Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
DETAILED ACTION
Claim Rejections - 35 USC § 112
1. The following is a quotation of the first paragraph of 35 U.S.C. 112(a):
(a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention.
The following is a quotation of the first paragraph of pre-AIA 35 U.S.C. 112:
The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor of carrying out his invention.
2. Claims 1-3 are rejected under 35 U.S.C. 112(a) or pre-AIA 35 U.S.C. 112, first paragraph, as based on a disclosure which is not enabling. The disclosure does not enable one of ordinary skill in the art to practice the invention without second voltage values and second datum, which is/are critical or essential to the practice of the invention but not included in the claim(s). See In re Mayhew, 527 F.2d 1229, 188 USPQ 356 (CCPA 1976). In claim 1, the claim described first datum with first read command and adjusted second supply voltage value, then generating second read command for reading a third datum. The second datum is missing in the process and the office is confused how did the process of testing jump from first to third datum, where is the second datum? What does second do in the process of testing. Please amend or fix.
Allowable Subject Matter
3. Claims 6-19 are allowed.
4. With respect to independent claim 6, there is no teaching, suggestion, or motivation for combination in the prior art to wherein the list includes a plurality of voltage values and an order of the voltage values is according to failure probabilities of the memory device operated by the voltage values;performing a first read operation to the memory device to get a first read datum;2 after performing the first read operation, directly operating the memory device with a second voltage set different to the first voltage set and performing a second read operation to the memory device to get a second read datum according to the order, wherein the second voltage set is in the list; and comparing the write datum and the second read datum for a test result.
5. With respect to dependent claims 7-11, since these claims are depending on claim 6, therefore claims 7-11 are allowable subject matter.
6. With respect to independent claim 12, there is no teaching, suggestion, or motivation for combination in the prior art to (a) generating a first list of voltage values, wherein the first list includes a plurality of voltage values, and an order of the voltage values is according to fa lure probabilities of a memory device operated by the voltage values; (b) setting a supply voltage of the memory device according to the first list; (c) performing a first write operation of a first write datum to the memory device; (d) reading the memory device; (e) changing a value of the supply voltage according to the first list and reading the memory device; and (f) repeating the operation (e) according to the first list to determine whether the memory device has a defect.
7. With respect to dependent claims 13-19, since these claims are depending on claim 12, therefore claims 13-19 are allowable subject matter.
8. Claims 4-5 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims.
9. With respect to independent claim 4, there is no teaching, suggestion, or motivation for combination in the prior art to generate the first read command for reading a second datum from the memory device and compare the first datum and the second datum; and determine whether the memory device meets a rule according to a comparison of the first datum and the second datum and the comparison of the first datum and the third datum.
10. With respect to dependent claim 5, since these claims are depending on claim 4, therefore claims 5 are allowable subject matter.
Conclusion
8. the prior art made of record and not relied upon is considered pertinent to applicant's disclosure, WANG (Pub. No.: US 2023/0297149).
WANG (Pub. No.: US 2023/0297149) shows adjusting the supply voltage according to failing rate.
9. Any inquiry concerning this communication or earlier communications from the examiner should be directed to Han Yang whose telephone is (571) 270-3048. The examiner can normally be reached on Monday-Friday 8am-5pm with alternate Friday off. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Richard Elms can be reached on (571) 272-1869. The fax phone number for the organization where this application or proceeding is assigned is (571) 273-8300.
Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000.
HY
09/10/2026
/HAN YANG/
Primary Examiner, Art Unit 2824