Prosecution Insights
Last updated: July 17, 2026
Application No. 19/005,213

NONVOLATILE MEMORY DEVICE DETECTING LOW POWER SUPPLY VOLTAGE AND OPERATION METHOD THEREOF

Non-Final OA §112
Filed
Dec 30, 2024
Priority
Apr 12, 2024 — RE 10-2024-0048986
Examiner
RADKE, JAY W
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
722 granted / 842 resolved
+25.7% vs TC avg
Moderate +9% lift
Without
With
+8.6%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
21 currently pending
Career history
863
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
66.1%
+26.1% vs TC avg
§102
10.6%
-29.4% vs TC avg
§112
17.4%
-22.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 842 resolved cases

Office Action

§112
CTNF 19/005,213 CTNF 84055 DETAILED ACTION Notice of Pre-AIA or AIA Status 07-03-aia AIA 15-10-aia The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Information Disclosure Statement The information disclosure statement (IDS) submitted on December 30, 2024 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Drawings 06-22 AIA The drawings are objected to because of the following. Regarding FIG. 8: It seems to Examiner that Vref should be labeled along the vertical axis (BLCLAMP axis) since Vref is the voltage level corresponding to the dashed line (see [0070]). Keep in mind that [0066] states “In other embodiments, the power supply voltage VCC may not be divided but may be directly provided as the bit line clamp signal BLCLAMP”. Please confirm the correctness of this drawing . Corrected drawing sheets in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. Any amended replacement drawing sheet should include all of the figures appearing on the immediate prior version of the sheet, even if only one figure is being amended. The figure or figure number of an amended drawing should not be labeled as “amended.” If a drawing figure is to be canceled, the appropriate figure must be removed from the replacement sheet, and where necessary, the remaining figures must be renumbered and appropriate changes made to the brief description of the several views of the drawings for consistency. Additional replacement sheets may be necessary to show the renumbering of the remaining figures. Each drawing sheet submitted after the filing date of an application must be labeled in the top margin as either “Replacement Sheet” or “New Sheet” pursuant to 37 CFR 1.121(d). If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance. Claim Objections 07-29-01 AIA Claim s 1-20 are objected to because of the following informalities: Regarding claim 1: It is suggested to change “comparing the first sensing data and the second sensing data” to “comparing the first sensing data with the second sensing data” . Regarding claim 6: To accurately claim the invention and make the claim be more consistent or connected in language with claim 1, Examiner suggests changing “when the voltage level of the power supply voltage is lower than the reference voltage” to “in response to determining the voltage level of the power supply voltage is lower than the reference voltage” . Claims 7-8 depend on claim 6. Regarding claim 9: Similar to the reason stated in regards to claim 6, Examiner suggests changing “when the voltage level of the power supply voltage is lower than the reference voltage” to “in response to determining the voltage level of the power supply voltage is lower than the reference voltage” . Claims 10-17 depend on claim 9. Regarding claim 13: Similar to that of claim 1, it is suggested to change “to compare the first sensing data, which is latched as a result of the first sensing operation, and the second sensing data” to “to compare the first sensing data, which is latched as a result of the first sensing operation, with the second sensing data”. Claims 14-17 depend on claim 13. Regarding claim 18: Similar to that of claim 1, it is suggested to change “comparing the first sensing data and the second sensing data” to “comparing the first sensing data with the second sensing data”. Claims 19-20 depend on claim 18. Regarding claim 19: Similar to that of claim 1, it is suggested to change “comparing the second sensing data and the lower limit voltage” to “comparing the second sensing data with the lower limit voltage” . Appropriate correction is required. Claim Rejections - 35 USC § 112 07-30-02 AIA The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. 07-34-01 Claim 5 is rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Regarding claim 5: The term or phrase “a digital mass bit count technique” is not recognized to be a standard term in the art and no definite meaning is conveyed when interpreting such a phrase in plain English. Furthermore, Applicant introduces the phrase in [0065, 0082, 0089, 0108] of the specification but with no clear definition and it is not clear to one of ordinary skill in the art if a digital mass bit count method would be a synonym or an alternative method of choice to “a fail bit count” technique/method since the word “or” was used but in an unclear manner (unclear as to whether both are synonyms or are alternative choices). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JAY W RADKE whose telephone number is (571)270-1622. The examiner can normally be reached M-F 9-6 EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Amir Zarabian can be reached at 272-1852. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. JAY W. RADKE Primary Examiner Art Unit 2827 /JAY W. RADKE/Primary Examiner, Art Unit 2827 Application/Control Number: 19/005,213 Page 2 Art Unit: 2827 Application/Control Number: 19/005,213 Page 3 Art Unit: 2827 Application/Control Number: 19/005,213 Page 4 Art Unit: 2827 Application/Control Number: 19/005,213 Page 5 Art Unit: 2827
Read full office action

Prosecution Timeline

Dec 30, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12676187
FERROELECTRIC FIELD EFFECT TRANSISTORS BASED APPROACH FOR EUCLIDEAN DISTANCE CALCULATION IN NEUROMORPHIC HARDWARE
2y 7m to grant Granted Jul 07, 2026
Patent 12676201
MEMORY SYSTEM
1y 11m to grant Granted Jul 07, 2026
Patent 12670939
MEMORY SYSTEM, OPERATING METHOD OF THE MEMORY SYSTEM, AND INTERFACE CIRCUIT OF THE MEMORY SYSTEM
2y 5m to grant Granted Jun 30, 2026
Patent 12670951
SILICON BRAIN
1y 8m to grant Granted Jun 30, 2026
Patent 12665019
SEMICONDUCTOR DEVICE
3y 8m to grant Granted Jun 23, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
94%
With Interview (+8.6%)
2y 0m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 842 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month