Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2824 2827 2893
This examiner grants 94% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19029179 | DEVICE INCLUDING BIDIRECTIONAL DATA TRANSCEIVER AND METHOD OF OPERATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18949589 | MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18789762 | INTERFACE CIRCUITS, NON-VOLATILE MEMORY DEVICES, AND MEMORY CONTROLLERS HAVING ENHANCED OUTPUT DRIVERS THEREIN | Final Rejection | Samsung Electronics Co., Ltd. |
| 18539914 | NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18881745 | STORAGE DEVICE, ELECTRONIC APPARATUS, AND STORAGE DEVICE CONTROL METHOD | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18417631 | APPARATUS AND METHOD OF IMPLEMENTING A PROBABILISTIC BIT (P-BIT) CIRCUIT WITH ENHANCED TUNABILITY | Non-Final OA | KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS |
| 18881494 | SEMICONDUCTOR DEVICE | Non-Final OA | Semiconductor Energy Laboratory Co., Ltd. |
| 18960804 | POWER MANAGEMENT CIRCUIT AND STORAGE DEVICE | Non-Final OA | SK hynix Inc. |
| 18943250 | SEMICONDUCTOR DEVICE CONFIGURED TO STORE PARITY DATA AND METHOD OF OPERATING THE SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 18510656 | DATA STORAGE DEVICE AND OPERATING METHOD THEREOF | Non-Final OA | SK hynix Inc. |
| 18346553 | MEMORY DEVICE AND OPERATING METHOD INCLUDING COARSE AND FINE PROGRAMMING AND SELECTIVE BIT LINE PRECHARGING | Non-Final OA | SK hynix Inc. |
| 18880422 | MEMORY DEVICE WITH A THREE-DIMENSIONAL VERTICAL STRUCTURE AND DRIVING METHOD THEREOF | Non-Final OA | Micron Technology, Inc. |
| 18763370 | NON-VOLATILE MEMORY WITH USAGE DEPENDENT SUSPEND RESUME | Non-Final OA | Sandisk Technologies, Inc. |
| 18392904 | SMART REDUCED-VERIFY ALGORITHM FOR NON-VOLATILE MEMORY APPARATUSES | Final Rejection | Sandisk Technologies, Inc. |
| 18230270 | OPEN BLOCK DETECTION METHOD USING FOR FIRST AND SECOND TIME PERIOD READ TIME VALLEY FOR NON-VOLATILE MEMORY APPARATUS | Final Rejection | Sandisk Technologies, Inc. |
| 18764178 | OPERATION METHOD FOR STACKED MEMORY DEVICE AND STACKED MEMORY DEVICE | Final Rejection | Powerchip Semiconductor Manufacturing Corporation |
| 18973257 | METHOD AND CIRCUIT FOR BIT READ DURING NON-VOLATILE MEMEORY POWER-ON-RESET | Non-Final OA | GlobalFoundries U.S. Inc. |
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