DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Drawings
The drawings are objected to under 37 CFR 1.83(a). The drawings must show every feature of the invention specified in the claims. Therefore, a radiation imaging apparatus claimed in claim 1 must be shown or the feature(s) canceled from the claim(s). No new matter should be entered.
The drawings are objected to under 37 CFR 1.83(a). The drawings must show every feature of the invention specified in the claims. Therefore, a photon-counting X-ray detector claimed in claim 19 must be shown or the feature(s) canceled from the claim(s). No new matter should be entered.
Corrected drawing sheets in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. Any amended replacement drawing sheet should include all of the figures appearing on the immediate prior version of the sheet, even if only one figure is being amended. The figure or figure number of an amended drawing should not be labeled as “amended.” If a drawing figure is to be canceled, the appropriate figure must be removed from the replacement sheet, and where necessary, the remaining figures must be renumbered and appropriate changes made to the brief description of the several views of the drawings for consistency. Additional replacement sheets may be necessary to show the renumbering of the remaining figures. Each drawing sheet submitted after the filing date of an application must be labeled in the top margin as either “Replacement Sheet” or “New Sheet” pursuant to 37 CFR 1.121(d). If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance.
Specification
The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed.
The following title is suggested: RADIATION IMAGIGN APPARATUS COMPRISING A GUARD REGION AND METHOD FOR LEAKAGE CURRENT REDUCTION IN AN X-RAY DETECTOR.
Claim Objections
Claims 1-11 are objected to because of the following informalities:
(Proposed Amendments) A radiation imaging apparatus, comprising:
a substrate;
at least one radiation-sensitive imaging region in the substrate comprising a plurality of pixels,
wherein each pixel of the plurality of pixels is configured to act as a detector element;
a guard region at or immediately adjacent a cut edge of the substrate,
wherein the guard region collects a leakage current from the cut edge and reduces the leakage current reaching the at least one radiation-sensitive imaging region from the cut edge when the radiation imaging apparatus is in use; and
wherein the at least one radiation-sensitive imaging region is reverse biased with respect to the substrate,
wherein the at least one radiation-sensitive imaging region comprises a portion adjacent the guard region that is closest to where incident radiation impacts the radiation imaging apparatus, and
wherein the plurality of pixels comprises a first pixel electrode located in the portion adjacent the guard region, where a first longitudinal end of the first pixel electrode closest to the guard region is a first distance from the guard region that reduces an amount of the leakage current received by the first pixel electrode relative to if a pixel electrode were located in the portion adjacent the guard region having a second longitudinal end closest to the guard region located at a second distance from the guard region that is less than the first distance.
Appropriate correction is required.
Claims 3 and 4 are objected to because of the following informalities:
3. (Proposed Amendments) The radiation imaging apparatus of claim 2, wherein the first distance ranges between from the guard region.
Appropriate correction is required.
Claim 4 is objected to because of the following informalities:
4. (Proposed Amendments) The radiation imaging apparatus of claim 3, wherein the first distance is 100 micrometers from the guard region.
Appropriate correction is required.
Claim 5 is objected to because of the following informalities:
5. (Proposed Amendments) The radiation imaging apparatus of claim 1,
wherein the substrate comprises a top cut edge, a bottom cut edge opposite the top cut edge, a first side cut edge, and a second side cut edge opposite the first side cut edge,
wherein the first side cut edge and the second side cut edge extend between the top cut edge and the bottom cut edge,
wherein the first distance is greater than a third distance, and
wherein the third distance is a pixel-to-guard ring distance between any pixel electrode of plurality of pixels that is immediately adjacent to [[a]] the portion [[of]] adjacent the guard region (a previously recited limitation in claim 1) that is immediately adjacent to either the first side cut edge or the second side cut edge.
Appropriate correction is required.
Claim 6 is objected to because of the following informalities:
6. (Proposed Amendments) The radiation imaging apparatus of claim 1, wherein the plurality of pixels [[are]] is (refers to the plurality) arranged into a plurality of rows of pixel electrodes that [[are]] is (refers to the plurality) vertically arranged with respect to each other, and each pixel electrode in a top row of pixel electrodes located in the portion adjacent the guard region (a previously recited limitation in claim 1) has a respective longitudinal end closest to the guard region located at the first distance from the guard region.
Appropriate correction is required.
