Tech Center 2800 • Art Units: 2858 2863 2866
This examiner grants 83% of resolved cases
Daniel R. Miller works in Tech Center 2800 and Art Unit 2858, where he has overseen 838 resolved cases. His allowance rate is 82.6%, which is quite high and favorable for applicants. The median days to allowance is 940, providing a standard timeframe for prosecution in this unit and helping practitioners manage expectations.
The interview lift is 20.8%, which is a strong indicator that verbal engagement is effective for securing grants. This lift suggests that the probability of allowance increases significantly above the 82.6% baseline when an interview is conducted. For practitioners, this means that even with a high initial success rate, an interview can further secure a positive result in Art Unit 2858.
With 838 resolved cases, the data for Miller is very robust and reliable. The 940-day median pendency and 82.6% allowance rate suggest a predictable and relatively efficient environment in Tech Center 2800. The 20.8% interview lift is a key tactical advantage that should be utilized to resolve any remaining issues and expedite the grant process.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18751902 | TEMPERATURE ANALYSIS | Final Rejection | The Regents of the University of Michigan |
| 18765162 | SYSTEM AND METHOD FOR ARCING AND IONIZATION DETECTION IN BATTERIES | Final Rejection | SAMSUNG SDI CO., LTD. |
| 18784126 | Redundant Electrical Ground Supply System | Non-Final OA | Aptiv Technologies AG |
| 18948432 | PROBE NEEDLE, PROBE CARD STRUCTURE AND METHOD OF TESTING A DEVICE UNDER TEST | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 19088890 | CURRENT SENSOR AND CURRENT MEASUREMENT DEVICE | Non-Final OA | Asahi Kasei Microdevices Corporation |
| 18848776 | METHOD AND APPARATUS FOR TESTING A PACKAGING SUBSTRATE | Non-Final OA | Applied Materials, Inc. |
| 18953161 | CAPACITANCE SENSOR FOR ENVIRONMENTAL DETECTION DEVICE | Non-Final OA | Microchip Technology Incorporated |
| 18921786 | Ion Analyzer and Ion Analyzing Method | Non-Final OA | SHIMADZU CORPORATION |
| 19050677 | TEMPERATURE COMPENSATION FOR CURRENT TRANSFORMER METERING | Non-Final OA | Schneider Electric USA, Inc. |
| 18666211 | METHOD, OPTICAL SYSTEM, TEST DEVICE AND ARRANGEMENT | Non-Final OA | Carl Zeiss SMT GmbH |
| 19015452 | DETECTION SYSTEM AND DETECTION METHOD THEREOF | Non-Final OA | Industrial Technology Research Institute |
| 18544873 | ELECTRONIC CIRCUIT FOR DETERMINING THE CHARGING STATE OF A BATTERY CELL | Final Rejection | LISA DRÄXLMAIER GMBH |
| 19059123 | ELECTRICAL CONNECTION APPARATUS | Non-Final OA | Kabushiki Kaisha Nihon Micronics |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | Non-Final OA | ADVANTEST Corporation |
| 18104193 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING | Final Rejection | Advantest Corporation |
| 18663263 | CURRENT SENSOR SYSTEMS | Final Rejection | Allegro MicroSystems, LLC |
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