Prosecution Insights
Last updated: July 17, 2026
Application No. 18/969,177

3D DRAM with Vertical Bit Lines

Non-Final OA §103§112
Filed
Dec 04, 2024
Priority
Dec 08, 2023 — EU 23215119.1
Examiner
AGGER, ELIZABETH ROSE
Art Unit
Tech Center
Assignee
Katholieke Universiteit Leuven
OA Round
1 (Non-Final)
94%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 94% — above average
94%
Career Allowance Rate
34 granted / 36 resolved
+34.4% vs TC avg
Minimal -3% lift
Without
With
+-2.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
22 currently pending
Career history
62
Total Applications
across all art units

Statute-Specific Performance

§103
85.5%
+45.5% vs TC avg
§102
12.4%
-27.6% vs TC avg
§112
0.7%
-39.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 36 resolved cases

Office Action

§103 §112
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . DETAILED ACTION This action is responsive to the Application filed December 4, 2024. Status of claims to be treated in this office action: a. Independent: 1 b. Pending: 1-20 Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 3-4, 13-16, and 19 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claims 3 and 19 include the phrase “arranged sequentially”, claim 4 contains the phrase “arranged interleaved”, and claims 13-16 contain both phrases. The phrase “arranged sequentially” is indefinite because the numbering or labeling of components such as bit lines, word lines, and sub-blocks is arbitrary. It would be clearer to use claim language to specify that a consecutive group of the components are all connected in common to another component. Refer to para. [0063] on p.15 of the Specification. The phrase “arranged interleaved” is also indefinite for the same reasons; while interleaved indicates an alternating pattern, the claim language does not provide clarity on what it means for the group of components to be interleaved. An example is provided in para. [0068] on p.16 of the Specification that clarifies that the interleaving of a group of one component is in relation to a group of another component. Examiner recommends amended these claims to provide clarity. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-4 are rejected under 35 U.S.C. 103 as being unpatentable over Yamazaki et al. (US Pub. 20170033111 A1; “Yamazaki”) in view of Aoki et al. (US Pub. 20230200051 A1; “Aoki”). Regarding independent claim 1, Yamazaki discloses a dynamic random access memory ([0517]: the semiconductor device in the above embodiment is used for a memory chip…a main memory (which can be replaced with a DRAM module, for example)) comprising: a block comprising an array of memory cells (Fig. 2: memory circuit 20; [0223]); wherein the block comprises planes (cell array 50 and sense amplifier circuit 60; [0223]) stacked along a first axis (Z; see annotated screenshot below), wherein the block is divided into multiple sub-blocks (plurality of memory cells 51a and plurality of memory cells 51b; [0223]) arranged along the second axis (Y), wherein each of the sub-blocks contains one of the columns of the memory cells (memory cells in 51a are connected to wiring WLa, memory cells in 51b are connected to the wiring WLb); the dynamic random access memory ([0517]) further comprising: local bit lines each extending along the first axis in one of the sub-blocks (two wirings BLa and BLb); global bit lines (wiring GBLa, wiring GBLb; [0225]), sense amplifiers (sense amplifiers 61; [0223]) PNG media_image1.png 603 635 media_image1.png Greyscale Yamazaki does not explicitly disclose: a block comprising a three-dimensional array of memory cells; each of the planes comprising a two-dimensional array of the memory cells organized in rows extending along a second axis perpendicular to the first axis and columns extending along a third axis perpendicular to the first axis and the second axis, wherein each of the sub-blocks contains one of the columns of the memory cells of each of the planes; local bit lines each extending along the first axis in one of the sub-blocks and connected to one memory cell in each of the planes; global bit lines, wherein one or more of the global bit lines are connected to the local bit lines in each of the sub-blocks; and sense amplifiers each connected to one of the global bit lines. However, Aoki teaches: a block (Fig. 2: LMCA; [0048]) comprising a three-dimensional array of memory cells (Fig. 3: memory cells MC; [0050]); each of the planes comprising a two-dimensional array of the memory cells (MC) organized in rows extending along a second axis (Y-direction) perpendicular to the first axis (Z) and columns extending along a third axis (X. Examiner notes that the selection of the second and third axis may be interchangeable) perpendicular to the first axis and the second axis, wherein each of the sub-blocks (Fig. 5: MCAC) contains one of the columns of the memory cells of each of the planes ([0056]: As shown in FIG. 5, the sub array column MCA.sub.C comprises: the plurality of memory layers ML0-ML3 arranged in the Z direction; and the plurality of global bit lines GBL provided below these memory layers ML0-ML3); local bit lines (Fig. 5: 104(BL)) each extending along the first axis (Z) in one of the sub-blocks (MCAC) and connected to one memory cell (each combination of a transistor structure 110(TrC) and a capacitor structure 130(CpC)) in each of the planes (plurality of memory layers ML0-ML3); global bit lines (global bit lines GBL; [0056]), wherein one or more of the global bit lines are connected to the local bit lines in each of the sub-blocks (one GBL is connected to the two BLs in the sub-block MCAC); and sense amplifiers (Fig. 13: plurality of sense amplifier units SAU; [0096]) each connected to one of the global bit lines ([0101]: The plurality of sense amplifiers SA included in the sense amplifier unit SAU are each connected to the global bit lines GBL.sub.C, GBL.sub.T). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to Yamazaki wherein a block comprising a three-dimensional array of memory cells; each of the planes comprising a two-dimensional array of the memory cells organized in rows extending along a second axis perpendicular to the first axis and columns extending along a third axis perpendicular to the first axis and the second axis, wherein each of the sub-blocks contains one of the columns of the memory cells of each of the planes; local bit lines each extending along the first axis in one of the sub-blocks and connected to one memory cell in each of the planes; global bit lines, wherein one or more of the global bit lines are connected to the local bit lines in each of the sub-blocks; and sense amplifiers each connected to one of the global bit lines in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Regarding claim 2, Yamazaki and Aoki together disclose all the limitations of claim 1, and further through Aoki: wherein each of the global bit lines (Fig. 5: GBL) extends along the third axis (Y), and each of the sub-blocks is associated with a first group of the global bit lines (GBL in Fig. 5; also see multiple GBL in Fig. 3), and each global bit line of the first group is connected to a second group of the local bit lines in the sub-block (e.g. the two bit lines 104(BL) depicted in the cross-section shown in Fig. 5). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to modified Yamazaki wherein each of the global bit lines extends along the third axis, and each of the sub-blocks is associated with a first group of the global bit lines, and each global bit line of the first group is connected to a second group of the local bit lines in the sub-block in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Regarding claim 3, Yamazaki and Aoki together disclose all the limitations of claim 2, and further through Aoki: wherein the second group of the local bit lines (the two bit lines 104(BL) depicted in the cross-section shown in Fig. 5) are arranged sequentially along the third axis (this pair of bit lines are aligned in the Y-direction). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to modfied Yamazaki wherein the second group of the local bit lines are arranged sequentially along the third axis in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Regarding claim 4, Yamazaki and Aoki together disclose all the limitations of claim 2, and further through Yamazaki: wherein the second group of the local bit lines (bit lines BL depicted in Fig. 15A) are arranged interleaved along the third axis (the connections between bit lines and word lines are alternating along the X-axis. Examiner has given this limitation the broadest reasonable interpretation; see 112(b) rejection above). Claims 5 and 17-19 are rejected under 35 U.S.C. 103 as being unpatentable over Yamazaki (US Pub. 20170033111 A1) in view of Aoki (US Pub. 20230200051 A1) as applied to claim 1 above, and further in view of Kajigaya (US Pub. 20130070506 A1). Regarding claim 5, Yamazaki and Aoki together disclose all the limitations of claim 1. Neither Yamazaki nor Aoki discloses: wherein each of the global bit lines extends along the third axis and is connected to all of the local bit lines in one of the sub-blocks. However, Kajigaya teaches: wherein each of the global bit lines (Fig. 6: global bit line GBL; [0043]) extends along the third axis and is connected to all of the local bit lines in one of the sub-blocks (per Fig. 6, J local bit lines LBL(1) to LBL (J) are connected to global bit line GBL through the local sense amplifier LSA; [0043]: This structure enables the local sense amplifier LSA to sense and amplify the signal on a selected local bit line LBL through one input/output node Na and to output the signal to the global bit line GBL through the other input/output node Nb). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Kajigaya to modfied Yamazaki wherein each of the global bit lines extends along the third axis and is connected to all of the local bit lines in one of the sub-blocks in order to decrease manufacturing time by forming capacitors on thin film transistor layer (Kajigaya, [0079]). Regarding claim 17, Yamazaki and Aoki together disclose all the limitations of claim 1, and further through Aoki: wherein each of the global bit lines (Fig. 5: GBL) extends along the second axis (Y), and It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to modfied Yamazaki wherein each of the global bit lines extends along the second axis in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Neither Yamazaki nor Aoki discloses: each of the global bit lines is connected to one bit line in each of the sub-blocks of the block. However, Kajigaya teaches: each of the global bit lines is connected to one bit line in each of the sub-blocks of the block (through Fig. 6, para. [0043], and the same reasoning as applied to claim 5, the global bit line is connected physically through switches to each bit line, however, the global bit line may only be electrically connected to one selected local bit line at a time). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Kajigaya to modfied Yamazaki wherein each of the global bit lines is connected to one bit line in each of the sub-blocks of the block in order to decrease manufacturing time by forming capacitors on thin film transistor layer (Kajigaya, [0079]). Regarding claim 18, Yamazaki and Aoki together disclose all the limitations of claim 1, and further through Aoki: wherein each of the global bit lines (Fig. 5: GBL) extends along the second axis (Y), sub-blocks (sub array column MCAC) of a group of the sub-blocks ([0048]: sub arrays MCAS) associated with the global bit line (GBL), and wherein different global bit lines are associated with different groups of the sub-blocks (Fig. 5 depicts a group of GBLs, so by extension, MCAS, comprising a group of MCAC, is associated with a larger group of GBLs). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to modified Yamazaki wherein each of the global bit lines extends along the second axis, and sub-blocks of a group of the sub-blocks associated with the global bit line, and wherein different global bit lines are associated with different groups of the sub-blocks in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Neither Yamazaki nor Aoki discloses: each of the global bit lines is connected to one of the bit lines in each of the sub-blocks However, Kajigaya teaches: each of the global bit lines is connected to one of the bit lines in each of the sub-blocks (refer to claim 5 rejection using Fig. 6 and para. [0043]) It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Kajigaya to modfied Yamazaki wherein each of the global bit lines is connected to one of the bit lines in each of the sub-blocks in order to decrease manufacturing time by forming capacitors on thin film transistor layer (Kajigaya, [0079]). Regarding claim 19, Yamazaki, Aoki, and Kajigaya together disclose all the limitations of claim 18, and further through Aoki: wherein each group of the sub-blocks (MCAS) are arranged sequentially along the second axis (in Fig. 4, MCAS are lined up along the Y-axis). It would have been obvious to one with ordinary skill in the art before the earliest effective filing date of the claimed invention to apply the teachings of Aoki to modified Yamazaki wherein each group of the sub-blocks are arranged sequentially along the second axis in order to provide a three-dimensional device with minimized area increase, partially due to the arrangement of contact electrodes (Aoki, [0138]-[0140]). Allowable Subject Matter Claims 6-16 and 20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ELIZABETH ROSE AGGER whose telephone number is (571)270-0250. The examiner can normally be reached Mon-Fri, 8am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Rich Elms can be reached at 571-272-1869. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /E.R.A./Examiner, Art Unit 2824 /HAN YANG/Primary Examiner, Art Unit 2824 6/13/2026
Read full office action

