Prosecution Insights
Last updated: August 17, 2026
Application No. 19/015,452

DETECTION SYSTEM AND DETECTION METHOD THEREOF

Non-Final OA §112
Filed
Jan 09, 2025
Priority
Oct 09, 2024 — TW 113138508
Examiner
MILLER, DANIEL R
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Industrial Technology Research Institute
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
688 granted / 834 resolved
+14.5% vs TC avg
Strong +21% interview lift
Without
With
+20.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
26 currently pending
Career history
856
Total Applications
across all art units

Statute-Specific Performance

§101
4.1%
-35.9% vs TC avg
§103
48.3%
+8.3% vs TC avg
§102
19.5%
-20.5% vs TC avg
§112
24.4%
-15.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 834 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 The following is a quotation of the first paragraph of 35 U.S.C. 112(a): (a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention. The following is a quotation of the first paragraph of pre-AIA 35 U.S.C. 112: The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor of carrying out his invention. Claims 1-10 are rejected under 35 U.S.C. 112(a) or 35 U.S.C. 112 (pre-AIA ), first paragraph, because the specification, while being enabling for obtaining a first mixing frequency light that uses a beat frequency, i.e., a first frequency f1=ν1−ν2, and a second mixing frequency light that uses a beat frequency, i.e., a second frequency f2=ν2−ν3, and subsequently using the beat frequency of the first mixing frequency light as input to a photoconductive semiconductor switch coupled to the object to be tested in order to cause the object to output a mixing frequency signal, does not reasonably provide enablement for performing this function/process using non-beat frequency optical/light signals. The specification does not enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the invention commensurate in scope with these claims. Claim 1 recites: A detection system for detecting a bandwidth of an object to be tested, the detection system comprising: a frequency-tunable laser module for providing a first mixing frequency light and a second mixing frequency light, wherein there is a phase difference or a frequency difference between the first mixing frequency light and the second mixing frequency light; a photoconductive semiconductor switch for receiving the first mixing frequency light, wherein the object to be tested receives the second mixing frequency light, and the photoconductive semiconductor switch and the object to be tested are coupled to output a mixing frequency signal; and a digital acquisition system for receiving the mixing frequency signal to detect the bandwidth of the object to be tested. Regarding the language “a frequency-tunable laser module for providing a first mixing frequency light and a second mixing frequency light, wherein there is a phase difference or a frequency difference between the first mixing frequency light and the second mixing frequency light” and “a photoconductive semiconductor switch for receiving the first mixing frequency light, wherein the object to be tested receives the second mixing frequency light, and the photoconductive semiconductor switch and the object to be tested are coupled to output a mixing frequency signal”, this language has a scope in which the first mixing frequency light and the second mixing frequency light are single-frequency optical/light signals to be used for mixing. However, the specification discloses at paragraphs 23-24, for example: [0023] The frequency-tunable laser module 100A may include, for instance, a first light source 101, a second light source 102, and a third light source 103. Each of the first light source 101, the second light source 102, and the third light source 103 may be a continuous wave (CW) laser source, respectively, while the number of light sources should not be construed as a limitation in the disclosure. Besides, at least one of the first light source 101, the second light source 102, and the third light source 103 may be a frequency tunable laser source, so as to provide frequency-tunable mixing frequency laser. For instance, a tunable frequency range of a wavelength of the laser emitted by the frequency-tunable laser module 100A may be greater than or equal to 200 GHz, which should not be construed as a limitation in the disclosure. The frequency-tunable laser module 100A may further include a light frequency mixer 104 configured to mix a frequency of a light beam emitted by the first light source 101 (for instance, with a frequency of ν1) and a frequency of a light beam emitted by the second light source 102 (for instance, with a frequency of ν2), so as to generate a first mixing frequency light L1 using the beat frequency, i.e., the first frequency f1=ν1−ν2. Similarly, the light frequency mixer 104 may also be configured to mix the frequency of the light beam emitted by the second light source 102 and a frequency of a light beam emitted by the third light source 103 (for instance, with a frequency of ν3), so as to generate a second mixing frequency light L2 using the beat frequency, i.e., the second frequency f2=ν2−ν3. The frequency-tunable laser module 100A may further include a light splitter or a reflective lens assembly (both not shown) configured to provide the first mixing frequency light L1 and the second mixing frequency light L2 to the photoconductive semiconductor switch 110 and the first object to be tested DO1 respectively, which should not be construed as a limitation in the disclosure. In some embodiments, the first frequency f1 and the second frequency f2 may fall within the terahertz (THz) frequency band, which should not be construed as a limitation in the disclosure. [0024] The photoconductive semiconductor switch 110 (PCSS) is a high-speed semiconductor switch device that controls the generation and recombination of electrons and holes in a semiconductor material of the photoconductive semiconductor switch 110 through light, so as to switch on or switch off the photoconductive semiconductor switch 110. Compared to conventional high-voltage switch elements, the photoconductive semiconductor switch 110 has advantages of a simple structure easy for integration, a small inductance coefficient, fast response speed, high precision, a high repetition rate, good compatibility, and so forth, so as to meet various requirements including fast response speed and reliability. Furthermore, the photoconductive semiconductor switch 110 may be a coplanar waveguide structure. The detection system 1A may provide an electrical signal (not shown) to the photoconductive semiconductor switch 110 and the first mixing frequency light L1 with the first