Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2824
This examiner grants 94% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18789762 | INTERFACE CIRCUITS, NON-VOLATILE MEMORY DEVICES, AND MEMORY CONTROLLERS HAVING ENHANCED OUTPUT DRIVERS THEREIN | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18437394 | MULTI-BIT CELL AND MULTI-BIT CELL ARRAY INCLUDING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18399872 | STORAGE DEVICES THAT SUPPORT SUB-BLOCK RECLAIM OPERATIONS THEREIN UPON DETECTION OF UNCORRECTABLE ERRORS | Final Rejection | Samsung Electronics Co., Ltd. |
| 18539914 | NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18485353 | MEMORY DEVICE AND MEMORY DEVICE OPERATING METHOD | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18350416 | APPARATUS AND METHOD WITH IN-MEMORY COMPUTING (IMC) PROCESSOR | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18791158 | READ OPERATIONS USING UNBALANCED READ WINDOW BUDGETS ACROSS PAGE TYPES | Non-Final OA | Micron Technology, Inc. |
| 18416890 | SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc |
| 18510656 | DATA STORAGE DEVICE AND OPERATING METHOD THEREOF | Non-Final OA | SK hynix Inc. |
| 18462056 | SEMICONDUCTOR DEVICE AND OPERATING METHOD OF SEMICONDUCTOR DEVICE CAPABLE OF REDUCING DATA ERROR RATE | Non-Final OA | SK hynix Inc. |
| 18346784 | SEMICONDUCTOR MEMORY DEVICE WITH CIRCUIT TO CHECK THRESHOLD VOLTAGE SHIFT | Non-Final OA | SK hynix Inc. |
| 18635524 | A HIGH BANDWIDTH MEMORY DEVICE WITH ALWAYS ON BIT LINES | Final Rejection | Sandisk Technologies, Inc. |
| 18230270 | OPEN BLOCK DETECTION METHOD USING FOR FIRST AND SECOND TIME PERIOD READ TIME VALLEY FOR NON-VOLATILE MEMORY APPARATUS | Final Rejection | Sandisk Technologies, Inc. |
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