Claim 9 is objected to because of the following informalities:
9. (Proposed Amendments) The radiation imaging apparatus of claim 1, further comprising:
a photon counting X-ray detector.
Appropriate correction is required.
Claims 12-18 are objected to because of the following informalities:
12.(Proposed Amendments) A method of reducing a leakage current in a radiation imaging apparatus, comprising:
providing a substrate with at least one radiation-sensitive imaging region therein,
wherein the at least one radiation-sensitive imaging region comprises a plurality of pixels, and
wherein each pixel of the plurality of pixels is configured to act as a detector element;
forming a guard region in the substrate at or immediately adjacent a cut edge of the substrate to collect a leakage current from the cut edge and to reduce the leakage current reaching the at least one radiation-sensitive imaging region from the cut edge when a radiation imaging apparatus is in use; and
electrically reverse biasing the at least one radiation-sensitive imaging region relative to the substrate,
wherein the at least one radiation-sensitive imaging region comprises a portion adjacent the guard region that is closest to where incident radiation impacts the radiation imaging apparatus, and
wherein the plurality of pixels comprises a first pixel electrode located in the portion adjacent the guard region, where a first longitudinal end of the first pixel electrode closest to the guard region is a first distance from the guard region that reduces an amount of the leakage current received by the first pixel electrode relative to if a pixel electrode were located in the portion adjacent the guard region having a second longitudinal end closest to the guard region located at a second distance from the guard region that is less than the first distance.
Appropriate correction is required.
Claims 14 and 15 are objected to because of the following informalities:
14. (Proposed Amendments) The method of claim 12, wherein the first distance ranges between from the guard region.
Appropriate correction is required.
Claim 15 is objected to because of the following informalities:
15. (Proposed Amendments) The method of claim 14, wherein the first distance is 100 micrometers from the guard region.
Appropriate correction is required.
Claim 16 is objected to because of the following informalities:
16. (Proposed Amendment) The method of claim 12,
wherein the substrate comprises a top cut edge, a bottom cut edge opposite the top cut edge, a first side cut edge, and a second side cut edge opposite the first side cut edge,
wherein the first side cut edge and the second side cut edge extend between the top cut edge and the bottom cut edge,
wherein the first distance is greater than a third distance, and
wherein the third distance is a pixel-to-guard ring distance between any pixel electrode of plurality of pixels that is immediately adjacent to [[a]] the portion [[of]] adjacent the guard region (a previously recited limitation in claim 12) that is immediately adjacent to either the first side cut edge or the second side cut edge.
Appropriate correction is required.
Claim 17 is objected to because of the following informalities:
17. (Proposed Amendments) The method of claim 12, wherein the plurality of pixels are arranged into a plurality of rows of pixel electrodes that [[are]] is (refers to the plurality) vertically arranged with respect to each other, and each pixel electrode in a top row of pixel electrodes located in the portion adjacent the guard region (a previously recited limitation in claim 12) has a respective longitudinal end closest to the guard region located at the first distance from the guard region.
Appropriate correction is required.
Claims 19 and 20 are objected to because of the following informalities:
19. (Proposed Amendments) A photon-counting X-ray detector, comprising:
a plurality of detector sub-modules, wherein each detector sub-module comprises:
a semiconductor layer;
at least one radiation-sensitive imaging region in the semiconductor layer,
wherein the at least one radiation-sensitive imaging region comprises a plurality of pixels, and
wherein each pixel of the plurality of pixels is configured to act as a detector element; and
a guard region at or immediately adjacent a cut edge of the semiconductor layer,
wherein the guard region collects a leakage current from the cut edge and reduces the leakage current reaching the at least one radiation-sensitive imaging region from the cut edge when the photon-counting X-ray detector is in use; and
wherein the at least one radiation-sensitive imaging region is electrically reverse biased with respect to the semiconductor layer,
wherein the at least one radiation-sensitive imaging region comprises a portion adjacent the guard region that is closest to where incident radiation impacts the photon-counting X-ray detector, and
wherein the plurality of pixels comprises a first pixel electrode located in the portion adjacent the guard region, where a first longitudinal end of the first pixel electrode closest to the guard region is a first distance from the guard region that reduces an amount of the leakage current received by the first pixel electrode relative to if a pixel electrode were located in the portion adjacent the guard region having a second longitudinal end closest to the guard region located at a second distance from the guard region that is less than the first distance.
