Prosecution Insights
Last updated: October 02, 2026
Application No. 19/008,495

BIAS VOLTAGE SCHEMES DURING PRE-PROGRAMMING AND PROGRAMMING PHASES

Non-Final OA §102§103
Filed
Jan 02, 2025
Priority
Dec 21, 2021 — provisional 63/292,052 +1 more
Examiner
NGUYEN, VAN THU T
Art Unit
Tech Center
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
5m
Est. Remaining
89%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
800 granted / 965 resolved
+22.9% vs TC avg
Moderate +6% lift
Without
With
+6.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
25 currently pending
Career history
998
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
46.0%
+6.0% vs TC avg
§102
32.4%
-7.6% vs TC avg
§112
14.7%
-25.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 965 resolved cases

Office Action

§102 §103
DETAILED ACTION The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claims 1-20 are pending and examined. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1, 8, 15 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by US 9,373,402 to Yoo (hereafter Yoo). Regarding independent claim 1, Yoo teaches a memory device comprising: a memory array (FIG. 1: memory cell array 110); and processing logic (FIG. 1: circuit 200), operatively coupled with the memory array, to perform operations comprising: causing a first bias voltage applied to a first dummy wordline of the memory array to be maintained at a first dummy wordline seed voltage during a pre-programming phase, wherein the first dummy wordline is adjacent to a select gate of the memory array (FIG. 12: during T1-T2, applying Vpre2 to dummy word line SWL1 of FIG. 4, wherein SWL1 is adjacent to SST and period T1-T2 is seen as pre-programming phase); and causing, during a programming phase, the first bias voltage to be ramped from the first dummy wordline seed voltage to a first program inhibit bias voltage (FIG. 12: during T2-T3, ramping SWL1 from Vpre2 to Vswl1, wherein period T2-T3 is seen as programming phase). Regarding independent claim 8, Yoo teaches a memory device comprising: a memory array-comprising a select gate (FIG. 4: source select transistors coupled to SSL1/SSL2), and a set of memory cells corresponding to a set of dummy wordlines (FIG. 4: dummy memory cells SMC1 and SMC2 coupled to SWL1 and SWL2, respectively), the set of dummy wordlines comprising a first dummy wordline adjacent to the select gate (FIG. 4: SWL1); and processing logic, operatively coupled with the memory array, to perform operations comprising: causing a first bias voltage applied to the first dummy wordline to be maintained at a first dummy wordline seed voltage during a pre-programming phase (FIG. 12: during T1-T2, applying Vpre2 to dummy word line SWL1, wherein period T1-T2 is seen as pre-programming phase); and causing, during a programming phase, the first bias voltage to be ramped from the first dummy wordline seed voltage to a first program inhibit bias voltage (FIG. 12: during T2-T3, ramping SWL1 from Vpre2 to Vswl1, wherein period T2-T3 is seen as programming phase). Regarding independent claim 15, Yoo teaches a memory device comprising: a memory array (FIG. 1: memory cell array 110); and processing logic (FIG. 1: circuit 200), operatively coupled with the memory array, to perform operations comprising: causing a first bias voltage applied to a first dummy wordline of the memory array to be ramped from a power supply voltage to a first dummy wordline seed voltage during a pre-programming phase, wherein the first dummy wordline is adjacent to a select gate of the memory array (FIG. 12: right after time T1, applying Vpre2 ramping from 0V to dummy word line SWL1 of FIG. 4, wherein SWL1 is adjacent to SST and period T1-T2 is seen as pre-programming phase); causing the first bias voltage to be maintained at the first dummy wordline seed voltage during the pre-programming phase (FIG. 12: during T1-T2, maintaining SWL1 at Vpre2 after the voltage reaches Vpre2); and causing, during a programming phase, the first bias voltage to be ramped from the first dummy wordline seed voltage to a first program inhibit bias voltage (FIG. 12: during T2-T3, ramping SWL1 from Vpre2 to Vswl1, wherein period T2-T3 is seen as programming phase). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 2-4, 9-11, 16-18 are rejected under 35 U.S.C. 103 as being unpatentable over Yoo in view of US 10,777,279 to Lee et al. (hereafter Lee). Yoo teaches, as applied in prior rejection of claim 2, all claimed subject matter except further limitations set forth in the following claim(s). Regarding dependent claims 2-3, Lee teaches a set of dummy wordlines comprises a first dummy wordline adjacent to the select gate (FIG. 9A: dummy wordline DWL1_1’), a second dummy wordline adjacent to the first dummy wordline (FIG. 9A: dummy wordline DWL2_1’), and a third dummy wordline adjacent to the second dummy wordline ((FIG. 9A: dummy wordline DWL3_1’); wherein the first dummy wordline, the second dummy wordline, and the third dummy wordline are connected to memory cells that are not used as data storage elements. Since Yoo and Lee are both from the same field of endeavor, the purpose disclosed by Lee would have been recognized in the pertinent art of Yoo. It would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to realize that number of dummy wordlines in NAND memory block is a design choice. Regarding depend claim 4, Yoo teaches wherein the processing logic is to perform operations further comprising: causing, during the pre-programming phase a second bias voltage applied to the second dummy wordline to be maintained at a second dummy wordline seed voltage (FIG. 12: applying Vpre1 during T1-T2 to dummy word line SWL2 of FIG. 4). It is obvious that if Yoo having a third dummy wordline as suggested by Lee, third bias voltage applied to the third dummy wordline is also maintained at a third dummy wordline seed voltage, respectively. Regarding dependent claims 9-11, 16-18, see rejection applied to claims 2-4 above. Allowable Subject Matter Claims 5-7, 12-14, 19-20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. With respect to dependent claim 5: wherein the processing logic is to perform operations further comprising: causing the second bias voltage and the third bias voltage to each be ramped down to 0 V from the second dummy wordline seed voltage and the third dummy wordline seed voltage, respectively. With respect to dependent claim 12: wherein the processing logic is to perform operations further comprising: causing the second bias voltage and the third bias voltage to each be ramped down to 0 V from the second dummy wordline seed voltage and the third dummy wordline seed voltage, respectively. With respect to dependent claim 19: causing the second bias voltage and the third bias voltage to each be ramped down to 0 V from the second dummy wordline seed voltage and the third dummy wordline seed voltage, respectively. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to VANTHU NGUYEN whose telephone number is (571)272-1881. The examiner can normally be reached M-F: 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Richard Elms can be reached at (571) 272-1869. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. August 17, 2026 /VANTHU T NGUYEN/Primary Examiner, Art Unit 2824
Read full office action

Prosecution Timeline

Jan 02, 2025
Application Filed
Aug 20, 2026
Non-Final Rejection mailed — §102, §103
Sep 29, 2026
Interview Requested

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
89%
With Interview (+6.4%)
2y 2m (~5m remaining)
Median Time to Grant
Low
PTA Risk
Based on 965 resolved cases by this examiner. Grant probability derived from career allowance rate.

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