Prosecution Insights
Last updated: October 02, 2026

Examiner: MILLER, DANIEL R

Tech Center 2800 • Art Units: 2858 2863 2866

This examiner grants 83% of resolved cases

Analysis

Daniel R. Miller works in Tech Center 2800 and Art Unit 2858, where he has overseen 838 resolved cases. His allowance rate is 82.6%, which is quite high and favorable for applicants. The median days to allowance is 940, providing a standard timeframe for prosecution in this unit and helping practitioners manage expectations.

The interview lift is 20.8%, which is a strong indicator that verbal engagement is effective for securing grants. This lift suggests that the probability of allowance increases significantly above the 82.6% baseline when an interview is conducted. For practitioners, this means that even with a high initial success rate, an interview can further secure a positive result in Art Unit 2858.

With 838 resolved cases, the data for Miller is very robust and reliable. The 940-day median pendency and 82.6% allowance rate suggest a predictable and relatively efficient environment in Tech Center 2800. The 20.8% interview lift is a key tactical advantage that should be utilized to resolve any remaining issues and expedite the grant process.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

82.6%
Allow Rate
+14.6% vs TC avg
857
Total Applications
+20.8%
Interview Lift
940
Avg Prosecution Days
Based on 838 resolved cases, 2023–2026

Rejection Statute Breakdown

4.0%
§101 Eligibility
19.1%
§102 Novelty
48.5%
§103 Obviousness
24.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18751902 TEMPERATURE ANALYSIS Final Rejection The Regents of the University of Michigan
18765162 SYSTEM AND METHOD FOR ARCING AND IONIZATION DETECTION IN BATTERIES Final Rejection SAMSUNG SDI CO., LTD.
18784126 Redundant Electrical Ground Supply System Non-Final OA Aptiv Technologies AG
18948432 PROBE NEEDLE, PROBE CARD STRUCTURE AND METHOD OF TESTING A DEVICE UNDER TEST Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
19088890 CURRENT SENSOR AND CURRENT MEASUREMENT DEVICE Non-Final OA Asahi Kasei Microdevices Corporation
18848776 METHOD AND APPARATUS FOR TESTING A PACKAGING SUBSTRATE Non-Final OA Applied Materials, Inc.
18953161 CAPACITANCE SENSOR FOR ENVIRONMENTAL DETECTION DEVICE Non-Final OA Microchip Technology Incorporated
18921786 Ion Analyzer and Ion Analyzing Method Non-Final OA SHIMADZU CORPORATION
19050677 TEMPERATURE COMPENSATION FOR CURRENT TRANSFORMER METERING Non-Final OA Schneider Electric USA, Inc.
18666211 METHOD, OPTICAL SYSTEM, TEST DEVICE AND ARRANGEMENT Non-Final OA Carl Zeiss SMT GmbH
19015452 DETECTION SYSTEM AND DETECTION METHOD THEREOF Non-Final OA Industrial Technology Research Institute
18544873 ELECTRONIC CIRCUIT FOR DETERMINING THE CHARGING STATE OF A BATTERY CELL Final Rejection LISA DRÄXLMAIER GMBH
19059123 ELECTRICAL CONNECTION APPARATUS Non-Final OA Kabushiki Kaisha Nihon Micronics
18816814 SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM Non-Final OA ADVANTEST Corporation
18104193 METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING Final Rejection Advantest Corporation
18663263 CURRENT SENSOR SYSTEMS Final Rejection Allegro MicroSystems, LLC

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