Appropriate correction is required.
Claim 20 is objected to because of the following informalities:
20. (Proposed Amendments) The photon counting X-ray detector of claim 19, wherein the first distance ranges between from the guard region.
Appropriate correction is required.
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION. —The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of pre-AIA 35 U.S.C. 112, second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 7, 8, 19, and 20 are rejected under 35 U.S.C. 112(b) or pre-AIA 35 U.S.C. 112, second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
Claim 7 recites a limitation “the pixel electrode” in line 3, which renders the claim indefinite. There is insufficient antecedent basis for the limitation in the claim.
Claim 7 recites a limitation “the pixel electrode” in line 5, which renders the claim indefinite. There is insufficient antecedent basis for the limitation in the claim.
Claim 8 recites a limitation “the pixel electrode” in line 2, which renders the claim indefinite. There is insufficient antecedent basis for the limitation in the claim.
Claim 19 recites a passive limitation “when the radiation imaging apparatus is in use” in line 11, which renders the claim indefinite. There is insufficient antecedent basis for the limitation in the claim. Furthermore, it is unclear how the passive limitation affect the photon-counting X-ray detector.
Claim 19 recites a passive limitation “the radiation imaging apparatus” in line 15, which renders the claim indefinite. There is insufficient antecedent basis for the limitation in the claim.
The following is a quotation of 35 U.S.C. 112(d):
(d) REFERENCE IN DEPENDENT FORMS. —Subject to subsection (e), a claim in dependent form shall contain a reference to a claim previously set forth and then specify a further limitation of the subject matter claimed. A claim in dependent form shall be construed to incorporate by reference all the limitations of the claim to which it refers.
The following is a quotation of pre-AIA 35 U.S.C. 112, fourth paragraph:
Subject to the following paragraph [i.e., the fifth paragraph of pre-AIA 35 U.S.C. 112], a claim in dependent form shall contain a reference to a claim previously set forth and then specify a further limitation of the subject matter claimed. A claim in dependent form shall be construed to incorporate by reference all the limitations of the claim to which it refers.
Claims 10 and 11 are rejected under 35 U.S.C. 112(d) or pre-AIA 35 U.S.C. 112, 4th paragraph, as being of improper dependent form for failing to further limit the subject matter of the claim upon which it depends, or for failing to include all the limitations of the claim upon which it depends. Claim 10 and 11 recite an intended use instead of an additional limitation. Applicant may cancel the claim(s), amend the claim(s) to place the claim(s) in proper dependent form, rewrite the claim(s) in independent form, or present a sufficient showing that the dependent claim(s) complies with the statutory requirements.
Allowable Subject Matter
The following is a statement of reasons for the indication of allowable subject matter:
With respect to claims 1-6 and 9, Yanoff et al. (U. S. Patent No. 11,389,125 B1) disclosed a radiation imaging apparatus, comprising:
a substrate (72);
at least one radiation-sensitive imaging region in the substrate comprising a plurality of pixels (60),
wherein each pixel of the plurality of pixels is configured to act as a detector element (column 7, lines 4-24); and
a guard region (a guard ring) at or immediately adjacent a cut edge (59) of the substrate,
wherein the guard region collects a leakage current from the cut edge and reduces the leakage current reaching the at least one radiation-sensitive imaging region from the cut edge when the radiation imaging apparatus is in use (column 6, line 52 – column 7, line 3).
However, the prior art failed to disclose or fairly suggested that the radiation imaging apparatus, further comprising:
wherein the at least one radiation-sensitive imaging region is reverse biased with respect to the substrate,
wherein the at least one radiation-sensitive imaging region comprises a portion adjacent the guard region that is closest to where incident radiation impacts the radiation imaging apparatus, and
wherein the plurality of pixels comprises a first pixel electrode located in the portion adjacent the guard region, where a first longitudinal end of the first pixel electrode closest to the guard region is a first distance from the guard region that reduces an amount of the leakage current received by the first pixel electrode relative to if a pixel electrode were located in the portion adjacent the guard region having a second longitudinal end closest to the guard region located at a second distance from the guard region that is less than the first distance.