Prosecution Timeline

Dec 04, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §103, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12682961
CROSS TEMPERATURE NAND READ ADJUSTMENT
1y 11m to grant Granted Jul 14, 2026
Patent 12677598
MAGNETIC ARRAY, MAGNETIC ARRAY CONTROL METHOD, AND MAGNETIC ARRAY CONTROL PROGRAM
3y 0m to grant Granted Jul 07, 2026
Patent 12646578
SEMICONDUCTOR DEVICE WITH TRANSFER CIRCUITS AND OPERATING METHOD INCLUDING ASJUSTMENT OF TRANFER CONTROL SIGNAL AND PROGRAM PULSE
2y 11m to grant Granted Jun 02, 2026
Patent 12640193
BIT LINE VOLTAGE CLAMPING READ CIRCUIT FOR AN IN-MEMORY COMPUTE OPERATION WHERE SIMULTANEOUS ACCESS IS MADE TO PLURAL ROWS OF A STATIC RANDOM ACCESS MEMORY (SRAM)
3y 1m to grant Granted May 26, 2026
Patent 12633358
MEMORY DEVICE AND PROGRAMMING METHOD THEREOF
2y 7m to grant Granted May 19, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
94%
Grant Probability
92%
With Interview (-2.6%)
2y 5m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 36 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month