Prosecution Insights
Last updated: October 02, 2026
Application No. 19/047,624

MEMORY APPARATUS AND OPERATION METHOD OF MEMORY APPARATUS

Non-Final OA §112
Filed
Feb 07, 2025
Priority
Oct 28, 2024 — RE 10-2024-0148434
Examiner
NGUYEN, VIET Q
Art Unit
2827
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
SK hynix Inc.
OA Round
1 (Non-Final)
95%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 95% — above average
95%
Career Allowance Rate
1207 granted / 1269 resolved
+27.1% vs TC avg
Minimal +4% lift
Without
With
+3.5%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 8m
Avg Prosecution
16 currently pending
Career history
1282
Total Applications
across all art units

Statute-Specific Performance

§101
1.8%
-38.2% vs TC avg
§103
27.2%
-12.8% vs TC avg
§102
34.3%
-5.7% vs TC avg
§112
23.8%
-16.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1269 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . 1. Claims 1-17 are present for examination. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. 2. Claims 11 & 12 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 11, line 3, the term “the sensing latch” lacks a proper antecedent basis because there are more than one sensing latch recited in the parent claim 9 (line 5). What particular sensing latch does it refer to? Otherwise, it should be revised as “the at least one sensing latch” for sake of clarity and consistency with its parent claim 9. Claim 13, line 4, similarly the term “the data latch” lacks a proper antecedent basis because there are more than one data latch recited in the parent claim 9 (line 12). What particular data latch does it refer to? Otherwise, it should be revised as “the at least one data latch” for sake of clarity and consistency with its parent claim 9. . Allowable Subject Matter 3. Except for the outstanding 112 issues raised above, all the pending claims contain allowable subject matter over the prior arts of record as follows: - The independent claims 1, 9 & 15 recite detail limitations for a memory device including novel usage of a data counting circuit configured to perform a counting operation based on the voltage control signal and stop the counting operation based on the sensing detection signal and provide a page buffer with a counting value according to the counting operation. Additionally, all their remaining dependent claims also add further limitations to the recited operation above, which together they are all neither suggested nor seen elsewhere at this time. 4. Any inquiry concerning this communication or earlier communications from the examiner should be directed to VIET Q NGUYEN whose telephone number is (571)272-1788. The examiner can normally be reached M-F 7:30-3PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Amir Zarabian can be reached at 571-272-1852. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /VIET Q NGUYEN/Primary Examiner, Art Unit 2827
Read full office action

Prosecution Timeline

Feb 07, 2025
Application Filed
Sep 18, 2026
Non-Final Rejection mailed — §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12743279
An Apparatus and Method of Generating Chip Select Signals
4y 1m to grant Granted Sep 22, 2026
Patent 12745571
SCALABLE SPINTRONIC DEVICES FORMED ON SILICON WAFERS
2y 7m to grant Granted Sep 22, 2026
Patent 12738306
MAGNETIC TUNNEL JUNCTION WITH DUAL REFERENCE LAYERS HAVING PARALLEL MAGNETIZATION DIRECTIONS AND METHODS FOR OPERATING THE SAME
2y 6m to grant Granted Sep 15, 2026
Patent 12727158
READ-ONLY MEMORY DEVICE AND METHOD
3y 0m to grant Granted Sep 01, 2026
Patent 12725667
MEMORY DEVICE AND CONTROL METHOD THEREOF
2y 0m to grant Granted Sep 01, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
95%
Grant Probability
99%
With Interview (+3.5%)
1y 8m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1269 resolved cases by this examiner. Grant probability derived from career allowance rate.

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