Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2137 2825 2827
This examiner grants 86% of resolved cases
RADKE, JAY W is an examiner in Tech Center 2800 and Art Unit 2137. The examiner has 852 resolved cases. The allowance rate for these cases is 85.9 percent. Practitioners should use this information when advising clients on the likelihood of a patent grant. The volume of dispositions provides a basis for statistical analysis of the examiner's record. This percentage informs the expectations for an outcome during the prosecution process.
The median days to allowance is 749. This timeline represents the duration from filing to a grant. The pendency figure is a factor for managing portfolio expectations and planning filings. Applicants should prepare for the prosecution process by considering this time requirement. The duration of the examination is a component of the experience in Tech Center 2800.
The interview lift is 8.5 percent. This figure indicates the correlation between an interview and an allowance. Engaging in dialogue with the examiner is a factor to consider for applicants in Art Unit 2137. The impact of interviews is a metric for this docket. This 8.5 percent lift is a data point for strategy development. These statistics offer a view of the examiner's performance and tendencies. This analysis provides a baseline for expectations during the patent examination process.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19009399 | METHOD, DEVICE, AND APPARATUS WITH MEMORY REPAIR BASED ON EXCLUSIVE-OR | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18796121 | MEMORY DEVICE AND OPERATION METHOD THEREOF, AND MEMORY SYSTEM AND STORAGE MEDIUM | Final Rejection | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 19063427 | SEMICONDUCTOR DEVICE AND MEMORY DEVICE | Non-Final OA | Kioxia Corporation |
| 19092654 | MANAGING DEFECTIVE BLOCKS DURING MULTI-PLANE PROGRAMMING OPERATIONS IN MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 19022840 | APPARATUSES AND METHODS FOR DQ TERMINAL PSEUDO-RANDOM BIT STREAM VARIATION | Non-Final OA | Micron Technology, Inc. |
| 19003474 | INNER AND BOUNDARY WORD LINE READ OFFSETS | Non-Final OA | Micron Technology, Inc. |
| 18983959 | SELECTIVE SLOW PROGRAMMING CONVERGENCE PROGRAM OPERATION WITH PROGRAM VERIFY LOOP DEPENDENT BITLINE VOLTAGE ADJUSTMENT | Non-Final OA | Micron Technology, Inc. |
| 18423161 | MEMORY DEVICE PERFORMING SIGNED MULTIPLICATION USING LOGICAL STATES OF MEMORY CELLS | Non-Final OA | Micron Technology, Inc. |
| 18773342 | MEMORY DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18652963 | VOLTAGE CONTROL CIRCUITS AND METHODS FOR OPERATING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18869501 | 3D MEMORY DEVICE WITH LOCAL COLUMN DECODING | Non-Final OA | Rambus Inc. |
| 18614774 | NONVOLATILE MEMORY WITH FAST PROGRAM VOLTAGE RAMP DOWN | Final Rejection | Sandisk Technologies, Inc. |
| 18357208 | GENERATING A RANDOM NUMBER USING A NON-VOLATILE MEMORY BASED PHYSICAL UNCLONEABLE FUNCTION | Non-Final OA | Sandisk Technologies, Inc. |
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