Tech Center 2800 • Art Units: 2824
This examiner grants 93% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18953964 | MAGNETIC MEMORY DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18900110 | READ OFFSET COMPENSATOR FOR ADJUSTING REFERENCE RESISTANCE USING COARSE OFFSET REFERENCE RESISTANCE AND FINE OFFSET REFERENCE RESISTANCE, AND MEMORY DEVICE INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18669264 | MEMORY DEVICE AND OPERATION METHODS THEREOF | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18912997 | TEMPERATURE SENSOR IMPLEMENTED WITH A MAGNETORESISTIVE RANDOM ACCESS MEMORY (MRAM) | Non-Final OA | NXP USA, Inc. |
| 18970705 | MEMORY WITH ROW HAMMER MITIGATION TECHNIQUE | Non-Final OA | SK hynix Inc. |
| 18934493 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18796927 | SEMICONDUCTOR SYSTEM FOR PERFORMING AN ACTIVE OPERATION USING AN ACTIVE PERIOD CONTROL METHOD | Non-Final OA | SK hynix Inc. |
| 18952578 | MEMORY FAULT NOTIFICATION | Non-Final OA | Micron Technology, Inc. |
| 18785998 | INTEGRATED CIRCUIT | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18783610 | DATA BACKUP UNIT FOR STATIC RANDOM-ACCESS MEMORY DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18767858 | CIRCUITS AND METHODS FOR COMPENSATING A MISMATCH IN A SENSE AMPLIFIER | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18953575 | SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR STORAGE DEVICE | Non-Final OA | Kioxia Corporation |
| 18774928 | SIGNAL RECEIVING CIRCUIT, MEMORY STORAGE DEVICE AND REFERENCE VOLTAGE ADJUSTMENT METHOD | Final Rejection | PHISON ELECTRONICS CORP. |
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