frequency f1, so that the photoconductive semiconductor switch 110 outputs a first electrical signal ES1 with the first frequency f1 in substance. In other words, the specification appears to teach a first mixing frequency light that uses a beat frequency, i.e., the first frequency f1=ν1−ν2, and a second mixing frequency light that uses a beat frequency, i.e., the second frequency f2=ν2−ν3, and that the first mixing frequency light with the beat frequency f1 is provided as input to the photoconductive semiconductor switch such that the switch outputs the first electrical signal ES1 having the beat frequency f1 to the tested object. The scope of claim 1 appears to be considerably broader than the scope of the disclosure because the terms “a first mixing frequency light” and “a second mixing frequency light” each have a scope that includes not only beat frequency optical/light signals, but also non-beat frequency optical/light signals, e.g., single-frequency optical/light signals to be used for mixing. The question of whether one skilled in the art could make and use the entire scope of the invention of claim 1 without undue experimentation is now considered in light of so-called Wands factors. See MPEP 2164.01(a). The nature of the invention is drawn to detecting/characterizing the bandwidth of an object to be tested, e.g., photonic elements such as electro-optic modulators, photodiodes and optical transistors. Although levels of ordinary skill and predictability in the field of photonic element testing/characterization is generally high, the scope of claim 1 is considerably broader than the scope of the disclosure because the claim encompasses the use of non-beat frequency optical/light signals, e.g., single-frequency optical/light signals, as a basis for determining the bandwidth of the tested object. At the time of the application was filed, one of ordinary skill in the art would have been aware of various techniques for characterizing/extracting parameters, e.g., bandwidth, frequency response, of photonic elements. Although the present specification provides direction and guidance regarding obtaining a first mixing frequency light that uses a beat frequency, i.e., the first frequency f1=ν1−ν2, and a second mixing frequency light that uses a beat frequency, i.e., the second frequency f2=ν2−ν3, and, for example, subsequently using the beat frequency of the first mixing frequency light as input to a photoconductive semiconductor switch coupled to the object to be tested in order to cause the object to output a mixing frequency signal, the specification is not understood to provide any direction or guidance regarding how this is accomplishable using non-beat frequency optical/light signals, e.g., single-frequency optical/light signals to be used for mixing. Weighing the above-identified factors, particularly the breadth of the claim with respect to the disclosure and the amount of direction and guidance provided, the examiner concludes that one skilled in the art could only make the entire scope of the claimed invention by resorting to undue experimentation. Claim 1 is therefore rejected under 35 U.S.C. 112(a) because the scope of enablement provided to one skilled in the art by the disclosure is not commensurate with the scope of protection sought by the claims. Because none of dependent claims 2-5 appear to address these deficiencies, claims 2-5 are rejected under 35 U.S.C. 112(a), scope of enablement, by virtue of their dependence from claim 1. Independent claim 6 and claims 7-10 depending therefrom are rejected under 35 U.S.C. 112(a) scope of enablement for the analogous reason. The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1-10 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 1 recites, in part, “a photoconductive semiconductor switch for receiving the first mixing frequency light, wherein the object to be tested receives the second mixing frequency light, and the photoconductive semiconductor switch and the object to be tested are coupled to output a mixing frequency signal”. Regarding the language “the photoconductive semiconductor switch and the object to be tested are coupled to output a mixing frequency signal”, it is not sufficiently clear where the mixing frequency signal is output from. For example, is the mixing frequency signal output from the photoconductive semiconductor switch, the object to be tested, or from some other component. Similarly, independent claim 6 recites “outputting a mixing frequency signal by the photoconductive semiconductor switch and the object to be tested after the photoconductive semiconductor switch and the object to be tested are coupled”, but it not sufficiently clear where the mixing frequency signal is output from. In this regard, the examiner notes that it would appear that the mixing frequency signal could be output from either the photoconductive semiconductor switch or the object to be tested, but not from both. Clarification is required so that the scope of the claim is clear. Claims 2-5 and 7-10 are rejected under 35 U.S.C. 112(b) by virtue of their dependence from claims 1 and 6, respectively. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. X. Chen et al., "Characterization of electro-optic bandwidth of ultra-high speed modulators," 2017 Optical Fiber Communications Conference and Exhibition (OFC), Los Angeles, CA, USA, 2017, pp. 1-3 relates to a method for measuring the bandwidth of electro-optic modulators up to 100 GHz using an RF synthesizer, a Mach-Zehnder modulator, a photodiode, and an optical spectrum analyzer. US 6,864,986 to Nyman relates to a mixed frequency-based method and arrangement for characterizing an electro-optic modulator. US 2006/0279272 to Huhse et al. relates to a method for determining the frequency response of an electrooptical component, particularly, for example, of a light-generating or light-modulating component. Any inquiry concerning this communication or earlier communications from the examiner should be directed to DANIEL R MILLER whose telephone number is (571)270-1964. The examiner can normally be reached 9AM-5PM EST M-F. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lee Rodak, can be reached at 571-270-5628. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DANIEL R MILLER/Primary Examiner, Art Unit 2858
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Prosecution Timeline

Jan 09, 2025
Application Filed
Jul 15, 2026
Non-Final Rejection mailed — §112 (current)

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
99%
With Interview (+20.9%)
2y 7m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 834 resolved cases by this examiner. Grant probability derived from career allowance rate.

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