Prosecution Insights
Last updated: October 01, 2026
Application No. 19/040,058

INSPECTION APPARATUS, METHOD OF INSPECTION USING THE INSPECTION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURED USING THE INSPECTION APPARATUS

Non-Final OA §102
Filed
Jan 29, 2025
Priority
May 21, 2024 — RE 10-2024-0065830
Examiner
KO, TONY
Art Unit
Tech Center
Assignee
Samsung Display Co., Ltd.
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
8m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
788 granted / 897 resolved
+27.8% vs TC avg
Minimal +3% lift
Without
With
+2.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
17 currently pending
Career history
907
Total Applications
across all art units

Statute-Specific Performance

§101
1.6%
-38.4% vs TC avg
§103
29.4%
-10.6% vs TC avg
§102
46.2%
+6.2% vs TC avg
§112
19.7%
-20.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 897 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 9 and 15 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Kobayashi et al (US 12487082). Regarding claim 1, Kobayashi et al teach (Figs. 1-13) An inspection apparatus comprising: a light-emitting part (30) that emits light; a first align key (fiducial mark) attached to one side of the light-emitting part; a light-receiving part which is spaced apart (20) from the light-emitting part in a first direction and receives the light emitted from the light-emitting part; and a camera (24) which is attached to one side of the light-receiving part (20), is spaced apart from the first align key in the first direction, and captures the first align key. Regarding claim 9, Kobayashi et al teach a stage (11) accommodating a substrate between the light-emitting part and the light-receiving part. Regarding claim 15, Kobayashi et al teach an inspection apparatus comprising: a light-emitting part (30) that emits light; a camera (24) attached to one side of the light-emitting part; a light-receiving part (20) which is spaced apart from the light-emitting part in a first direction and receives the light emitted from the light-emitting part; an align key (fiducial mark) attached to one side of the light-receiving part and spaced apart from the camera in the first direction; and a stage (11) accommodating a substrate between the light-emitting part and the light-receiving part. Allowable Subject Matter Claims 2-8, 10-14 and 16 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim 17 is allowed. The following is an examiner’s statement of reasons for allowance: An electronic device comprising: a display module; and a processor configured to drive the display module, and wherein the display module is manufactured by an inspection apparatus including: a light-emitting part that emits light; a first align key attached to one side of the light-emitting part; a light-receiving part which is spaced apart from the light-emitting part in a first direction and receives the light emitted from the light-emitting part; and a camera which is attached to one side of the light-receiving part, is spaced apart from the first align key in the first direction, and captures the first align key.. Any comments considered necessary by applicant must be submitted no later than the payment of the issue fee and, to avoid processing delays, should preferably accompany the issue fee. Such submissions should be clearly labeled “Comments on Statement of Reasons for Allowance.” Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY KO whose telephone number is (571)272-1926. The examiner can normally be reached Monday-Friday 9-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Georgia Epps can be reached at 571-272-2328. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY KO/Primary Examiner, Art Unit 2878 TK
Read full office action

Prosecution Timeline

Jan 29, 2025
Application Filed
Jun 11, 2026
Non-Final Rejection mailed — §102
Sep 03, 2026
Interview Requested
Sep 09, 2026
Applicant Interview (Telephonic)
Sep 10, 2026
Examiner Interview Summary

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12742634
DIMENSION MEASUREMENT APPARATUS
2y 0m to grant Granted Sep 22, 2026
Patent 12736401
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1y 10m to grant Granted Sep 15, 2026
Patent 12736472
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING AND IMAGE ANALYSIS
1y 7m to grant Granted Sep 15, 2026
Patent 12729948
METHOD TO DETERMINE AN ABSOLUTE POSITION OF A MOVABLE OBJECT, INTERFEROMETER SYSTEM, PROJECTION SYSTEM AND LITHOGRAPIC APPARATUS
1y 9m to grant Granted Sep 08, 2026
Patent 12723913
PHOTODETECTORS FOR MEASURING REAL-TIME OPTICAL IRRADIANCE
1y 8m to grant Granted Sep 01, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
90%
With Interview (+2.6%)
2y 4m (~8m remaining)
Median Time to Grant
Low
PTA Risk
Based on 897 resolved cases by this examiner. Grant probability derived from career allowance rate.

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