Prosecution Insights
Last updated: October 02, 2026
Application No. 19/021,901

METHOD FOR SELECTIVE DEPOSITION OF METAL LAYER

Non-Final OA §102§103§112
Filed
Jan 15, 2025
Priority
Jun 04, 2024 — RE 10-2024-0073185
Examiner
CHEN, BRET P
Art Unit
1718
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Kyung Hee University Industry Cooperation Group
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allowance Rate
975 granted / 1154 resolved
+19.5% vs TC avg
Strong +16% interview lift
Without
With
+16.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
37 currently pending
Career history
1178
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
52.4%
+12.4% vs TC avg
§102
7.1%
-32.9% vs TC avg
§112
27.7%
-12.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1154 resolved cases

Office Action

§102 §103 §112
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . DETAILED ACTION Claims 1-20 are pending in this application. Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 3, 7-8, 14, 18, 20 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. In claim 3 line 5, the phrase “stabilizing reactants” lacks antecedent basis and/or is confusing as to where the reactants are. The same issue applies to claim 14. In claim 7 line 2, the phrase “the reactants include Ar” is deemed confusing as to whether an inert gas such as argon can be a reactant. The same issue applies to claim 8, 18, 20. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim 1-2, 11-13 are rejected under 35 U.S.C. 102(a)(2) as being clearly anticipated by Nakabayashi et al. (6,271,077). Nakabayashi teaches a thin film deposition method (title) in which iridium of iridium oxide is selectively deposited on a substrate having a first region and a second region (col.7 lines 6-17, col.31 lines 7-9). Specifically, the two regions can include having a first region of silicon oxide and a second region of TiN (col.32 lines 5-8). It is noted that iridium meets the limitation of a metal layer and the substrate having two regions of silicon oxide and TiN meet the claimed limitation of including silicon and transition metal nitride, respectively. Regarding claim 2, Nakabayashi teaches etching (col.11 line 46 – col.12 line 22). Regarding claim 11, Nakabayashi teaches titanium nitride which includes titanium (col.32 lines 5-8). Regarding claim 12, Nakabayashi teaches titanium nitride (col.32 lines 5-8). In independent claim 13, the applicant requires etching and selective depositing on the transition metal. Nakabayashi teaches etching (col.11 line 46 – col.12 line 22) and depositing iridium on TiN (col.30 lines 61-67). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claims 3-10, 14-20 are rejected under 35 U.S.C. 103 as being unpatentable over Nakabayashi et al. (6,271,077) in view of Liu et al. (2019/0078203). Nakabayashi teaches a thin film deposition method (title) in which iridium or iridium oxide is selectively deposited on a substrate having a first region and a second region (col.7 lines 6-17, col.31 lines 7-9). Specifically, the two regions can include having a first region of silicon oxide and a second region of TiN (col.32 lines 5-8). However, the reference fails to teach a plurality of cycles including purging. Liu teaches low temperature deposition of iridium containing films (title) by reacting iridium hexafluoride and a reactant to form iridium metal or iridium silicide films (abstract). In one embodiment, an atomic layer deposition process is used to deliver a first precursor and purge followed by a second precursor and purge and repeated (0009). To utilize an ALD process to form iridium films in Nakabayashi would have been obvious with the expectation of success because Liu teaches of forming iridium films by an ALD process. Regarding claim 4, the applicant requires a specific cobalt precursor. Liu teaches a gaseous cobalt precursor (0044). To utilize the claimed precursor would have been obvious in the absence of a showing of unexpected results. Regarding claim 5, Liu teaches nitrogen (0064). Regarding claim 6, the applicant requires a specific cobalt precursor. Liu teaches a gaseous cobalt precursor (0044). To utilize the claimed precursor would have been obvious in the absence of a showing of unexpected results. Regarding claim 7, Liu teaches hydrogen (0063-0064). Regarding claim 8, Liu teaches hydrogen (0063-0064). Regarding claim 9, Liu teaches plasma treating (0023). Regarding claim 10, Liu teaches hydrogen plasma (0025). Regarding claim 14, Liu teaches an atomic layer deposition process which delivers a first precursor and purge followed by a second precursor and purge and repeated (0009). Regarding claim 15, the applicant requires a specific cobalt precursor. Liu teaches a gaseous cobalt precursor (0044). To utilize the claimed precursor would have been obvious in the absence of a showing of unexpected results. Regarding claim 16, Liu teaches nitrogen (0064). Regarding claim 17, the applicant requires a specific cobalt precursor. Liu teaches a gaseous cobalt precursor (0044). To utilize the claimed precursor would have been obvious in the absence of a showing of unexpected results. Regarding claim 18, Liu teaches hydrogen (0063-0064). Regarding claim 19, Liu teaches plasma treating (0023). Regarding claim 20, Liu teaches hydrogen plasma (0025). Relevant Art The following references has been cited as relevant art. In general, it is well known to selectively deposit metal films on silicon substrate as noted in Wilson et al. (4,741,928). It is also well known to selectively deposit a metal layer on a silicon substrate to form a metal silicide as noted in Dordi et al. (2007/0292615). With respect to transition metal substrate regions, it is well known to selectively deposit a metal layer on a substrate which includes silicon or metal as noted in TW 411571. It is also well known to selectively deposit on copper metal layers of the substrate as noted in KR 2017-0138954. Any inquiry concerning this communication or earlier communications from the examiner should be directed to BRET CHEN whose telephone number is (571)272-1417. The examiner can normally be reached M-F 8:30-8:30 MT. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Gordon Baldwin can be reached at (571) 272-5166. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /BRET P CHEN/Primary Examiner, Art Unit 1718 09/21/2026
Read full office action

Prosecution Timeline

Jan 15, 2025
Application Filed
Sep 24, 2026
Non-Final Rejection mailed — §102, §103, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12741913
DISPERSION OF FILAMENTS
2y 11m to grant Granted Sep 22, 2026
Patent 12740350
SUBSTRATE PROCESSING METHOD
3y 4m to grant Granted Sep 15, 2026
Patent 12735787
GROUP 2 METAL CONTAINING FILM FORMING COMPOSITIONS AND VAPOR DEPOSITION OF THE FILMS USING THE SAME
2y 8m to grant Granted Sep 15, 2026
Patent 12724349
MONODISPERSE GRANULAR FILM, METHOD FOR FORMING THE MONODISPERSE GRANULAR FILM, SOLAR CELL, METHOD FOR PREPARING THE SOLAR CELL, AND PHOTOVOLTAIC MODULE
2y 7m to grant Granted Sep 01, 2026
Patent 12716127
APPARATUS AND METHOD FOR PRODUCING DOPED DIAMOND LAYERS
2y 5m to grant Granted Aug 25, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
99%
With Interview (+16.4%)
2y 7m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1154 resolved cases by this examiner. Grant probability derived from career allowance rate.

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