. Please see the below table. Instant Application USP 12154639 2. A method, comprising: receiving a configuration for a memory device, the configuration corresponding to a circuit node of the memory device; coupling the circuit node to a first resistor of a set of resistors based at least in part on a fault condition associated with the memory device; and biasing the circuit node of the memory device to a first voltage value based at least in part on coupling the circuit node to the first resistor. 1. A method, comprising: receiving a configuration for a memory device, the configuration corresponding to a circuit node of the memory device, the circuit node selectively coupled with a set of resistors associated with the memory device; coupling the circuit node to a first resistor of the set of resistors based at least in part on a fault condition associated with the memory device; and biasing the circuit node of the memory device to a first voltage value satisfying a first voltage threshold based at least in part on coupling the circuit node to the first resistor. 12. A memory system, comprising: a circuit comprising a set of resistors; and processing circuitry operable to cause the memory system to: receive a configuration for a memory device of the memory system, the configuration corresponding to a circuit node of the circuit; couple the circuit node to a first resistor of the set of resistors based at least in part on a fault condition associated with the memory device; and bias the circuit node of the memory device to a first voltage value based at least in part on coupling the circuit node to the first resistor. 13. A memory system, comprising: a circuit comprising a set of resistors; a switch operable to couple one or more resistors of the set of resistors to a circuit node; and processing circuitry operable to cause the memory system to: receive a configuration for a memory device of the memory system, the configuration corresponding to the circuit node of the circuit; couple the circuit node to a first resistor of the set of resistors based at least in part on detecting a fault condition associated with the memory device; and bias the circuit node of the circuit to a first voltage value based at least in part on the coupling, the first voltage value satisfying a first voltage threshold. 16. A memory system, comprising: one or more memory devices; and processing circuitry configured to couple with the one or more memory devices and configured to cause the memory system to: receive a configuration for a memory device of the one or more memory devices, the configuration corresponding to a circuit node of the memory device; couple the circuit node to a first resistor of a set of resistors based at least in part on detecting a fault condition associated with the memory device; and bias the circuit node of the memory device to a first voltage value based at least in part on coupling the circuit node to the first resistor, the first voltage value. 18. A memory system, comprising: one or more memory devices; and processing circuitry configured to couple with the one or more memory devices and configured to cause the memory system to: receive a configuration for a memory device of the one or more memory devices, the configuration corresponding to a circuit node of the memory device, the circuit node selectively coupled with a set of resistors associated with the memory device; couple the circuit node to a first resistor of the set of resistors based at least in part on detecting a fault condition associated with the memory device; and bias the circuit node of the memory device to a first voltage value satisfying a first voltage threshold based at least in part on coupling the circuit node to the first resistor, the first voltage value. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: Kasnavi et al. (US 7620853) Any inquiry concerning this communication or earlier communications from the examiner should be directed to SULTANA BEGUM whose telephone number is (571)431-0691. The examiner can normally be reached M-F 8 am - 5 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Richard Elms can be reached at 571272 1869. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SULTANA BEGUM/Primary Examiner, Art Unit 2824 6/30/2026
Read full office action

Prosecution Timeline

Nov 19, 2024
Application Filed
Jul 02, 2026
Non-Final Rejection mailed — §DP (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12665017
ENHANCED VALLEY TRACKING WITH TRIM SETTING UPDATES IN A MEMORY DEVICE
2y 9m to grant Granted Jun 23, 2026
Patent 12658234
DYNAMIC WRITE SELECTION FOR SHELF-LIFE RETENTION IN NON-VOLATILE MEMORIES
3y 10m to grant Granted Jun 16, 2026
Patent 12658235
Runtime Memory Services in Physical Layer
3y 1m to grant Granted Jun 16, 2026
Patent 12658222
MEMORY DEVICE AND OPERATING METHOD WITH TEMPERATURE COMPENSATION CIRCUIT
2y 9m to grant Granted Jun 16, 2026
Patent 12658258
EVEN/ODD WORD LINE DRIVING IN 3D MEMORY
2y 7m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
94%
With Interview (+0.4%)
1y 9m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 543 resolved cases by this examiner. Grant probability derived from career allowance rate.

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