With respect to claims 12-18, Yanoff et al. (U. S. Patent No. 11,389,125 B1) disclosed a method of reducing a leakage current in a radiation imaging apparatus, comprising:
providing a substrate (72) with at least one radiation-sensitive imaging region therein,
wherein the at least one radiation-sensitive imaging region comprises a plurality of pixels (60), and
wherein each pixel of the plurality of pixels is configured to act as a detector element (column 7, lines 4-24); and
forming a guard region (a guard ring) in the substrate at or immediately adjacent a cut edge (59) of the substrate to collect a leakage current from the cut edge and to reduce the leakage current reaching the at least one radiation-sensitive imaging region from the cut edge when a radiation imaging apparatus is in use (column 6, line 52 – column 7, line 3).
However, the prior art failed to disclose or fairly suggested that the method of reducing a leakage current in a radiation imaging apparatus, further comprising:
electrically reverse biasing the at least one radiation-sensitive imaging region relative to the substrate,
wherein the at least one radiation-sensitive imaging region comprises a portion adjacent the guard region that is closest to where incident radiation impacts the radiation imaging apparatus, and
wherein the plurality of pixels comprises a first pixel electrode located in the portion adjacent the guard region, where a first longitudinal end of the first pixel electrode closest to the guard region is a first distance from the guard region that reduces an amount of the leakage current received by the first pixel electrode relative to if a pixel electrode were located in the portion adjacent the guard region having a second longitudinal end closest to the guard region located at a second distance from the guard region that is less than the first distance.
Conclusion
The prior art made of record and not relied upon is considered pertinent to applicant's disclosure.
Rao et al. (U. S. Patent No. 12,702,369 B2) disclosed active pixel sensors for photon-counting X-ray detectors.
Yanoff et al. (U. S. Patent No. 12,493,128 B2) disclosed a medical imaging detector.
Bakowski Holtryd et al. (U. S. Patent No. 11,888,015 B2) disclosed an X-ray sensor comprising a field limiting ring configuration.
Yanoff et al. (U. S. Patent No. 11,389,125 B2) disclosed a system and a method for mitigating trace triggering of channels in an X-ray detector.
Hjärn et al. (U. S. Patent No. 11,054,532 B2) disclosed a design of an X-ray detector system.
Danielsson et al. (U. S. Patent No. 11,041,968 B2) disclosed an edge-on photon-counting detector.
Kakushima et al. (U. S. Patent No. 10,964,836 B2) disclosed a radiological inspection device comprising photon-counting radiation detector.
Bakowski Holtryd et al. (U. S. Patent No. 10,813,607 B2) disclosed an X-ray imaging system comprising an X-ray sensor, a method for constructing an X-ray sensor.
Shahar et al. (U. S. Patent No. 10,156,645 B2) disclosed systems and methods for a determination of locations of a sub-pixels at sidewalls and corners of detectors.
Shahar et al. (U. S. Patent No. 10,147,826 B2) disclosed a radiation detector comprising pixelated anode strip-electrodes.
Danielsson et al. (U. S. Patent No. 10,126,437 B1) disclosed a detector for X-ray imaging.
Bakowski Holtryd et al. (U. S. Patent No. 10,074,685 B1) disclosed an x-ray imaging system comprising an X-ray detector system.
Wieczorek et al. (U. S. Patent No. 9,753,152 B2) disclosed a scintillation semiconductor detector.
Schwarzman et al. (U. S. Patent No. 8,927,937 B2) disclosed a detection of ionizing radiation.
Tkaczyk et al. (U. S. Patent No. 7,916,836 B2) disclosed an apparatus and a method for flexibly beginning energy-discriminating data.
Tkaczyk et al. (U. S. Patent No. 7,606,347 B2) disclosed a photon-counting X-ray detector with an overrange logic control.
Hoffman et al. (U. S. Patent No. 7,260,174 B2) disclosed a direct-conversion energy-discriminating CT detector with an over-ranging correction.
Any inquiry concerning this communication or earlier communications from the examiner should be directed to Allen C. Ho, whose telephone number is (571) 272-2491. The examiner can normally be reached Monday - Friday 10AM - 6PM.
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If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, David J. Makiya, can be reached at (571) 272-2273. The fax phone number for the organization where this application or proceeding is assigned is (571) 273-8300.
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Allen C. Ho, Ph.D.
Primary Examiner
Art Unit 2884
/Allen C. Ho/Primary Examiner, Art Unit 2884 Allen.Ho@uspto.gov
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